BR112017006767A2 - disposição de teste e método para testar um sistema de comutação - Google Patents

disposição de teste e método para testar um sistema de comutação

Info

Publication number
BR112017006767A2
BR112017006767A2 BR112017006767A BR112017006767A BR112017006767A2 BR 112017006767 A2 BR112017006767 A2 BR 112017006767A2 BR 112017006767 A BR112017006767 A BR 112017006767A BR 112017006767 A BR112017006767 A BR 112017006767A BR 112017006767 A2 BR112017006767 A2 BR 112017006767A2
Authority
BR
Brazil
Prior art keywords
testing
test
switching system
test arrangement
switching
Prior art date
Application number
BR112017006767A
Other languages
English (en)
Other versions
BR112017006767B1 (pt
Inventor
Jochum Michael
KÜNG Rainer
Geiger Stephan
Original Assignee
Omicron Electronics Gmbh
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Omicron Electronics Gmbh filed Critical Omicron Electronics Gmbh
Publication of BR112017006767A2 publication Critical patent/BR112017006767A2/pt
Publication of BR112017006767B1 publication Critical patent/BR112017006767B1/pt

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/327—Testing of circuit interrupters, switches or circuit-breakers
    • G01R31/3271—Testing of circuit interrupters, switches or circuit-breakers of high voltage or medium voltage devices
    • G01R31/3272—Apparatus, systems or circuits therefor
    • G01R31/3274—Details related to measuring, e.g. sensing, displaying or computing; Measuring of variables related to the contact pieces, e.g. wear, position or resistance
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/327—Testing of circuit interrupters, switches or circuit-breakers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/04—Housings; Supporting members; Arrangements of terminals
    • G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
    • G01R1/0416—Connectors, terminals
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G01R19/25—Arrangements for measuring currents or voltages or for indicating presence or sign thereof using digital measurement techniques
    • G01R19/2513—Arrangements for monitoring electric power systems, e.g. power lines or loads; Logging
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/327—Testing of circuit interrupters, switches or circuit-breakers
    • G01R31/3271—Testing of circuit interrupters, switches or circuit-breakers of high voltage or medium voltage devices
    • G01R31/3272—Apparatus, systems or circuits therefor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
    • G01R31/66—Testing of connections, e.g. of plugs or non-disconnectable joints

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Power Engineering (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)
  • Remote Monitoring And Control Of Power-Distribution Networks (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Maintenance And Management Of Digital Transmission (AREA)
  • Monitoring And Testing Of Transmission In General (AREA)
  • Selective Calling Equipment (AREA)

Abstract

a presente invenção refere-se a uma disposição de teste, que está prevista a fim de poder testar de forma simples sistemas de comutação de diversos fabricantes e tipos, de tal modo que uma unidade de controle (6) para um dispositivo de comutação (5) do sistema de comutação (4) está ligada com um aparelho de teste (10) através de um cabo de adaptação (11), o qual recria o dispositivo de comutação (5) para o teste, e o aparelho de teste (10) lê dados específicos da configuração de uma unidade de memória (15) no cabo de adaptação (11), e o aparelho de teste (10) com isso configura suas entradas de sinal (be) e saídas de sinal (ba, aa), necessárias para a realização do teste.
BR112017006767-6A 2014-10-07 2015-09-29 Aparelho de teste e cabo de adaptação ligado com ele, emprego do aparelho de teste e cabo de adaptação e método para a preparação de um teste de uma unidade de controle de um dispositivo de comutação de um sistema de comutação BR112017006767B1 (pt)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
AT507162014A AT516348B1 (de) 2014-10-07 2014-10-07 Prüfanordnung und Verfahren zur Prüfung einer Schaltanlage
ATA50716/2014 2014-10-07
PCT/EP2015/072438 WO2016055307A1 (de) 2014-10-07 2015-09-29 Prüfanordnung und verfahren zur prüfung einer schaltanlage

Publications (2)

Publication Number Publication Date
BR112017006767A2 true BR112017006767A2 (pt) 2017-12-26
BR112017006767B1 BR112017006767B1 (pt) 2023-01-10

Family

ID=54238430

Family Applications (1)

Application Number Title Priority Date Filing Date
BR112017006767-6A BR112017006767B1 (pt) 2014-10-07 2015-09-29 Aparelho de teste e cabo de adaptação ligado com ele, emprego do aparelho de teste e cabo de adaptação e método para a preparação de um teste de uma unidade de controle de um dispositivo de comutação de um sistema de comutação

Country Status (13)

Country Link
US (1) US10605867B2 (pt)
EP (1) EP3204783B1 (pt)
KR (1) KR102406135B1 (pt)
AT (1) AT516348B1 (pt)
AU (1) AU2015330242B2 (pt)
BR (1) BR112017006767B1 (pt)
CA (1) CA2964025C (pt)
ES (1) ES2846807T3 (pt)
MX (1) MX363410B (pt)
PL (1) PL3204783T3 (pt)
PT (1) PT3204783T (pt)
RU (1) RU2696130C2 (pt)
WO (1) WO2016055307A1 (pt)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN108388236A (zh) * 2018-04-13 2018-08-10 广州供电局有限公司 柱上自动化开关控制器的性能测试系统
US10832536B2 (en) * 2018-12-07 2020-11-10 International Business Machines Corporation Guided cable management
PL4046339T3 (pl) * 2019-10-18 2023-03-20 Omicron Electronics Gmbh Bezpieczny układ kontrolny
US11641131B2 (en) * 2020-11-06 2023-05-02 Asco Power Technologies, L.P. Power control system (PCS) commissioning agent
CN112698579A (zh) * 2020-12-14 2021-04-23 广东电网有限责任公司 一种便携式柱上开关控制器现场试验装置及方法

Family Cites Families (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4105965A (en) 1977-07-14 1978-08-08 General Electric Company Static trip circuit breaker test set
US4814712A (en) * 1987-06-17 1989-03-21 General Electric Company Test kit for a circuit breaker containing an electronic trip unit
US5168261A (en) * 1990-08-23 1992-12-01 Weeks Larry P Circuit breaker simulator
US6795789B2 (en) * 2001-05-21 2004-09-21 Omnicron Electronics Corp. Usa System for testing of intelligent electronic devices with digital communications
US6891378B2 (en) * 2003-03-25 2005-05-10 Midtronics, Inc. Electronic battery tester
US7259565B2 (en) 2003-09-15 2007-08-21 General Electric Company Testing an electrical switchgear system
JP2009171723A (ja) 2008-01-16 2009-07-30 Chugoku Electric Power Co Inc:The デジタル保護継電器の試験装置
KR101037165B1 (ko) * 2009-06-10 2011-05-26 남영기전 주식회사 보호계전기
DE102009031892B4 (de) * 2009-07-06 2015-05-13 Engberts Mess-, Steuer- Und Regelsysteme Gmbh Prüfsystem zum Prüfen einer Leitungsanordnung, Verwendung eines Adapters in einem Prüfsystem und Prüfgerät zum Prüfen einer Leitungsanordnung sowie Verfahren zum Herstellen einer Leitungsanordnung
WO2011030190A1 (en) * 2009-09-14 2011-03-17 Abb Technology Ltd A method and a system for simulation in a substation
DE102009042762A1 (de) * 2009-09-25 2011-03-31 Abb Ag Verfahren und Anordnung zur Unterstützung der Einrichtung, der Inbetriebnahme und des Tests einer Schaltanlage
DE102009043257A1 (de) * 2009-09-28 2011-03-31 Logicdata Electronic & Software Entwicklungs Gmbh Stecker-Kabel-Einheit, Kodierstecker, Einstellvorrichtung und Verfahren zum Konfigurieren einer Funktionseinheit, insbesondere eines elektromechanisch verstellbaren Möbelstücks
US9225539B2 (en) * 2010-01-15 2015-12-29 Hewlett Packard Enterprise Development Lp Storing data relating to cables
DE102011101467B4 (de) * 2011-05-13 2015-09-10 Engberts Mess-, Steuer- Und Regelsysteme Gmbh Verfahren zum prüfen und herstellen einer elektrischen schaltung
DE102012004848A1 (de) 2012-03-13 2013-09-19 Abb Technology Ag Simulationsgerät zur Demonstration oder zum Testen von Funktionen eines Schaltschrankes in einer Schaltanlage

Also Published As

Publication number Publication date
EP3204783B1 (de) 2020-11-04
AU2015330242A1 (en) 2017-05-25
RU2696130C2 (ru) 2019-07-31
RU2017115936A (ru) 2018-11-13
AT516348A1 (de) 2016-04-15
PT3204783T (pt) 2021-01-25
US10605867B2 (en) 2020-03-31
EP3204783A1 (de) 2017-08-16
KR20170069247A (ko) 2017-06-20
KR102406135B1 (ko) 2022-06-07
US20180238967A1 (en) 2018-08-23
PL3204783T3 (pl) 2021-05-04
AT516348B1 (de) 2019-11-15
AU2015330242B2 (en) 2018-03-15
RU2017115936A3 (pt) 2019-01-23
MX2017004683A (es) 2017-10-27
ES2846807T3 (es) 2021-07-29
WO2016055307A1 (de) 2016-04-14
CA2964025A1 (en) 2016-04-14
CA2964025C (en) 2022-01-04
MX363410B (es) 2019-03-22
BR112017006767B1 (pt) 2023-01-10

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Legal Events

Date Code Title Description
B06U Preliminary requirement: requests with searches performed by other patent offices: procedure suspended [chapter 6.21 patent gazette]
B09A Decision: intention to grant [chapter 9.1 patent gazette]
B16A Patent or certificate of addition of invention granted [chapter 16.1 patent gazette]

Free format text: PRAZO DE VALIDADE: 20 (VINTE) ANOS CONTADOS A PARTIR DE 29/09/2015, OBSERVADAS AS CONDICOES LEGAIS