IN152646B - - Google Patents
Info
- Publication number
- IN152646B IN152646B IN256/CAL/80A IN256CA1980A IN152646B IN 152646 B IN152646 B IN 152646B IN 256CA1980 A IN256CA1980 A IN 256CA1980A IN 152646 B IN152646 B IN 152646B
- Authority
- IN
- India
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/10—Photometry, e.g. photographic exposure meter by comparison with reference light or electric value provisionally void
- G01J1/20—Photometry, e.g. photographic exposure meter by comparison with reference light or electric value provisionally void intensity of the measured or reference value being varied to equalise their effects at the detectors, e.g. by varying incidence angle
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/26—Measuring arrangements characterised by the use of optical techniques for measuring angles or tapers; for testing the alignment of axes
- G01B11/27—Measuring arrangements characterised by the use of optical techniques for measuring angles or tapers; for testing the alignment of axes for testing the alignment of axes
- G01B11/272—Measuring arrangements characterised by the use of optical techniques for measuring angles or tapers; for testing the alignment of axes for testing the alignment of axes using photoelectric detection means
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/26—Measuring arrangements characterised by the use of optical techniques for measuring angles or tapers; for testing the alignment of axes
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
- G01S17/00—Systems using the reflection or reradiation of electromagnetic waves other than radio waves, e.g. lidar systems
- G01S17/74—Systems using reradiation of electromagnetic waves other than radio waves, e.g. IFF, i.e. identification of friend or foe
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Electromagnetism (AREA)
- Engineering & Computer Science (AREA)
- Computer Networks & Wireless Communication (AREA)
- Radar, Positioning & Navigation (AREA)
- Remote Sensing (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Length Measuring Devices By Optical Means (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US06/017,434 US4243877A (en) | 1979-03-05 | 1979-03-05 | Electro-optical target for an optical alignment system |
Publications (1)
Publication Number | Publication Date |
---|---|
IN152646B true IN152646B (zh) | 1984-03-03 |
Family
ID=21782566
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
IN256/CAL/80A IN152646B (zh) | 1979-03-05 | 1980-03-05 |
Country Status (7)
Country | Link |
---|---|
US (1) | US4243877A (zh) |
JP (1) | JPS55126804A (zh) |
KR (1) | KR830001843B1 (zh) |
BR (1) | BR8001292A (zh) |
GB (1) | GB2049335B (zh) |
IN (1) | IN152646B (zh) |
MX (1) | MX147361A (zh) |
Families Citing this family (20)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4636626A (en) * | 1983-01-14 | 1987-01-13 | Nippon Kogaku K.K. | Apparatus for aligning mask and wafer used in semiconductor circuit element fabrication |
US4547662A (en) * | 1983-03-16 | 1985-10-15 | United Technologies Corporation | Noninterference optical error sensing system |
JPS60237307A (ja) * | 1984-05-11 | 1985-11-26 | Yokogawa Hewlett Packard Ltd | レ−ザ測長器 |
US4679940A (en) * | 1984-08-01 | 1987-07-14 | Hamar M R | Control system for a continuous cell target readout in a laser measurement system |
WO1989000675A1 (en) * | 1985-08-16 | 1989-01-26 | Grumman Aerospace Corporation | Hole centration gage |
US4690563A (en) * | 1985-08-16 | 1987-09-01 | Grumman Aerospace Corporation | Hole centration gage |
US4738531A (en) * | 1986-01-23 | 1988-04-19 | Westinghouse Electric Corp. | Distributed antenna array location apparatus |
US5060632A (en) * | 1989-09-05 | 1991-10-29 | Olympus Optical Co., Ltd. | Endoscope apparatus |
US5302835A (en) * | 1993-03-22 | 1994-04-12 | Imra America, Inc. | Light detection system having a polarization plane rotating means and a polarizing beamsplitter |
US5513000A (en) * | 1993-07-26 | 1996-04-30 | Princeton Scientific Instruments Inc. | Autocollimator |
US5517016A (en) * | 1994-03-31 | 1996-05-14 | The United States Of America As Represented By The Administrator Of The National Aeronautics And Space Administration | Lasercom system architecture with reduced complexity |
FR2769085B1 (fr) * | 1997-09-26 | 1999-12-03 | Thomson Csf | Dispositif de reglage de l'alignement d'un radar pour automobiles |
US6788726B2 (en) * | 2002-02-26 | 2004-09-07 | New Focus, Inc. | External cavity laser with high spectral purity output |
DE10239940A1 (de) * | 2002-08-30 | 2004-03-25 | Sick Ag | Lichtschranke oder Lichtgitter |
DE102004020406A1 (de) * | 2004-04-23 | 2005-11-10 | Prüftechnik Dieter Busch AG | Messvorrichtung und Verfahren zum Ermitteln der Geradheit hohlzylindrischer oder hohlkegeliger Körper bzw. deren Orientierung relativ zueinander |
US7486390B2 (en) * | 2005-03-04 | 2009-02-03 | Prueftechnik Dieter Busch Ag | Device and process for alignment of machines, machine parts or other technical articles |
US20080189072A1 (en) * | 2007-02-01 | 2008-08-07 | Nescom Inc. | High resolution encoder within a swivel |
US20110133726A1 (en) * | 2009-12-09 | 2011-06-09 | Alexander Ballantyne | Precision alignment system |
CN105737765A (zh) * | 2016-04-06 | 2016-07-06 | 合肥工业大学 | 基于半导体激光器组件的四自由度光学测头 |
DE102017202652A1 (de) * | 2017-02-20 | 2018-08-23 | Siemens Aktiengesellschaft | Vorrichtung und Verfahren zur Kalibrierung mittels projizierter Muster |
Family Cites Families (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3323408A (en) * | 1962-09-04 | 1967-06-06 | Bishop Robert Edward | Optical alignment system |
US3470377A (en) * | 1966-11-04 | 1969-09-30 | Texas Instruments Inc | Two-axis automatic autocollimator |
GB1196781A (en) * | 1967-01-26 | 1970-07-01 | Thring Advanced Developments L | Walking Machine. |
US3603691A (en) * | 1969-07-25 | 1971-09-07 | Lockheed Aircraft Corp | Laser control for automatic alignment of structures |
US3790276A (en) * | 1971-04-07 | 1974-02-05 | Us Navy | Direct measurement of ship body distortion using a laser beam |
US4105339A (en) * | 1977-01-24 | 1978-08-08 | The United States Of America As Represented By The Secretary Of The Air Force | Azimuth monitoring system |
-
1979
- 1979-03-05 US US06/017,434 patent/US4243877A/en not_active Expired - Lifetime
-
1980
- 1980-03-03 GB GB8007183A patent/GB2049335B/en not_active Expired
- 1980-03-04 BR BR8001292A patent/BR8001292A/pt unknown
- 1980-03-04 KR KR1019800000880A patent/KR830001843B1/ko active
- 1980-03-05 MX MX181436A patent/MX147361A/es unknown
- 1980-03-05 JP JP2857380A patent/JPS55126804A/ja active Granted
- 1980-03-05 IN IN256/CAL/80A patent/IN152646B/en unknown
Also Published As
Publication number | Publication date |
---|---|
KR830001843B1 (ko) | 1983-09-14 |
BR8001292A (pt) | 1980-11-04 |
GB2049335A (en) | 1980-12-17 |
GB2049335B (en) | 1983-06-15 |
MX147361A (es) | 1982-11-22 |
US4243877A (en) | 1981-01-06 |
KR830002219A (ko) | 1983-05-23 |
JPS55126804A (en) | 1980-10-01 |
JPS6126601B2 (zh) | 1986-06-21 |