IN152012B - - Google Patents
Info
- Publication number
- IN152012B IN152012B IN146/DEL/80A IN146DE1980A IN152012B IN 152012 B IN152012 B IN 152012B IN 146DE1980 A IN146DE1980 A IN 146DE1980A IN 152012 B IN152012 B IN 152012B
- Authority
- IN
- India
Links
Classifications
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K19/00—Logic circuits, i.e. having at least two inputs acting on one output; Inverting circuits
- H03K19/0175—Coupling arrangements; Interface arrangements
- H03K19/018—Coupling arrangements; Interface arrangements using bipolar transistors only
- H03K19/01837—Coupling arrangements; Interface arrangements using bipolar transistors only programmable
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/319—Tester hardware, i.e. output processing circuits
- G01R31/31903—Tester hardware, i.e. output processing circuits tester configuration
- G01R31/31908—Tester set-up, e.g. configuring the tester to the device under test [DUT], down loading test patterns
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/319—Tester hardware, i.e. output processing circuits
- G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
- G01R31/31924—Voltage or current aspects, e.g. driver, receiver
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K19/00—Logic circuits, i.e. having at least two inputs acting on one output; Inverting circuits
- H03K19/0175—Coupling arrangements; Interface arrangements
- H03K19/017581—Coupling arrangements; Interface arrangements programmable
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| GB7908827 | 1979-03-13 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| IN152012B true IN152012B (de) | 1983-09-24 |
Family
ID=10503840
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| IN146/DEL/80A IN152012B (de) | 1979-03-13 | 1980-03-01 |
Country Status (4)
| Country | Link |
|---|---|
| US (1) | US4339673A (de) |
| DE (1) | DE3009014A1 (de) |
| IN (1) | IN152012B (de) |
| ZA (1) | ZA801396B (de) |
Families Citing this family (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4507576A (en) * | 1982-10-28 | 1985-03-26 | Tektronix, Inc. | Method and apparatus for synthesizing a drive signal for active IC testing including slew rate adjustment |
| US4749883A (en) * | 1987-04-03 | 1988-06-07 | Motorola, Inc. | Circuit having an output referenced to a specific voltage in response to either an ECL or TTL input |
| US4814638A (en) * | 1987-06-08 | 1989-03-21 | Grumman Aerospace Corporation | High speed digital driver with selectable level shifter |
| DE69333821T2 (de) * | 1992-06-15 | 2005-11-17 | Fujitsu Ltd., Kawasaki | Integrierte Halbleiterschaltung mit Eingangs/Ausgangschnittstelle geeignet für niedrige Amplituden |
| US5402079A (en) * | 1992-12-18 | 1995-03-28 | Vlsi Technology, Inc. | Integrated circuit relay control system |
| US5534812A (en) * | 1995-04-21 | 1996-07-09 | International Business Machines Corporation | Communication between chips having different voltage levels |
| US5942922A (en) * | 1998-04-07 | 1999-08-24 | Credence Systems Corporation | Inhibitable, continuously-terminated differential drive circuit for an integrated circuit tester |
| JP4673652B2 (ja) | 2005-03-29 | 2011-04-20 | 富士通セミコンダクター株式会社 | 半導体装置の試験方法及び半導体装置 |
Family Cites Families (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3769522A (en) * | 1972-01-18 | 1973-10-30 | Honeywell Inf Systems | Apparatus and method for converting mos circuit signals to ttl circuit signals |
| DE2233612C3 (de) * | 1972-07-07 | 1975-03-13 | Siemens Ag, 1000 Berlin Und 8000 Muenchen | Endstufe für einen Prüfsignalgeber |
| DE2345979A1 (de) * | 1973-09-12 | 1975-03-20 | Siemens Ag | Gegen zu grosse belastung am ausgang gesicherte schaltungsanordnung zur umsetzung von eingangssignalen in ausgangssignale einstellbarer amplitude |
| US3986045A (en) * | 1975-04-23 | 1976-10-12 | Advanced Micro Devices, Inc. | High speed logic level converter |
| DD128073B1 (de) * | 1976-11-09 | 1980-10-29 | Roland Werner | Schaltungsanordnung einer pruefsignalgeneratorendstufe fuer digitale schaltungen |
-
1980
- 1980-03-01 IN IN146/DEL/80A patent/IN152012B/en unknown
- 1980-03-08 DE DE19803009014 patent/DE3009014A1/de active Granted
- 1980-03-10 ZA ZA00801396A patent/ZA801396B/xx unknown
- 1980-03-12 US US06/129,637 patent/US4339673A/en not_active Expired - Lifetime
Also Published As
| Publication number | Publication date |
|---|---|
| DE3009014C2 (de) | 1987-11-05 |
| ZA801396B (en) | 1981-03-25 |
| US4339673A (en) | 1982-07-13 |
| DE3009014A1 (de) | 1980-09-18 |