IN148745B - - Google Patents

Info

Publication number
IN148745B
IN148745B IN1723/CAL/77A IN1723CA1977A IN148745B IN 148745 B IN148745 B IN 148745B IN 1723CA1977 A IN1723CA1977 A IN 1723CA1977A IN 148745 B IN148745 B IN 148745B
Authority
IN
India
Application number
IN1723/CAL/77A
Other languages
English (en)
Inventor
Mark Ilich Baxansky
Ravil Safievich Kuramshin
Genrikh Isaevich Krengel
Azat Usmanovich Yarmukhametov
Valery Fedorovich Gusev
German Petrovich Sorokin
Viktro Petrovich Mikhailov
Original Assignee
Mark Ilich Baxansky
Ravil Safievich Kuramshin
Krengel Genrikh
Jarmuchametov Azat U
Gusev Valery
German Petrovich Sorokin
Viktro Petrovich Mikhailov
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mark Ilich Baxansky, Ravil Safievich Kuramshin, Krengel Genrikh, Jarmuchametov Azat U, Gusev Valery, German Petrovich Sorokin, Viktro Petrovich Mikhailov filed Critical Mark Ilich Baxansky
Publication of IN148745B publication Critical patent/IN148745B/en

Links

Classifications

    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00Error detection; Error correction; Monitoring
    • G06F11/22Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/2205Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested
    • G06F11/2236Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested to test CPU or processors
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00Error detection; Error correction; Monitoring
    • G06F11/22Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/2273Test methods

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Quality & Reliability (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
  • Techniques For Improving Reliability Of Storages (AREA)
IN1723/CAL/77A 1976-12-16 1977-12-13 IN148745B (xx)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
SU762428151A SU613651A1 (ru) 1976-12-16 1976-12-16 Запоминающее устройство

Publications (1)

Publication Number Publication Date
IN148745B true IN148745B (xx) 1981-05-30

Family

ID=20685957

Family Applications (1)

Application Number Title Priority Date Filing Date
IN1723/CAL/77A IN148745B (xx) 1976-12-16 1977-12-13

Country Status (11)

Country Link
US (1) US4211916A (xx)
JP (1) JPS5833965B2 (xx)
BG (1) BG33406A1 (xx)
DD (1) DD134149A1 (xx)
DE (1) DE2756033C2 (xx)
FR (1) FR2374688A1 (xx)
GB (1) GB1596850A (xx)
IN (1) IN148745B (xx)
PL (1) PL109879B1 (xx)
RO (1) RO78109A (xx)
SU (1) SU613651A1 (xx)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USRE33368E (en) * 1980-10-10 1990-10-02 At&T Bell Laboratories Data set network diagnostic system
US4439826A (en) * 1981-07-20 1984-03-27 International Telephone & Telegraph Corporation Diagnostic system for a distributed control switching network
CA1226954A (en) * 1984-05-11 1987-09-15 Jan S. Herman Control sequencer with dual microprogram counters for microdiagnostics
US4841434A (en) * 1984-05-11 1989-06-20 Raytheon Company Control sequencer with dual microprogram counters for microdiagnostics
JPS62257543A (ja) * 1986-04-30 1987-11-10 Toshiba Corp マイクロプログラム活性化状態検査回路
DE4139151A1 (de) * 1991-11-28 1993-06-03 Siemens Ag Verfahren zum selbsttest von mikroprogrammierten prozessoren
JPH05233352A (ja) * 1992-02-19 1993-09-10 Nec Corp マイクロプロセッサ
JP2630271B2 (ja) * 1994-09-14 1997-07-16 日本電気株式会社 情報処理装置

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3259881A (en) * 1959-12-31 1966-07-05 Ibm Computer including error or abnormal condition controlled immediate program interruption
US3831148A (en) * 1973-01-02 1974-08-20 Honeywell Inf Systems Nonexecute test apparatus
DE2314904C2 (de) * 1973-03-26 1975-02-27 Loehr & Bromkamp Gmbh, 6050 Offenbach Homokinetische Gelenkkupplung
US3916178A (en) * 1973-12-10 1975-10-28 Honeywell Inf Systems Apparatus and method for two controller diagnostic and verification procedures in a data processing unit
US3909802A (en) * 1974-04-08 1975-09-30 Honeywell Inf Systems Diagnostic maintenance and test apparatus
US4048481A (en) * 1974-12-17 1977-09-13 Honeywell Information Systems Inc. Diagnostic testing apparatus and method

Also Published As

Publication number Publication date
BG33406A1 (en) 1983-02-15
RO78109A (ro) 1982-04-12
DD134149A1 (de) 1979-02-07
JPS5391643A (en) 1978-08-11
JPS5833965B2 (ja) 1983-07-23
SU613651A1 (ru) 1987-03-15
GB1596850A (en) 1981-09-03
FR2374688B1 (xx) 1980-06-20
PL109879B1 (en) 1980-06-30
DE2756033C2 (de) 1982-04-29
US4211916A (en) 1980-07-08
DE2756033A1 (de) 1978-06-29
FR2374688A1 (fr) 1978-07-13
PL202939A1 (pl) 1978-11-20

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