IL94707A0 - Surface impedance measurement device - Google Patents

Surface impedance measurement device

Info

Publication number
IL94707A0
IL94707A0 IL94707A IL9470790A IL94707A0 IL 94707 A0 IL94707 A0 IL 94707A0 IL 94707 A IL94707 A IL 94707A IL 9470790 A IL9470790 A IL 9470790A IL 94707 A0 IL94707 A0 IL 94707A0
Authority
IL
Israel
Prior art keywords
measurement device
impedance measurement
surface impedance
measurement
impedance
Prior art date
Application number
IL94707A
Other languages
English (en)
Original Assignee
Onera (Off Nat Aerospatiale)
Dassault Avions
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Onera (Off Nat Aerospatiale), Dassault Avions filed Critical Onera (Off Nat Aerospatiale)
Publication of IL94707A0 publication Critical patent/IL94707A0/xx

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
    • G01R27/04—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant in circuits having distributed constants, e.g. having very long conductors or involving high frequencies

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measurement Of Resistance Or Impedance (AREA)
  • Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)
IL94707A 1989-06-12 1990-06-12 Surface impedance measurement device IL94707A0 (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR8907726A FR2648236B1 (fr) 1989-06-12 1989-06-12 Appareil de mesure d'impedance surfacique

Publications (1)

Publication Number Publication Date
IL94707A0 true IL94707A0 (en) 1991-04-15

Family

ID=9382606

Family Applications (1)

Application Number Title Priority Date Filing Date
IL94707A IL94707A0 (en) 1989-06-12 1990-06-12 Surface impedance measurement device

Country Status (7)

Country Link
US (1) US5086274A (xx)
EP (1) EP0403344B1 (xx)
BR (1) BR9002779A (xx)
CA (1) CA2018689C (xx)
DE (1) DE69013236T2 (xx)
FR (1) FR2648236B1 (xx)
IL (1) IL94707A0 (xx)

Families Citing this family (28)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CA2043347A1 (en) * 1990-05-30 1991-12-01 Yukio Kohmura Method and system for inspection of electroconductive film using eddy current and process and system for production of optical fibres using method and system
US5453689A (en) * 1991-12-06 1995-09-26 Massachusetts Institute Of Technology Magnetometer having periodic winding structure and material property estimator
DE69330265T2 (de) * 1992-11-25 2002-02-07 Simmonds Precision Products Inc., Akron Datenverarbeitungsstrukturen und Methoden
US5515041A (en) * 1993-06-14 1996-05-07 Simmonds Precision Products Inc. Composite shaft monitoring system
US5602540A (en) * 1993-06-14 1997-02-11 Simmonds Precision Products Inc. Fluid gauging apparatus with inductive interrogation
US5581248A (en) * 1993-06-14 1996-12-03 Simmonds Precision Products, Inc. Embeddable device for contactless interrogation of sensors for smart structures
US5433115A (en) * 1993-06-14 1995-07-18 Simmonds Precision Products, Inc. Contactless interrogation of sensors for smart structures
JP3011090U (ja) * 1994-11-11 1995-05-16 株式会社キョクトー スポット溶接のナゲットの検査装置
US5698978A (en) * 1995-05-15 1997-12-16 Northrop Grumman Corporation System and method for measuring electromagnetic radiation absorption
US5793206A (en) * 1995-08-25 1998-08-11 Jentek Sensors, Inc. Meandering winding test circuit
US5936401A (en) * 1996-09-19 1999-08-10 The United States Of America As Represented By The Secretary Of The Air Force Device and process for measuring electrical properties at a plurality of locations on thin film superconductors
US6781387B2 (en) 1997-01-06 2004-08-24 Jentek Sensors, Inc. Inspection method using penetrant and dielectrometer
CA2275550C (en) * 1997-01-06 2006-05-09 Jentek Sensors, Inc. Magnetometer and dielectrometer detection of subsurface objects
US6486673B1 (en) 1997-01-06 2002-11-26 Jentek Sensors, Inc. Segmented field dielectrometer
JP2001512611A (ja) * 1997-02-21 2001-08-21 ペムスター・インコーポレーテッド 磁気記録ヘッド・テスタ
US6534974B1 (en) 1997-02-21 2003-03-18 Pemstar, Inc, Magnetic head tester with write coil and read coil
DE69814601T2 (de) 1997-03-13 2004-04-01 Jentek Sensors, Inc., Watertown Magnetometrische detektion von ermüdungsschäden in flugzeugen
CA2308166C (en) 1997-10-29 2007-09-04 Jentek Sensors, Inc. Absolute property measurement with air calibration
US6377039B1 (en) 1997-11-14 2002-04-23 Jentek Sensors, Incorporated Method for characterizing coating and substrates
CA2331644A1 (en) 1998-05-12 1999-11-18 Neil J. Goldfine Methods for utilizing dielectrometry signals using estimation grids
US6346807B1 (en) * 1999-10-22 2002-02-12 Bently Nevada Corporation Digital eddy current proximity system: apparatus and method
KR100505929B1 (ko) * 2003-03-31 2005-08-04 삼성광주전자 주식회사 압축기 및 압축기의 배관연결방법
US7950289B2 (en) * 2006-02-03 2011-05-31 Bae Systems Plc Damage sensors
US8550609B2 (en) * 2007-11-21 2013-10-08 Xerox Corporation System and method for measuring a supply of solid ink in a solid ink printer
EP3380728B1 (fr) 2015-11-27 2021-10-06 Arianegroup Sas Pale pour éolienne comprenant une couche de métallisation ayant un grammage optimisé
WO2017158864A1 (ja) * 2016-03-16 2017-09-21 株式会社Ihi 導電性複合材料の検査方法及び導電性複合材料の検査装置
JP6494551B2 (ja) * 2016-03-28 2019-04-03 アンリツ株式会社 電界強度分布測定装置及び電界強度分布測定方法
CN109188083A (zh) * 2018-08-28 2019-01-11 深圳市信维通信股份有限公司 一种lds天线的rf一致性与线路阻抗检测系统及方法

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2629004A (en) * 1947-06-10 1953-02-17 Maurice L Greenough Electrical micrometer
US3441840A (en) * 1967-03-31 1969-04-29 Martin Marietta Corp Electronic thickness meter having direct readout of coating thickness
US3764897A (en) * 1971-12-28 1973-10-09 Singer Co Electromagnetic thickness gauging using a transmitting coil shaped to provide a constant field over a range of measuring distances
US3848183A (en) * 1973-04-20 1974-11-12 Magnaflux Corp Eddy current testing system having concentric coils, one being movable for balancing
CH568569A5 (xx) * 1974-02-06 1975-10-31 Bbc Brown Boveri & Cie
US4095180A (en) * 1975-12-29 1978-06-13 K. J. Law Engineers, Inc. Method and apparatus for testing conductivity using eddy currents
US4042876A (en) * 1976-04-29 1977-08-16 The United States Of America As Represented By The United States Energy Research And Development Administration Eddy current gauge for monitoring displacement using printed circuit coil
US4383218A (en) * 1978-12-29 1983-05-10 The Boeing Company Eddy current flow detection including compensation for system variables such as lift-off
US4351031A (en) * 1980-11-07 1982-09-21 Magnaflux Corporation Nondestructive testing system having automatic set-up means
US4706020A (en) * 1983-12-12 1987-11-10 General Electric Company High frequency eddy current probe with planar, spiral-like coil on flexible substrate for detecting flaws in semi-conductive material

Also Published As

Publication number Publication date
EP0403344A1 (fr) 1990-12-19
EP0403344B1 (fr) 1994-10-12
DE69013236D1 (de) 1994-11-17
CA2018689C (en) 1994-09-20
US5086274A (en) 1992-02-04
FR2648236B1 (fr) 1991-12-20
CA2018689A1 (en) 1990-12-12
FR2648236A1 (fr) 1990-12-14
BR9002779A (pt) 1991-08-20
DE69013236T2 (de) 1995-05-11

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