IL85995A0 - Method of quantitative analysis by means of the mean atomic number of phases containing a light element using a scanning microscope and an image analyser - Google Patents
Method of quantitative analysis by means of the mean atomic number of phases containing a light element using a scanning microscope and an image analyserInfo
- Publication number
- IL85995A0 IL85995A0 IL85995A IL8599588A IL85995A0 IL 85995 A0 IL85995 A0 IL 85995A0 IL 85995 A IL85995 A IL 85995A IL 8599588 A IL8599588 A IL 8599588A IL 85995 A0 IL85995 A0 IL 85995A0
- Authority
- IL
- Israel
- Prior art keywords
- quantitative analysis
- atomic number
- light element
- scanning microscope
- phases containing
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
- G01N23/203—Measuring back scattering
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
- G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
Landscapes
- Chemical & Material Sciences (AREA)
- Biochemistry (AREA)
- General Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Analytical Chemistry (AREA)
- Pathology (AREA)
- General Health & Medical Sciences (AREA)
- Physics & Mathematics (AREA)
- Immunology (AREA)
- Crystallography & Structural Chemistry (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
- Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
- Image-Pickup Tubes, Image-Amplification Tubes, And Storage Tubes (AREA)
- Electron Tubes For Measurement (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FR8705562A FR2613834A1 (fr) | 1987-04-13 | 1987-04-13 | Methode de dosage a l'aide du numero atomique moyen de phases contenant un element leger a l'aide d'un microscope a balayage et d'un analyseur d'images |
Publications (1)
Publication Number | Publication Date |
---|---|
IL85995A0 true IL85995A0 (en) | 1988-09-30 |
Family
ID=9350291
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
IL85995A IL85995A0 (en) | 1987-04-13 | 1988-04-06 | Method of quantitative analysis by means of the mean atomic number of phases containing a light element using a scanning microscope and an image analyser |
Country Status (13)
Country | Link |
---|---|
US (1) | US4847495A (no) |
EP (1) | EP0291420A1 (no) |
JP (1) | JPS63290948A (no) |
KR (1) | KR880013007A (no) |
AU (1) | AU597167B2 (no) |
BR (1) | BR8801732A (no) |
DK (1) | DK195788A (no) |
FI (1) | FI881694A (no) |
FR (1) | FR2613834A1 (no) |
IL (1) | IL85995A0 (no) |
IS (1) | IS3331A7 (no) |
NO (1) | NO881578L (no) |
PT (1) | PT87223A (no) |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP3345060B2 (ja) * | 1992-11-09 | 2002-11-18 | 日本テキサス・インスツルメンツ株式会社 | 走査形電子顕微鏡における画像信号処理方法およびその装置 |
JP2013011474A (ja) * | 2011-06-28 | 2013-01-17 | Akita Univ | Mg−Li系合金の微細組織・構造の評価方法 |
Family Cites Families (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
NL7800869A (nl) * | 1978-01-25 | 1979-07-27 | Philips Nv | Elektronenmikroskoop. |
US4559450A (en) * | 1982-08-06 | 1985-12-17 | Unisearch Limited | Quantitative compositional analyser for use with scanning electron microscopes |
AU558630B2 (en) * | 1982-08-06 | 1987-02-05 | Unisearch Limited | Auantitative compositional analyser for use with scanning electron microscopes |
US4697080A (en) * | 1986-01-06 | 1987-09-29 | The United States Of America As Represented By The United States Department Of Energy | Analysis with electron microscope of multielement samples using pure element standards |
-
1987
- 1987-04-13 FR FR8705562A patent/FR2613834A1/fr active Pending
-
1988
- 1988-03-17 US US07/169,601 patent/US4847495A/en not_active Expired - Fee Related
- 1988-04-06 IL IL85995A patent/IL85995A0/xx unknown
- 1988-04-07 IS IS3331A patent/IS3331A7/is unknown
- 1988-04-11 EP EP88420116A patent/EP0291420A1/fr not_active Withdrawn
- 1988-04-11 DK DK195788A patent/DK195788A/da not_active Application Discontinuation
- 1988-04-12 AU AU14520/88A patent/AU597167B2/en not_active Ceased
- 1988-04-12 FI FI881694A patent/FI881694A/fi not_active IP Right Cessation
- 1988-04-12 JP JP63090143A patent/JPS63290948A/ja active Pending
- 1988-04-12 BR BR8801732A patent/BR8801732A/pt unknown
- 1988-04-12 NO NO881578A patent/NO881578L/no unknown
- 1988-04-12 PT PT87223A patent/PT87223A/pt not_active Application Discontinuation
- 1988-04-12 KR KR1019880004124A patent/KR880013007A/ko not_active Application Discontinuation
Also Published As
Publication number | Publication date |
---|---|
KR880013007A (ko) | 1988-11-29 |
FI881694A0 (fi) | 1988-04-12 |
FR2613834A1 (fr) | 1988-10-14 |
US4847495A (en) | 1989-07-11 |
FI881694A (fi) | 1988-10-14 |
NO881578D0 (no) | 1988-04-12 |
IS3331A7 (is) | 1988-10-14 |
DK195788A (da) | 1988-10-14 |
NO881578L (no) | 1988-10-14 |
AU1452088A (en) | 1988-10-20 |
JPS63290948A (ja) | 1988-11-28 |
DK195788D0 (da) | 1988-04-11 |
EP0291420A1 (fr) | 1988-11-17 |
PT87223A (pt) | 1989-05-12 |
BR8801732A (pt) | 1988-11-16 |
AU597167B2 (en) | 1990-05-24 |
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