IL85995A0 - Method of quantitative analysis by means of the mean atomic number of phases containing a light element using a scanning microscope and an image analyser - Google Patents

Method of quantitative analysis by means of the mean atomic number of phases containing a light element using a scanning microscope and an image analyser

Info

Publication number
IL85995A0
IL85995A0 IL85995A IL8599588A IL85995A0 IL 85995 A0 IL85995 A0 IL 85995A0 IL 85995 A IL85995 A IL 85995A IL 8599588 A IL8599588 A IL 8599588A IL 85995 A0 IL85995 A0 IL 85995A0
Authority
IL
Israel
Prior art keywords
quantitative analysis
atomic number
light element
scanning microscope
phases containing
Prior art date
Application number
IL85995A
Other languages
English (en)
Original Assignee
Pechiney
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Pechiney filed Critical Pechiney
Publication of IL85995A0 publication Critical patent/IL85995A0/xx

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/203Measuring back scattering
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material

Landscapes

  • Chemical & Material Sciences (AREA)
  • Biochemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Pathology (AREA)
  • General Health & Medical Sciences (AREA)
  • Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
  • Image-Pickup Tubes, Image-Amplification Tubes, And Storage Tubes (AREA)
  • Electron Tubes For Measurement (AREA)
IL85995A 1987-04-13 1988-04-06 Method of quantitative analysis by means of the mean atomic number of phases containing a light element using a scanning microscope and an image analyser IL85995A0 (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR8705562A FR2613834A1 (fr) 1987-04-13 1987-04-13 Methode de dosage a l'aide du numero atomique moyen de phases contenant un element leger a l'aide d'un microscope a balayage et d'un analyseur d'images

Publications (1)

Publication Number Publication Date
IL85995A0 true IL85995A0 (en) 1988-09-30

Family

ID=9350291

Family Applications (1)

Application Number Title Priority Date Filing Date
IL85995A IL85995A0 (en) 1987-04-13 1988-04-06 Method of quantitative analysis by means of the mean atomic number of phases containing a light element using a scanning microscope and an image analyser

Country Status (13)

Country Link
US (1) US4847495A (no)
EP (1) EP0291420A1 (no)
JP (1) JPS63290948A (no)
KR (1) KR880013007A (no)
AU (1) AU597167B2 (no)
BR (1) BR8801732A (no)
DK (1) DK195788A (no)
FI (1) FI881694A (no)
FR (1) FR2613834A1 (no)
IL (1) IL85995A0 (no)
IS (1) IS3331A7 (no)
NO (1) NO881578L (no)
PT (1) PT87223A (no)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3345060B2 (ja) * 1992-11-09 2002-11-18 日本テキサス・インスツルメンツ株式会社 走査形電子顕微鏡における画像信号処理方法およびその装置
JP2013011474A (ja) * 2011-06-28 2013-01-17 Akita Univ Mg−Li系合金の微細組織・構造の評価方法

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
NL7800869A (nl) * 1978-01-25 1979-07-27 Philips Nv Elektronenmikroskoop.
US4559450A (en) * 1982-08-06 1985-12-17 Unisearch Limited Quantitative compositional analyser for use with scanning electron microscopes
AU558630B2 (en) * 1982-08-06 1987-02-05 Unisearch Limited Auantitative compositional analyser for use with scanning electron microscopes
US4697080A (en) * 1986-01-06 1987-09-29 The United States Of America As Represented By The United States Department Of Energy Analysis with electron microscope of multielement samples using pure element standards

Also Published As

Publication number Publication date
KR880013007A (ko) 1988-11-29
FI881694A0 (fi) 1988-04-12
FR2613834A1 (fr) 1988-10-14
US4847495A (en) 1989-07-11
FI881694A (fi) 1988-10-14
NO881578D0 (no) 1988-04-12
IS3331A7 (is) 1988-10-14
DK195788A (da) 1988-10-14
NO881578L (no) 1988-10-14
AU1452088A (en) 1988-10-20
JPS63290948A (ja) 1988-11-28
DK195788D0 (da) 1988-04-11
EP0291420A1 (fr) 1988-11-17
PT87223A (pt) 1989-05-12
BR8801732A (pt) 1988-11-16
AU597167B2 (en) 1990-05-24

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