IL79098A0 - Fine flaw detector for printed circuit boards - Google Patents

Fine flaw detector for printed circuit boards

Info

Publication number
IL79098A0
IL79098A0 IL79098A IL7909886A IL79098A0 IL 79098 A0 IL79098 A0 IL 79098A0 IL 79098 A IL79098 A IL 79098A IL 7909886 A IL7909886 A IL 7909886A IL 79098 A0 IL79098 A0 IL 79098A0
Authority
IL
Israel
Prior art keywords
printed circuit
circuit boards
flaw detector
fine flaw
fine
Prior art date
Application number
IL79098A
Other languages
English (en)
Original Assignee
Visionetics Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Visionetics Corp filed Critical Visionetics Corp
Publication of IL79098A0 publication Critical patent/IL79098A0/xx

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G06T7/0004—Industrial image inspection
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/10—Image acquisition modality
    • G06T2207/10016—Video; Image sequence
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/30—Subject of image; Context of image processing
    • G06T2207/30108—Industrial image inspection
    • G06T2207/30141—Printed circuit board [PCB]

Landscapes

  • Engineering & Computer Science (AREA)
  • Quality & Reliability (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Image Analysis (AREA)
  • Closed-Circuit Television Systems (AREA)
  • Length Measuring Devices By Optical Means (AREA)
IL79098A 1985-07-15 1986-06-12 Fine flaw detector for printed circuit boards IL79098A0 (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US74596685A 1985-07-15 1985-07-15

Publications (1)

Publication Number Publication Date
IL79098A0 true IL79098A0 (en) 1986-09-30

Family

ID=24998984

Family Applications (1)

Application Number Title Priority Date Filing Date
IL79098A IL79098A0 (en) 1985-07-15 1986-06-12 Fine flaw detector for printed circuit boards

Country Status (3)

Country Link
EP (1) EP0209252A3 (de)
JP (1) JPS6249204A (de)
IL (1) IL79098A0 (de)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3708795C2 (de) * 1987-03-18 1995-08-03 Gsf Forschungszentrum Umwelt Verfahren zur Größenselektion in Videoechtzeit
DE3720489A1 (de) * 1987-06-20 1988-12-29 Sood Ralf A Verfahren zum lesen von text- und druckvorlagen
JPH0641924B2 (ja) * 1988-05-27 1994-06-01 株式会社キリンテクノシステム 壜胴部の欠陥検出装置
JPH0769155B2 (ja) * 1990-11-27 1995-07-26 大日本スクリーン製造株式会社 プリント基板のパターン検査方法
GB2262339B (en) * 1991-12-13 1995-09-06 Honda Motor Co Ltd Method of inspecting the surface of a workpiece
US5566244A (en) * 1993-11-22 1996-10-15 Honda Giken Kogyo Kabushiki Kaisha Method of inspecting a workpiece surface including a picturing system with a shortened focal plane
JP5666894B2 (ja) * 2010-12-10 2015-02-12 株式会社総合車両製作所 外観検査装置及び外観検査方法

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4934385A (de) * 1972-07-28 1974-03-29
IL63781A (en) * 1980-09-19 1985-03-31 Trw Inc System for defect analysis in manufactured parts such as turbine blades
EP0054596B1 (de) * 1980-12-18 1985-05-29 International Business Machines Corporation Verfahren für die Inspektion und die automatische Sortierung von Objekten, die Konfigurationen mit dimensionellen Toleranzen aufweisen und platzabhängige Kriterien für die Verwerfung, Anlage und Schaltung dafür
US4442542A (en) * 1982-01-29 1984-04-10 Sperry Corporation Preprocessing circuitry apparatus for digital data
GB8320016D0 (en) * 1983-07-25 1983-08-24 Lloyd Doyle Ltd Apparatus for inspecting printed wiring boards

Also Published As

Publication number Publication date
EP0209252A3 (de) 1988-09-21
EP0209252A2 (de) 1987-01-21
JPS6249204A (ja) 1987-03-03

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