IL166619A0 - Method of comparing x-ray diffraction patterns using the fundamental parameter method - Google Patents

Method of comparing x-ray diffraction patterns using the fundamental parameter method

Info

Publication number
IL166619A0
IL166619A0 IL16661905A IL16661905A IL166619A0 IL 166619 A0 IL166619 A0 IL 166619A0 IL 16661905 A IL16661905 A IL 16661905A IL 16661905 A IL16661905 A IL 16661905A IL 166619 A0 IL166619 A0 IL 166619A0
Authority
IL
Israel
Prior art keywords
comparing
ray diffraction
diffraction patterns
fundamental parameter
parameter method
Prior art date
Application number
IL16661905A
Other languages
English (en)
Original Assignee
Ssci Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ssci Inc filed Critical Ssci Inc
Publication of IL166619A0 publication Critical patent/IL166619A0/xx

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/2055Analysing diffraction patterns

Landscapes

  • Chemical & Material Sciences (AREA)
  • Biochemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Information Retrieval, Db Structures And Fs Structures Therefor (AREA)
  • Investigating Or Analysing Biological Materials (AREA)
IL16661905A 2002-08-06 2005-02-01 Method of comparing x-ray diffraction patterns using the fundamental parameter method IL166619A0 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US40181102P 2002-08-06 2002-08-06
PCT/US2003/024507 WO2004013622A1 (en) 2002-08-06 2003-08-06 Method of comparing x-ray diffraction patterns using the fundamental parameter method

Publications (1)

Publication Number Publication Date
IL166619A0 true IL166619A0 (en) 2006-01-15

Family

ID=31495982

Family Applications (1)

Application Number Title Priority Date Filing Date
IL16661905A IL166619A0 (en) 2002-08-06 2005-02-01 Method of comparing x-ray diffraction patterns using the fundamental parameter method

Country Status (7)

Country Link
US (2) US7372941B2 (de)
EP (1) EP1527334A1 (de)
JP (1) JP2005534927A (de)
AU (1) AU2003261380A1 (de)
CA (1) CA2494511A1 (de)
IL (1) IL166619A0 (de)
WO (1) WO2004013622A1 (de)

Families Citing this family (26)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2005045726A2 (en) * 2003-10-27 2005-05-19 Ssci, Inc. Method for monte carlo indexing of powder diffraction data
US20070243620A1 (en) * 2004-02-24 2007-10-18 Simon Bates Analysis and Screening of Solid Forms Using the Atomic Pair Distribution Function
EP1941265A1 (de) * 2005-09-26 2008-07-09 SSCI, Inc. Verfahren zur charakterisierung von zusammensetzungen
US7529340B2 (en) * 2006-05-15 2009-05-05 General Electric Company Systems and methods for identifying a substance
TW200816960A (en) * 2006-06-29 2008-04-16 Fermiscan Australia Pty Ltd Improved method
US7519154B2 (en) * 2006-08-15 2009-04-14 Ge Security, Inc. Systems and methods for using a crystallinity of a substance to identify the substance
US20110184659A1 (en) * 2008-02-29 2011-07-28 Simon Bates Methods for assessing the miscibility of compositions
EP2273994B1 (de) 2008-04-03 2015-12-02 NeurMedix, Inc. Festphasen-formen eines pharmazeutischen mittels
US8233715B2 (en) * 2008-04-28 2012-07-31 Microsoft Corporation Probabilistic intensity similarity measure based on noise distributions
US10552710B2 (en) * 2009-09-28 2020-02-04 Oracle International Corporation Hierarchical sequential clustering
US20110078194A1 (en) * 2009-09-28 2011-03-31 Oracle International Corporation Sequential information retrieval
US10013641B2 (en) * 2009-09-28 2018-07-03 Oracle International Corporation Interactive dendrogram controls
JP5925880B2 (ja) * 2011-05-17 2016-05-25 ゼタキューブ エス.アール.エル.ZETACUBE S.r.l. シンクロトロン放射線を用いて多形体を検出する方法
JP6013950B2 (ja) * 2013-03-14 2016-10-25 株式会社リガク 結晶相同定方法、結晶相同定装置、及び結晶相同定プログラム
US9958228B2 (en) 2013-04-01 2018-05-01 Yardarm Technologies, Inc. Telematics sensors and camera activation in connection with firearm activity
US20160169603A1 (en) * 2014-12-15 2016-06-16 Yardarm Technologies, Inc. Method and system for identification of the user of a firearm due to unique signature measured by firearm sensor telemetry
JP2014240780A (ja) * 2013-06-11 2014-12-25 株式会社東芝 試料構造分析方法、透過電子顕微鏡およびプログラム
US9939393B2 (en) * 2015-09-28 2018-04-10 United Technologies Corporation Detection of crystallographic properties in aerospace components
US11815475B2 (en) * 2017-03-01 2023-11-14 The University Of Tokyo Method for identifying molecular structure
JP6930737B2 (ja) * 2018-04-02 2021-09-01 株式会社リガク 非晶質相の定量分析装置、非晶質相の定量分析方法、及び非晶質相の定量分析プログラム
FR3103897B1 (fr) * 2019-12-02 2022-04-01 Safran Dispositif et procédé de mesure des angles d’orientation d’un système d’imagerie x
US20240068966A1 (en) * 2020-06-08 2024-02-29 Danmarks Tekniske Universitet X-ray diffraction method for the analysis of amorphous and semi-crystalline materials
JP7414280B2 (ja) * 2020-12-11 2024-01-16 株式会社リガク 混合物の回折パターン分析方法、装置、プログラム及び情報記憶媒体
CN113325015B (zh) * 2021-05-12 2022-05-06 西安交通大学 劳厄衍射图谱中识别同一衍射峰所劈裂衍射亚峰的方法
US20230090150A1 (en) * 2021-09-23 2023-03-23 International Business Machines Corporation Systems and methods to obtain sufficient variability in cluster groups for use to train intelligent agents
JP7833174B2 (ja) * 2022-03-02 2026-03-19 株式会社リガク 混合物の回折パターン分析装置、方法、プログラム及び情報記憶媒体

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US5985356A (en) * 1994-10-18 1999-11-16 The Regents Of The University Of California Combinatorial synthesis of novel materials
US6004617A (en) * 1994-10-18 1999-12-21 The Regents Of The University Of California Combinatorial synthesis of novel materials
US6045671A (en) * 1994-10-18 2000-04-04 Symyx Technologies, Inc. Systems and methods for the combinatorial synthesis of novel materials
US5870697A (en) * 1996-03-05 1999-02-09 The Regents Of The University Of California Calculation of radiation therapy dose using all particle Monte Carlo transport
US6541271B1 (en) * 1996-10-09 2003-04-01 Symyx Technologies, Inc. Infrared spectroscopic imaging of libraries
US6306658B1 (en) * 1998-08-13 2001-10-23 Symyx Technologies Parallel reactor with internal sensing
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US6157449A (en) * 1998-10-19 2000-12-05 Symyx Technologies Depolarized light scattering array apparatus and method of using same
AU2368900A (en) * 1998-12-18 2000-07-03 Symyx Technologies, Inc. Apparatus and method for characterizing libraries of different materials using x-ray scattering
US6507945B1 (en) * 1999-05-05 2003-01-14 Symyx Technologies, Inc. Synthesizing combinatorial libraries of materials
JP3373803B2 (ja) * 1999-05-28 2003-02-04 科学技術振興事業団 コンビナトリアルx線回折装置
US20060015265A1 (en) * 1999-11-18 2006-01-19 Raich Anne C Method of rapidly identifying X-ray powder diffraction patterns
US6327334B1 (en) * 1999-11-18 2001-12-04 Uop Llc Method of rapidly screening X-ray powder diffraction patterns
US6507636B1 (en) * 2000-02-10 2003-01-14 Studiengesellschaft Kohle Mbh Rapid X-ray diffraction screening method of polymorph libraries created in multi-well plates
CA2405734A1 (en) 2000-04-14 2001-10-25 Symyx Technologies, Inc. Automated process control and data management system and methods
WO2002057763A2 (en) * 2000-10-19 2002-07-25 Structural Genomix, Inc. Apparatus and method for identification of crystals by in-situ x-ray diffraction
US6658429B2 (en) 2001-01-05 2003-12-02 Symyx Technologies, Inc. Laboratory database system and methods for combinatorial materials research
US6836532B2 (en) * 2001-06-29 2004-12-28 Bruker Axs, Inc. Diffraction system for biological crystal screening

Also Published As

Publication number Publication date
EP1527334A1 (de) 2005-05-04
JP2005534927A (ja) 2005-11-17
US20080120051A1 (en) 2008-05-22
AU2003261380A1 (en) 2004-02-23
US7372941B2 (en) 2008-05-13
US7715527B2 (en) 2010-05-11
WO2004013622A1 (en) 2004-02-12
US20040103130A1 (en) 2004-05-27
CA2494511A1 (en) 2004-02-12

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