IL131283A - מתקן ושיטות עבור בדיקת חפצים - Google Patents

מתקן ושיטות עבור בדיקת חפצים

Info

Publication number
IL131283A
IL131283A IL131283A IL13128399A IL131283A IL 131283 A IL131283 A IL 131283A IL 131283 A IL131283 A IL 131283A IL 13128399 A IL13128399 A IL 13128399A IL 131283 A IL131283 A IL 131283A
Authority
IL
Israel
Prior art keywords
data
inspection
image
window
defect
Prior art date
Application number
IL131283A
Other languages
English (en)
Other versions
IL131283A0 (en
Original Assignee
Orbotech Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Family has litigation
First worldwide family litigation filed litigation Critical https://patents.darts-ip.com/?family=11073120&utm_source=google_patent&utm_medium=platform_link&utm_campaign=public_patent_search&patent=IL131283(A) "Global patent litigation dataset” by Darts-ip is licensed under a Creative Commons Attribution 4.0 International License.
Application filed by Orbotech Ltd filed Critical Orbotech Ltd
Priority to IL131283A priority Critical patent/IL131283A/he
Priority to TW88113541A priority patent/TW484104B/zh
Priority to JP2001516141A priority patent/JP2003506801A/ja
Priority to AU64655/00A priority patent/AU6465500A/en
Priority to PCT/IL2000/000468 priority patent/WO2001011565A2/en
Publication of IL131283A0 publication Critical patent/IL131283A0/xx
Publication of IL131283A publication Critical patent/IL131283A/he

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G06T7/0004—Industrial image inspection
    • G06T7/001—Industrial image inspection using an image reference approach
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/30—Subject of image; Context of image processing
    • G06T2207/30108—Industrial image inspection
    • G06T2207/30152—Solder

Landscapes

  • Engineering & Computer Science (AREA)
  • Quality & Reliability (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Image Analysis (AREA)
  • Image Processing (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Length Measuring Devices By Optical Means (AREA)
IL131283A 1999-08-05 1999-08-05 מתקן ושיטות עבור בדיקת חפצים IL131283A (he)

Priority Applications (5)

Application Number Priority Date Filing Date Title
IL131283A IL131283A (he) 1999-08-05 1999-08-05 מתקן ושיטות עבור בדיקת חפצים
TW88113541A TW484104B (en) 1999-08-05 1999-08-06 Apparatus and method for the inspection of objects
JP2001516141A JP2003506801A (ja) 1999-08-05 2000-08-03 対象物検査装置および方法
AU64655/00A AU6465500A (en) 1999-08-05 2000-08-03 Apparatus and methods for the inspection of objects
PCT/IL2000/000468 WO2001011565A2 (en) 1999-08-05 2000-08-03 Apparatus and methods for the inspection of objects

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
IL131283A IL131283A (he) 1999-08-05 1999-08-05 מתקן ושיטות עבור בדיקת חפצים

Publications (2)

Publication Number Publication Date
IL131283A0 IL131283A0 (en) 2001-01-28
IL131283A true IL131283A (he) 2008-07-08

Family

ID=11073120

Family Applications (1)

Application Number Title Priority Date Filing Date
IL131283A IL131283A (he) 1999-08-05 1999-08-05 מתקן ושיטות עבור בדיקת חפצים

Country Status (4)

Country Link
JP (1) JP2003506801A (he)
AU (1) AU6465500A (he)
IL (1) IL131283A (he)
WO (1) WO2001011565A2 (he)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
IL133696A (en) 1999-12-23 2006-04-10 Orbotech Ltd Cam reference inspection of multi-color and contour images
US7355692B2 (en) 2004-03-05 2008-04-08 Orbotech Ltd System and method for inspecting electrical circuits utilizing reflective and fluorescent imagery
US8855400B2 (en) * 2012-03-08 2014-10-07 Kla-Tencor Corporation Detection of thin lines for selective sensitivity during reticle inspection using processed images
US10713776B2 (en) * 2017-04-13 2020-07-14 Instrumental, Inc. Method for predicting defects in assembly units
CN112669302B (zh) * 2020-12-30 2023-07-28 北京市商汤科技开发有限公司 吊弦缺陷检测方法、装置、电子设备及存储介质

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
IL96541A (en) * 1990-12-04 2000-08-13 Orbot Instr Ltd Apparatus and method for microscopic inspection of articles
FR2687091B1 (fr) * 1992-02-06 1996-08-23 Aerospatiale Procede de controle automatise des decoupes effectuees par une machine de decoupage dans un ruban.

Also Published As

Publication number Publication date
JP2003506801A (ja) 2003-02-18
AU6465500A (en) 2001-03-05
IL131283A0 (en) 2001-01-28
WO2001011565A3 (en) 2002-05-02
WO2001011565A2 (en) 2001-02-15

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Legal Events

Date Code Title Description
NP Permission for amending the patent specification granted (section 66, patents law 1967)