HUE042499T2 - Berendezés elektronikus kártyák ellenõrzésére - Google Patents
Berendezés elektronikus kártyák ellenõrzéséreInfo
- Publication number
- HUE042499T2 HUE042499T2 HUE12810375A HUE12810375A HUE042499T2 HU E042499 T2 HUE042499 T2 HU E042499T2 HU E12810375 A HUE12810375 A HU E12810375A HU E12810375 A HUE12810375 A HU E12810375A HU E042499 T2 HUE042499 T2 HU E042499T2
- Authority
- HU
- Hungary
- Prior art keywords
- electronic cards
- checking electronic
- checking
- cards
- electronic
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
- G01R31/2806—Apparatus therefor, e.g. test stations, drivers, analysers, conveyors
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
- G01R31/2806—Apparatus therefor, e.g. test stations, drivers, analysers, conveyors
- G01R31/2808—Holding, conveying or contacting devices, e.g. test adapters, edge connectors, extender boards
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/073—Multiple probes
- G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
- G01R1/07314—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support
- G01R1/07328—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support for testing printed circuit boards
- G01R1/07335—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support for testing printed circuit boards for double-sided contacting or for testing boards with surface-mounted devices (SMD's)
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- General Engineering & Computer Science (AREA)
- Casings For Electric Apparatus (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FR1161298A FR2983969B1 (fr) | 2011-12-07 | 2011-12-07 | Dispositif de controle de cartes electroniques. |
Publications (1)
Publication Number | Publication Date |
---|---|
HUE042499T2 true HUE042499T2 (hu) | 2019-06-28 |
Family
ID=47505237
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
HUE12810375A HUE042499T2 (hu) | 2011-12-07 | 2012-12-07 | Berendezés elektronikus kártyák ellenõrzésére |
Country Status (7)
Country | Link |
---|---|
US (1) | US9494638B2 (hu) |
EP (1) | EP2788779B1 (hu) |
ES (1) | ES2700949T3 (hu) |
FR (1) | FR2983969B1 (hu) |
HU (1) | HUE042499T2 (hu) |
PL (1) | PL2788779T3 (hu) |
WO (1) | WO2013083933A1 (hu) |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR102657145B1 (ko) * | 2017-10-26 | 2024-04-11 | 자일링크스 인코포레이티드 | 집적 회로 패키지 워크프레스 테스팅 시스템들에 대한 밸런싱된 합치력 메커니즘 |
US10564212B2 (en) | 2017-11-02 | 2020-02-18 | Xilinx, Inc. | Integrated circuit package testing system |
Family Cites Families (14)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE3781979D1 (de) * | 1986-08-07 | 1992-11-05 | Siemens Ag | Pruefeinrichtung fuer beidseitige, zweistufige kontaktierung bestueckter leiterplatten. |
US5180976A (en) * | 1987-04-17 | 1993-01-19 | Everett/Charles Contact Products, Inc. | Integrated circuit carrier having built-in circuit verification |
US5150041A (en) * | 1991-06-21 | 1992-09-22 | Compaq Computer Corporation | Optically alignable printed circuit board test fixture apparatus and associated methods |
US5572144A (en) * | 1993-02-22 | 1996-11-05 | Seagate Technology | Test jig and method for probing a printed circuit board |
US5635775A (en) * | 1995-04-14 | 1997-06-03 | Colburn; Richard H. | Printed circuit board mount electro-magnetic interference suppressor |
KR0177219B1 (ko) * | 1995-06-30 | 1999-04-01 | 배순훈 | 고밀도실장 인서키트 검사장치 |
US5894225A (en) * | 1996-10-31 | 1999-04-13 | Coffin; Harry S. | Test fixture |
FR2842607B1 (fr) * | 2002-07-17 | 2005-05-27 | And Elec | "dispositif de controle de cartes electroniques a presse amovible et interface adaptee" |
TW590219U (en) * | 2003-03-12 | 2004-06-01 | Hon Hai Prec Ind Co Ltd | Tester for mainboards |
US7443183B2 (en) * | 2005-12-29 | 2008-10-28 | Hong Fu Jin Precision Industry (Shenzhen) Co., Ltd. | Motherboard test machine |
TW200813450A (en) * | 2006-09-05 | 2008-03-16 | Inventec Appliances Corp | PC board inspection device |
US20080197868A1 (en) * | 2007-02-20 | 2008-08-21 | Troy Fossum | Circuit board testing device with self aligning plates |
US7400135B1 (en) * | 2007-02-23 | 2008-07-15 | Quality One Test Fixturing, Inc. | Test fixture and method for circuit board testing |
EP1995602B1 (en) * | 2007-05-23 | 2013-08-14 | RRo Holding B.V. | Probe board, test fixture, method for making a probe board, and method for testing a printed circuit board |
-
2011
- 2011-12-07 FR FR1161298A patent/FR2983969B1/fr not_active Expired - Fee Related
-
2012
- 2012-12-07 ES ES12810375T patent/ES2700949T3/es active Active
- 2012-12-07 PL PL12810375T patent/PL2788779T3/pl unknown
- 2012-12-07 US US14/362,579 patent/US9494638B2/en active Active
- 2012-12-07 EP EP12810375.1A patent/EP2788779B1/fr not_active Not-in-force
- 2012-12-07 WO PCT/FR2012/052842 patent/WO2013083933A1/fr active Application Filing
- 2012-12-07 HU HUE12810375A patent/HUE042499T2/hu unknown
Also Published As
Publication number | Publication date |
---|---|
ES2700949T3 (es) | 2019-02-20 |
WO2013083933A1 (fr) | 2013-06-13 |
EP2788779B1 (fr) | 2018-09-19 |
US20140333338A1 (en) | 2014-11-13 |
EP2788779A1 (fr) | 2014-10-15 |
US9494638B2 (en) | 2016-11-15 |
FR2983969A1 (fr) | 2013-06-14 |
PL2788779T3 (pl) | 2019-02-28 |
FR2983969B1 (fr) | 2014-12-05 |
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