PL2788779T3 - Urządzenie do kontroli kart elektronicznych - Google Patents
Urządzenie do kontroli kart elektronicznychInfo
- Publication number
- PL2788779T3 PL2788779T3 PL12810375T PL12810375T PL2788779T3 PL 2788779 T3 PL2788779 T3 PL 2788779T3 PL 12810375 T PL12810375 T PL 12810375T PL 12810375 T PL12810375 T PL 12810375T PL 2788779 T3 PL2788779 T3 PL 2788779T3
- Authority
- PL
- Poland
- Prior art keywords
- electronic cards
- checking electronic
- checking
- cards
- electronic
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
- G01R31/2806—Apparatus therefor, e.g. test stations, drivers, analysers, conveyors
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
- G01R31/2806—Apparatus therefor, e.g. test stations, drivers, analysers, conveyors
- G01R31/2808—Holding, conveying or contacting devices, e.g. test adapters, edge connectors, extender boards
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/073—Multiple probes
- G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
- G01R1/07314—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support
- G01R1/07328—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support for testing printed circuit boards
- G01R1/07335—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support for testing printed circuit boards for double-sided contacting or for testing boards with surface-mounted devices (SMD's)
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FR1161298A FR2983969B1 (fr) | 2011-12-07 | 2011-12-07 | Dispositif de controle de cartes electroniques. |
PCT/FR2012/052842 WO2013083933A1 (fr) | 2011-12-07 | 2012-12-07 | Dispositif de controle de cartes electroniques |
EP12810375.1A EP2788779B1 (fr) | 2011-12-07 | 2012-12-07 | Dispositif de controle de cartes electroniques |
Publications (1)
Publication Number | Publication Date |
---|---|
PL2788779T3 true PL2788779T3 (pl) | 2019-02-28 |
Family
ID=47505237
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PL12810375T PL2788779T3 (pl) | 2011-12-07 | 2012-12-07 | Urządzenie do kontroli kart elektronicznych |
Country Status (7)
Country | Link |
---|---|
US (1) | US9494638B2 (pl) |
EP (1) | EP2788779B1 (pl) |
ES (1) | ES2700949T3 (pl) |
FR (1) | FR2983969B1 (pl) |
HU (1) | HUE042499T2 (pl) |
PL (1) | PL2788779T3 (pl) |
WO (1) | WO2013083933A1 (pl) |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2019084318A1 (en) * | 2017-10-26 | 2019-05-02 | Xilinx, Inc. | BALANCED CONFORMATION FORCE MECHANISM FOR INTEGRATED CIRCUIT BOX WORK PRESS SYSTEMS |
US10564212B2 (en) | 2017-11-02 | 2020-02-18 | Xilinx, Inc. | Integrated circuit package testing system |
Family Cites Families (14)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0256368B1 (de) * | 1986-08-07 | 1992-09-30 | Siemens Aktiengesellschaft | Prüfeinrichtung für beidseitige, zweistufige Kontaktierung bestückter Leiterplatten |
US5180976A (en) * | 1987-04-17 | 1993-01-19 | Everett/Charles Contact Products, Inc. | Integrated circuit carrier having built-in circuit verification |
US5150041A (en) * | 1991-06-21 | 1992-09-22 | Compaq Computer Corporation | Optically alignable printed circuit board test fixture apparatus and associated methods |
US5572144A (en) * | 1993-02-22 | 1996-11-05 | Seagate Technology | Test jig and method for probing a printed circuit board |
US5635775A (en) * | 1995-04-14 | 1997-06-03 | Colburn; Richard H. | Printed circuit board mount electro-magnetic interference suppressor |
KR0177219B1 (ko) * | 1995-06-30 | 1999-04-01 | 배순훈 | 고밀도실장 인서키트 검사장치 |
US5894225A (en) * | 1996-10-31 | 1999-04-13 | Coffin; Harry S. | Test fixture |
FR2842607B1 (fr) * | 2002-07-17 | 2005-05-27 | And Elec | "dispositif de controle de cartes electroniques a presse amovible et interface adaptee" |
TW590219U (en) * | 2003-03-12 | 2004-06-01 | Hon Hai Prec Ind Co Ltd | Tester for mainboards |
US7443183B2 (en) * | 2005-12-29 | 2008-10-28 | Hong Fu Jin Precision Industry (Shenzhen) Co., Ltd. | Motherboard test machine |
TW200813450A (en) * | 2006-09-05 | 2008-03-16 | Inventec Appliances Corp | PC board inspection device |
US20080197868A1 (en) * | 2007-02-20 | 2008-08-21 | Troy Fossum | Circuit board testing device with self aligning plates |
US7400135B1 (en) * | 2007-02-23 | 2008-07-15 | Quality One Test Fixturing, Inc. | Test fixture and method for circuit board testing |
EP1995602B1 (en) * | 2007-05-23 | 2013-08-14 | RRo Holding B.V. | Probe board, test fixture, method for making a probe board, and method for testing a printed circuit board |
-
2011
- 2011-12-07 FR FR1161298A patent/FR2983969B1/fr not_active Expired - Fee Related
-
2012
- 2012-12-07 WO PCT/FR2012/052842 patent/WO2013083933A1/fr active Application Filing
- 2012-12-07 HU HUE12810375A patent/HUE042499T2/hu unknown
- 2012-12-07 US US14/362,579 patent/US9494638B2/en active Active
- 2012-12-07 EP EP12810375.1A patent/EP2788779B1/fr not_active Not-in-force
- 2012-12-07 PL PL12810375T patent/PL2788779T3/pl unknown
- 2012-12-07 ES ES12810375T patent/ES2700949T3/es active Active
Also Published As
Publication number | Publication date |
---|---|
FR2983969A1 (fr) | 2013-06-14 |
WO2013083933A1 (fr) | 2013-06-13 |
HUE042499T2 (hu) | 2019-06-28 |
US20140333338A1 (en) | 2014-11-13 |
EP2788779B1 (fr) | 2018-09-19 |
ES2700949T3 (es) | 2019-02-20 |
FR2983969B1 (fr) | 2014-12-05 |
US9494638B2 (en) | 2016-11-15 |
EP2788779A1 (fr) | 2014-10-15 |
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