HU9201449D0 - Method for localized spectroscopic analysis of the light diffracted or absorbed by a substance placed in a near field - Google Patents

Method for localized spectroscopic analysis of the light diffracted or absorbed by a substance placed in a near field

Info

Publication number
HU9201449D0
HU9201449D0 HU9201449A HU144990A HU9201449D0 HU 9201449 D0 HU9201449 D0 HU 9201449D0 HU 9201449 A HU9201449 A HU 9201449A HU 144990 A HU144990 A HU 144990A HU 9201449 D0 HU9201449 D0 HU 9201449D0
Authority
HU
Hungary
Prior art keywords
near field
spectroscopic analysis
absorbed
substance
light diffracted
Prior art date
Application number
HU9201449A
Other languages
English (en)
Inventor
Fornel Frederique De
Jean-Pierre Goudonnet
Original Assignee
Spiral Rech & Dev
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Family has litigation
First worldwide family litigation filed litigation Critical https://patents.darts-ip.com/?family=9387052&utm_source=google_patent&utm_medium=platform_link&utm_campaign=public_patent_search&patent=HU9201449(D0) "Global patent litigation dataset” by Darts-ip is licensed under a Creative Commons Attribution 4.0 International License.
Application filed by Spiral Rech & Dev filed Critical Spiral Rech & Dev
Publication of HU9201449D0 publication Critical patent/HU9201449D0/hu

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q60/00—Particular types of SPM [Scanning Probe Microscopy] or microscopes; Essential components thereof
    • G01Q60/18—SNOM [Scanning Near-Field Optical Microscopy] or apparatus therefor, e.g. SNOM probes
    • G01Q60/22—Probes, their manufacture, or their related instrumentation, e.g. holders
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/55—Specular reflectivity
    • G01N21/552—Attenuated total reflection
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N2021/1738—Optionally different kinds of measurements; Method being valid for different kinds of measurement
    • G01N2021/1742—Optionally different kinds of measurements; Method being valid for different kinds of measurement either absorption or reflection

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Radiology & Medical Imaging (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
  • Microscoopes, Condenser (AREA)
HU9201449A 1989-11-03 1990-10-31 Method for localized spectroscopic analysis of the light diffracted or absorbed by a substance placed in a near field HU9201449D0 (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR8914425A FR2654212A1 (fr) 1989-11-03 1989-11-03 Procede d'analyse spectroscopique ponctuelle de la lumiere diffractee ou absorbee par une substance placee dans un champ proche, et microscopes optiques a balayage en champ proche mettant en óoeuvre ce procede.

Publications (1)

Publication Number Publication Date
HU9201449D0 true HU9201449D0 (en) 1992-09-28

Family

ID=9387052

Family Applications (2)

Application Number Title Priority Date Filing Date
HU9201449A HU9201449D0 (en) 1989-11-03 1990-10-31 Method for localized spectroscopic analysis of the light diffracted or absorbed by a substance placed in a near field
HU9201449A HUT62098A (en) 1989-11-03 1990-10-31 Method for testing transparent and/or reflective objects placed in the near filed by means of microscope, as well as scanning microscope

Family Applications After (1)

Application Number Title Priority Date Filing Date
HU9201449A HUT62098A (en) 1989-11-03 1990-10-31 Method for testing transparent and/or reflective objects placed in the near filed by means of microscope, as well as scanning microscope

Country Status (12)

Country Link
EP (1) EP0426571A1 (hu)
CN (1) CN1052373A (hu)
AU (1) AU6731990A (hu)
BR (1) BR9007809A (hu)
CA (1) CA2072628A1 (hu)
FI (1) FI921941A0 (hu)
FR (1) FR2654212A1 (hu)
HU (2) HU9201449D0 (hu)
IL (1) IL96240A0 (hu)
OA (1) OA09542A (hu)
WO (1) WO1991006884A1 (hu)
ZA (1) ZA908797B (hu)

Families Citing this family (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB9112343D0 (en) * 1991-06-08 1991-07-31 Renishaw Transducer Syst Surface analysis apparatus
US5510894A (en) * 1988-12-22 1996-04-23 Renishaw Plc Spectroscopic apparatus and methods
DE69118117T2 (de) * 1990-11-19 1996-10-24 At & T Corp., New York, N.Y. Optisches Nahfeldabtastmikroskop und dessen Anwendungen
JP3074357B2 (ja) * 1991-10-03 2000-08-07 セイコーインスツルメンツ株式会社 微細表面観察装置
FR2685127B1 (fr) 1991-12-13 1994-02-04 Christian Licoppe Photonanographe a gaz pour la fabrication et l'analyse optique de motifs a l'echelle nanometrique.
FR2685789A1 (fr) * 1991-12-31 1993-07-02 Centre Nat Rech Scient Microscope en champ proche fonctionnant par detection tunnel optique.
US5739527A (en) * 1993-10-04 1998-04-14 International Business Machines Corporation Near-field optical microscope for angle resolved measurements
DE19531802A1 (de) * 1995-08-30 1997-03-06 Guenter Guttroff Verfahren zur Steigerung des optischen Auflösungsvermögens
JP3343086B2 (ja) 1998-04-28 2002-11-11 富士写真フイルム株式会社 表面プラズモンセンサー
GB9810350D0 (en) 1998-05-14 1998-07-15 Ciba Geigy Ag Organic compounds
US6858436B2 (en) * 2002-04-30 2005-02-22 Motorola, Inc. Near-field transform spectroscopy
EP1903329B1 (en) * 2006-09-20 2010-12-22 Services Pétroliers Schlumberger An apparatus and method for optically determining the presence of carbon dioxide
DE102017213865A1 (de) * 2017-08-09 2019-02-14 Robert Bosch Gmbh Spektrometrische Messvorrichtung und Verfahren zur Analyse eines Mediums unter Verwendung einer spektrometrischen Messvorrichtung

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3811777A (en) * 1973-02-06 1974-05-21 Johnson Res Foundation Medical Time-sharing fluorometer and reflectometer
US4500204A (en) * 1981-04-21 1985-02-19 Agency Of Industrial Science & Technology Scanning-type lithographic and image-pickup device using optical fiber
EP0112401B1 (en) * 1982-12-27 1987-04-22 International Business Machines Corporation Optical near-field scanning microscope
US4659429A (en) * 1983-08-03 1987-04-21 Cornell Research Foundation, Inc. Method and apparatus for production and use of nanometer scale light beams

Also Published As

Publication number Publication date
IL96240A0 (en) 1991-08-16
OA09542A (fr) 1992-11-15
EP0426571A1 (fr) 1991-05-08
CA2072628A1 (fr) 1991-05-04
CN1052373A (zh) 1991-06-19
FR2654212A1 (fr) 1991-05-10
ZA908797B (en) 1991-08-28
WO1991006884A1 (fr) 1991-05-16
AU6731990A (en) 1991-05-31
FI921941A (fi) 1992-04-30
BR9007809A (pt) 1992-09-01
HUT62098A (en) 1993-03-29
FI921941A0 (fi) 1992-04-30

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