IL96240A0 - Process for the pinpoint spectroscopic analysis of the light diffracted or absorbed by a substance placed in a near field - Google Patents

Process for the pinpoint spectroscopic analysis of the light diffracted or absorbed by a substance placed in a near field

Info

Publication number
IL96240A0
IL96240A0 IL96240A IL9624090A IL96240A0 IL 96240 A0 IL96240 A0 IL 96240A0 IL 96240 A IL96240 A IL 96240A IL 9624090 A IL9624090 A IL 9624090A IL 96240 A0 IL96240 A0 IL 96240A0
Authority
IL
Israel
Prior art keywords
pinpoint
absorbed
near field
spectroscopic analysis
light diffracted
Prior art date
Application number
IL96240A
Original Assignee
Spiral Rech & Dev
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Family has litigation
First worldwide family litigation filed litigation Critical https://patents.darts-ip.com/?family=9387052&utm_source=google_patent&utm_medium=platform_link&utm_campaign=public_patent_search&patent=IL96240(A0) "Global patent litigation dataset” by Darts-ip is licensed under a Creative Commons Attribution 4.0 International License.
Application filed by Spiral Rech & Dev filed Critical Spiral Rech & Dev
Publication of IL96240A0 publication Critical patent/IL96240A0/en

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01QSCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q60/00Particular types of SPM [Scanning Probe Microscopy] or microscopes; Essential components thereof
    • G01Q60/18SNOM [Scanning Near-Field Optical Microscopy] or apparatus therefor, e.g. SNOM probes
    • G01Q60/22Probes, their manufacture, or their related instrumentation, e.g. holders
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/55Specular reflectivity
    • G01N21/552Attenuated total reflection
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N2021/1738Optionally different kinds of measurements; Method being valid for different kinds of measurement
    • G01N2021/1742Optionally different kinds of measurements; Method being valid for different kinds of measurement either absorption or reflection

Landscapes

  • General Health & Medical Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Biochemistry (AREA)
  • Analytical Chemistry (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Radiology & Medical Imaging (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
  • Microscoopes, Condenser (AREA)
IL96240A 1989-11-03 1990-11-05 Process for the pinpoint spectroscopic analysis of the light diffracted or absorbed by a substance placed in a near field IL96240A0 (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR8914425A FR2654212A1 (en) 1989-11-03 1989-11-03 METHOD OF SPECTROSCOPIC ANALYSIS OF THE LIGHT DIFFRACTEE OR ABSORBED BY A SUBSTANCE PLACED IN A CLOSE FIELD, AND NEAR-FIELD SCANNING OPTICAL MICROSCOPES IMPLEMENTING SAID METHOD

Publications (1)

Publication Number Publication Date
IL96240A0 true IL96240A0 (en) 1991-08-16

Family

ID=9387052

Family Applications (1)

Application Number Title Priority Date Filing Date
IL96240A IL96240A0 (en) 1989-11-03 1990-11-05 Process for the pinpoint spectroscopic analysis of the light diffracted or absorbed by a substance placed in a near field

Country Status (12)

Country Link
EP (1) EP0426571A1 (en)
CN (1) CN1052373A (en)
AU (1) AU6731990A (en)
BR (1) BR9007809A (en)
CA (1) CA2072628A1 (en)
FI (1) FI921941A (en)
FR (1) FR2654212A1 (en)
HU (2) HUT62098A (en)
IL (1) IL96240A0 (en)
OA (1) OA09542A (en)
WO (1) WO1991006884A1 (en)
ZA (1) ZA908797B (en)

Families Citing this family (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5510894A (en) * 1988-12-22 1996-04-23 Renishaw Plc Spectroscopic apparatus and methods
GB9112343D0 (en) * 1991-06-08 1991-07-31 Renishaw Transducer Syst Surface analysis apparatus
EP0487233B1 (en) * 1990-11-19 1996-03-20 AT&T Corp. Near field scanning optical microscope and applications thereof
JP3074357B2 (en) * 1991-10-03 2000-08-07 セイコーインスツルメンツ株式会社 Micro surface observation device
FR2685127B1 (en) 1991-12-13 1994-02-04 Christian Licoppe GAS PHOTONANOGRAPH FOR THE MANUFACTURE AND OPTICAL ANALYSIS OF PATTERNS ON THE NANOMETRIC SCALE.
FR2685789A1 (en) * 1991-12-31 1993-07-02 Centre Nat Rech Scient Near-field microscope operating by optical tunnel detection
KR100262878B1 (en) * 1993-10-04 2000-08-01 포만 제프리 엘 Near-field optical microscope and the measuring method
DE19531802A1 (en) * 1995-08-30 1997-03-06 Guenter Guttroff Scanning near field optical microscope
JP3343086B2 (en) 1998-04-28 2002-11-11 富士写真フイルム株式会社 Surface plasmon sensor
GB9810350D0 (en) * 1998-05-14 1998-07-15 Ciba Geigy Ag Organic compounds
US6858436B2 (en) * 2002-04-30 2005-02-22 Motorola, Inc. Near-field transform spectroscopy
DE602006019094D1 (en) * 2006-09-20 2011-02-03 Schlumberger Technology Bv Apparatus and method for optically detecting the presence of carbon dioxide
DE102017213865A1 (en) * 2017-08-09 2019-02-14 Robert Bosch Gmbh A spectrometric measuring device and method for analyzing a medium using a spectrometric measuring device

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3811777A (en) * 1973-02-06 1974-05-21 Johnson Res Foundation Medical Time-sharing fluorometer and reflectometer
US4500204A (en) * 1981-04-21 1985-02-19 Agency Of Industrial Science & Technology Scanning-type lithographic and image-pickup device using optical fiber
EP0112401B1 (en) * 1982-12-27 1987-04-22 International Business Machines Corporation Optical near-field scanning microscope
US4659429A (en) * 1983-08-03 1987-04-21 Cornell Research Foundation, Inc. Method and apparatus for production and use of nanometer scale light beams

Also Published As

Publication number Publication date
HUT62098A (en) 1993-03-29
FI921941A0 (en) 1992-04-30
ZA908797B (en) 1991-08-28
WO1991006884A1 (en) 1991-05-16
OA09542A (en) 1992-11-15
CN1052373A (en) 1991-06-19
EP0426571A1 (en) 1991-05-08
BR9007809A (en) 1992-09-01
HU9201449D0 (en) 1992-09-28
CA2072628A1 (en) 1991-05-04
FI921941A (en) 1992-04-30
AU6731990A (en) 1991-05-31
FR2654212A1 (en) 1991-05-10

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