HRP20231068T1 - Postupak izvlačenja cilindričnog kristala iz taline - Google Patents

Postupak izvlačenja cilindričnog kristala iz taline Download PDF

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Publication number
HRP20231068T1
HRP20231068T1 HRP20231068TT HRP20231068T HRP20231068T1 HR P20231068 T1 HRP20231068 T1 HR P20231068T1 HR P20231068T T HRP20231068T T HR P20231068TT HR P20231068 T HRP20231068 T HR P20231068T HR P20231068 T1 HRP20231068 T1 HR P20231068T1
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HR
Croatia
Prior art keywords
crystal
value
height
crucible
annular gap
Prior art date
Application number
HRP20231068TT
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English (en)
Inventor
Andreas MÜHE
Original Assignee
Pva Tepla Ag
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
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Publication date
Application filed by Pva Tepla Ag filed Critical Pva Tepla Ag
Publication of HRP20231068T1 publication Critical patent/HRP20231068T1/hr

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Classifications

    • CCHEMISTRY; METALLURGY
    • C30CRYSTAL GROWTH
    • C30BSINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
    • C30B15/00Single-crystal growth by pulling from a melt, e.g. Czochralski method
    • C30B15/20Controlling or regulating
    • C30B15/203Controlling or regulating the relationship of pull rate (v) to axial thermal gradient (G)
    • CCHEMISTRY; METALLURGY
    • C30CRYSTAL GROWTH
    • C30BSINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
    • C30B15/00Single-crystal growth by pulling from a melt, e.g. Czochralski method
    • C30B15/14Heating of the melt or the crystallised materials
    • CCHEMISTRY; METALLURGY
    • C30CRYSTAL GROWTH
    • C30BSINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
    • C30B15/00Single-crystal growth by pulling from a melt, e.g. Czochralski method
    • C30B15/30Mechanisms for rotating or moving either the melt or the crystal
    • CCHEMISTRY; METALLURGY
    • C30CRYSTAL GROWTH
    • C30BSINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
    • C30B29/00Single crystals or homogeneous polycrystalline material with defined structure characterised by the material or by their shape
    • C30B29/02Elements
    • C30B29/06Silicon

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  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Materials Engineering (AREA)
  • Metallurgy (AREA)
  • Organic Chemistry (AREA)
  • Crystals, And After-Treatments Of Crystals (AREA)

Claims (5)

1. Postupak izvlačenja cilindričnog kristala (5) iz taline (2) korištenjem sustava za izvlačenje kristala, koja sadrži: lončić (3), u kojem se nalazi talina (2), grijač lončića (4), koji prstenasto okružuje lončić (3), uređaj za podizanje lončića (7) za podizanje lončića (3), uređaj za podizanje kristala (6) za izvlačenje kristala (5) iz taline (2) i toplinski štit (10) koji prstenasto okružuje kristal (5), čiji donji rub završava oblikovanjem prstenastog procjepa (12) iznad taline (2), naznačen time što je stvarna vrijednost promjera kristala mjerena na površini taline i uspoređuje se s referentnom vrijednošću promjera kristala, što se visina prstenastog procjepa (12) postavlja ovisno o odmaku između stvarne i referentne vrijednosti s prvim regulatorom, koji prikazuje prvo vrijeme podešavanja, pri čemu se kod stvarne vrijednosti, koja je manja od referentne vrijednosti, visina prstenastog procjepa smanjuje i kod stvarne vrijednosti, koja je veća od referentne vrijednosti, visina prstenastog procjepa povećava, i što se za promjenu visine prstenastog procjepa brzina podizanja lončića (3) i u istoj mjeri brzina podizanja kristala (5) mogu mijenjati, kako bi brzina izvlačenja kristala ostala nepromjenjiva.
2. Postupak prema patentnom zahtjevu 1, naznačen time što se za brzinu podizanja (14) lončića postavlja temeljna vrijednost, koja nadomješta volumensku potrošnju taline (2), što se postavlja temeljna vrijednost za brzinu (13) podizanja kristala i što se za podešavanje visine prstenastog procjepa objema temeljnim vrijednostima dodaje jednaka vrijednost pomaka.
3. Postupak prema patentnom zahtjevu 1 ili 2, naznačen time što se namještena vrijednost visine prstenastog procjepa dovodi kao stvarna vrijednost za podešavanje snage grijanja grijača lončića (4) putem drugog regulatora, koji prikazuje drugo vrijeme podešavanja, pri čemu se kao namještena vrijednost zadaje srednja visina prstenastog procjepa.
4. Postupak prema jednom od prethodnih patentnih zahtjeva, naznačen time što je prvo vrijeme podešavanja manje od drugog vremena podešavanja.
5. Postupak prema patentnom zahtjevu 3 ili 4, naznačen time što se namještena vrijednost visine prstenastog procjepa dovodi regulatoru snage grijanja (28) kao stvarna vrijednost putem PT1-filtra (40).
HRP20231068TT 2019-01-28 2020-01-24 Postupak izvlačenja cilindričnog kristala iz taline HRP20231068T1 (hr)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
DE102019101991.5A DE102019101991A1 (de) 2019-01-28 2019-01-28 Verfahren zum Ziehen eines zylindrischen Kristalls aus einer Schmelze
PCT/DE2020/200007 WO2020156621A1 (de) 2019-01-28 2020-01-24 Verfahren zum ziehen eines zylindrischen kristalls aus einer schmelze
EP20708424.5A EP3918116B1 (de) 2019-01-28 2020-01-24 Verfahren zum ziehen eines zylindrischen kristalls aus einer schmelze

Publications (1)

Publication Number Publication Date
HRP20231068T1 true HRP20231068T1 (hr) 2023-12-22

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HRP20231068TT HRP20231068T1 (hr) 2019-01-28 2020-01-24 Postupak izvlačenja cilindričnog kristala iz taline

Country Status (11)

Country Link
US (1) US11965267B2 (hr)
EP (1) EP3918116B1 (hr)
JP (1) JP2022518921A (hr)
KR (1) KR102698437B1 (hr)
CN (1) CN113302344A (hr)
DE (2) DE102019101991A1 (hr)
ES (1) ES2955197T3 (hr)
HR (1) HRP20231068T1 (hr)
PL (1) PL3918116T3 (hr)
SG (1) SG11202107900VA (hr)
WO (1) WO2020156621A1 (hr)

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4293395B2 (ja) * 1999-04-28 2009-07-08 Sumco Techxiv株式会社 Cz法単結晶インゴット製造装置及び方法
CN1396965A (zh) * 2000-02-01 2003-02-12 Memc电子材料有限公司 用于控制硅晶体生长使生长速率和直径的偏差减至最小的方法
DE10119947A1 (de) * 2001-04-24 2002-10-31 Crystal Growing Systems Gmbh Verfahren zum Steuern einer Kristallziehanlage und Kristallziehanlage zu seiner Durchführung
JP4457584B2 (ja) * 2003-06-27 2010-04-28 信越半導体株式会社 単結晶の製造方法及び単結晶
JP2005015313A (ja) 2003-06-27 2005-01-20 Shin Etsu Handotai Co Ltd 単結晶の製造方法及び単結晶
JP2006203111A (ja) 2005-01-24 2006-08-03 Hosiden Corp 物体検出センサ
DE102009056638B4 (de) 2009-12-02 2013-08-01 Siltronic Ag Verfahren zum Ziehen eines Einkristalls aus Silizium mit einem Abschnitt mit gleich bleibendem Durchmesser
JP5859566B2 (ja) * 2010-12-30 2016-02-10 エムイーエムシー・エレクトロニック・マテリアルズ・インコーポレイテッドMemc Electronic Materials,Incorporated 多数のカメラを用いる結晶の成長特性計測方法
JP6078974B2 (ja) 2012-04-04 2017-02-15 株式会社Sumco シリコン単結晶の製造方法
DE102013210687B4 (de) 2013-06-07 2018-12-06 Siltronic Ag Verfahren zur Regelung des Durchmessers eines Einkristalls auf einen Solldurchmesser
KR101540863B1 (ko) * 2013-12-17 2015-07-30 주식회사 엘지실트론 잉곳 직경 제어장치 및 이를 포함하는 잉곳성장장치 및 그 방법
KR101571958B1 (ko) * 2014-01-28 2015-11-25 주식회사 엘지실트론 잉곳성장장치 및 잉곳성장방법

Also Published As

Publication number Publication date
WO2020156621A1 (de) 2020-08-06
CN113302344A (zh) 2021-08-24
TW202035804A (zh) 2020-10-01
EP3918116C0 (de) 2023-06-07
EP3918116A1 (de) 2021-12-08
JP2022518921A (ja) 2022-03-17
KR102698437B1 (ko) 2024-08-26
KR20210118413A (ko) 2021-09-30
PL3918116T3 (pl) 2023-11-27
DE102019101991A1 (de) 2020-07-30
US20220098755A1 (en) 2022-03-31
ES2955197T3 (es) 2023-11-29
EP3918116B1 (de) 2023-06-07
SG11202107900VA (en) 2021-08-30
DE112020000539A5 (de) 2021-10-21
US11965267B2 (en) 2024-04-23

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