HK85993A - Exponential decay time constant measurement using frequency of offset-phase locked loop:system and method - Google Patents

Exponential decay time constant measurement using frequency of offset-phase locked loop:system and method

Info

Publication number
HK85993A
HK85993A HK859/93A HK85993A HK85993A HK 85993 A HK85993 A HK 85993A HK 859/93 A HK859/93 A HK 859/93A HK 85993 A HK85993 A HK 85993A HK 85993 A HK85993 A HK 85993A
Authority
HK
Hong Kong
Prior art keywords
offset
frequency
time constant
locked loop
phase locked
Prior art date
Application number
HK859/93A
Other languages
English (en)
Inventor
John Noland Dukes
William F Carlsen Jr
Richard J Pittaro
Original Assignee
Hewlett Packard Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Family has litigation
First worldwide family litigation filed litigation Critical https://patents.darts-ip.com/?family=21951152&utm_source=google_patent&utm_medium=platform_link&utm_campaign=public_patent_search&patent=HK85993(A) "Global patent litigation dataset” by Darts-ip is licensed under a Creative Commons Attribution 4.0 International License.
Application filed by Hewlett Packard Co filed Critical Hewlett Packard Co
Publication of HK85993A publication Critical patent/HK85993A/xx

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R23/00—Arrangements for measuring frequencies; Arrangements for analysing frequency spectra
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/64—Fluorescence; Phosphorescence
    • G01N21/6408—Fluorescence; Phosphorescence with measurement of decay time, time resolved fluorescence
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N25/00—Investigating or analyzing materials by the use of thermal means
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/314—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry with comparison of measurements at specific and non-specific wavelengths
    • G01N2021/3144—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry with comparison of measurements at specific and non-specific wavelengths for oxymetry
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/64—Fluorescence; Phosphorescence
    • G01N21/6428—Measuring fluorescence of fluorescent products of reactions or of fluorochrome labelled reactive substances, e.g. measuring quenching effects, using measuring "optrodes"
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
    • Y10T436/00—Chemistry: analytical and immunological testing
    • Y10T436/20—Oxygen containing
    • Y10T436/207497—Molecular oxygen
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
    • Y10T436/00—Chemistry: analytical and immunological testing
    • Y10T436/20—Oxygen containing
    • Y10T436/207497—Molecular oxygen
    • Y10T436/209163—Dissolved or trace oxygen or oxygen content of a sealed environment

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Biochemistry (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
  • Measurement Of The Respiration, Hearing Ability, Form, And Blood Characteristics Of Living Organisms (AREA)
  • Medical Treatment And Welfare Office Work (AREA)
  • Measurement Of Unknown Time Intervals (AREA)
HK859/93A 1987-05-08 1993-08-19 Exponential decay time constant measurement using frequency of offset-phase locked loop:system and method HK85993A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US07/047,818 US4716363A (en) 1987-05-08 1987-05-08 Exponential decay time constant measurement using frequency of offset phase-locked loop: system and method

Publications (1)

Publication Number Publication Date
HK85993A true HK85993A (en) 1993-08-27

Family

ID=21951152

Family Applications (1)

Application Number Title Priority Date Filing Date
HK859/93A HK85993A (en) 1987-05-08 1993-08-19 Exponential decay time constant measurement using frequency of offset-phase locked loop:system and method

Country Status (5)

Country Link
US (1) US4716363A (ja)
EP (1) EP0294938B1 (ja)
JP (1) JP2645270B2 (ja)
DE (1) DE3874008T2 (ja)
HK (1) HK85993A (ja)

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US4754216A (en) * 1987-09-03 1988-06-28 National Semiconductor Corporation Method and apparatus for qualifying the decode window margin of a phase locked loop data synchronizer
DK163194C (da) * 1988-12-22 1992-06-22 Radiometer As Fremgangsmaade ved fotometrisk in vitro bestemmelse af en blodgasparameter i en blodproeve
GB2218216B (en) * 1988-04-29 1992-09-23 Schlumberger Electronics Improvements in or relating to frequency response analysis
US4885554A (en) * 1988-12-16 1989-12-05 Tektronix, Inc. Phase-offset signal generator
US5152291A (en) * 1990-09-07 1992-10-06 Hewlett-Packard Company Acoustic fiber measurement of intravascular blood
US5057771A (en) * 1990-06-18 1991-10-15 Tetronix, Inc. Phase-locked timebase for electro-optic sampling
US5107445A (en) * 1990-12-04 1992-04-21 Luxtron Corporation Modular luminescence-based measuring system using fast digital signal processing
US5176882A (en) * 1990-12-06 1993-01-05 Hewlett-Packard Company Dual fiberoptic cell for multiple serum measurements
US5323008A (en) * 1992-03-23 1994-06-21 Diatron Corporation Fluorometer detection system
US5462879A (en) * 1993-10-14 1995-10-31 Minnesota Mining And Manufacturing Company Method of sensing with emission quenching sensors
CA2147561C (en) * 1994-05-10 1997-09-16 Klaus W. Berndt Composite optical blood culture sensor
JP3364333B2 (ja) * 1994-09-19 2003-01-08 浜松ホトニクス株式会社 減衰特性測定装置
US5863460A (en) * 1996-04-01 1999-01-26 Chiron Diagnostics Corporation Oxygen sensing membranes and methods of making same
US6306347B1 (en) 1998-01-21 2001-10-23 Bayer Corporation Optical sensor and method of operation
US6254831B1 (en) 1998-01-21 2001-07-03 Bayer Corporation Optical sensors with reflective materials
US6190612B1 (en) 1998-01-21 2001-02-20 Bayer Corporation Oxygen sensing membranes and methods of making same
US6107083A (en) * 1998-08-21 2000-08-22 Bayer Corporation Optical oxidative enzyme-based sensors
US6157037A (en) * 1998-12-04 2000-12-05 Photosense, Llc Sensing device and method for measuring emission time delay during irradiation of targeted samples
US20030010931A1 (en) * 2001-07-16 2003-01-16 Pittaro Richard J. Methods for analyzing arrays
US6912050B2 (en) 2003-02-03 2005-06-28 Hach Company Phase shift measurement for luminescent light
WO2005033746A2 (en) * 2003-09-29 2005-04-14 Photosense L.L.C. Frequency domain luminescence instrumentation
AU2006315664B2 (en) * 2005-11-10 2012-03-08 Tautheta Instruments Llc Apparatus and method for system identification
US7781221B2 (en) * 2006-08-18 2010-08-24 Ric Investments, Llc System and method of compensating for system delay in analyte analyzation
JP2009250807A (ja) * 2008-04-07 2009-10-29 Seiko Epson Corp 周波数測定装置及び測定方法
CN102150035A (zh) * 2008-09-19 2011-08-10 三井造船株式会社 采用强度调制激光的荧光检测装置和荧光检测方法
JP4564566B2 (ja) 2009-02-13 2010-10-20 三井造船株式会社 蛍光検出装置及び蛍光検出方法
JP4564567B2 (ja) 2009-02-13 2010-10-20 三井造船株式会社 蛍光検出装置及び蛍光検出方法
JP2010271091A (ja) 2009-05-20 2010-12-02 Seiko Epson Corp 周波数測定装置
JP5440999B2 (ja) 2009-05-22 2014-03-12 セイコーエプソン株式会社 周波数測定装置
JP5517033B2 (ja) 2009-05-22 2014-06-11 セイコーエプソン株式会社 周波数測定装置
JP5582447B2 (ja) 2009-08-27 2014-09-03 セイコーエプソン株式会社 電気回路、同電気回路を備えたセンサーシステム、及び同電気回路を備えたセンサーデバイス
JP5815918B2 (ja) 2009-10-06 2015-11-17 セイコーエプソン株式会社 周波数測定方法、周波数測定装置及び周波数測定装置を備えた装置
JP5876975B2 (ja) 2009-10-08 2016-03-02 セイコーエプソン株式会社 周波数測定装置及び周波数測定装置における変速分周信号の生成方法
JP5358426B2 (ja) * 2009-12-24 2013-12-04 株式会社堀場製作所 精製油劣化度測定装置及び精製油劣化度測定方法
JP5883558B2 (ja) 2010-08-31 2016-03-15 セイコーエプソン株式会社 周波数測定装置及び電子機器

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3939405A (en) * 1974-08-19 1976-02-17 Deere & Company Apparatus and method for making decay rate measurements
US4109283A (en) * 1976-05-21 1978-08-22 Rca Corporation Frequency counter for a television tuning system
JPS53127709A (en) * 1977-04-13 1978-11-08 Morita Mfg Driving system for transducer with resonance circuit
GB2089029B (en) * 1980-11-28 1984-03-21 Scintrex Ltd Method and apparatus for the remote detection of certain minerals of uranium zinc lead and other metals
JPS57175276A (en) * 1981-04-21 1982-10-28 Fujitsu Ltd Delayed time measuring circuit
US4670887A (en) * 1985-08-05 1987-06-02 Hayes Microcomputer Products, Inc. Multiplexed PSK demodulator

Also Published As

Publication number Publication date
EP0294938A3 (en) 1990-03-28
EP0294938A2 (en) 1988-12-14
EP0294938B1 (en) 1992-08-26
US4716363A (en) 1987-12-29
JP2645270B2 (ja) 1997-08-25
DE3874008T2 (de) 1993-04-08
DE3874008D1 (de) 1992-10-01
JPS63308596A (ja) 1988-12-15

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