HK35676A - Processing semiconductor layers - Google Patents

Processing semiconductor layers

Info

Publication number
HK35676A
HK35676A HK356/76*UA HK35676A HK35676A HK 35676 A HK35676 A HK 35676A HK 35676 A HK35676 A HK 35676A HK 35676 A HK35676 A HK 35676A
Authority
HK
Hong Kong
Prior art keywords
semiconductor layers
processing semiconductor
processing
layers
semiconductor
Prior art date
Application number
HK356/76*UA
Other languages
English (en)
Inventor
W Ch Erdman
Paul Miller
Original Assignee
Western Electric Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Western Electric Co filed Critical Western Electric Co
Publication of HK35676A publication Critical patent/HK35676A/xx

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/18Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
    • H01L21/30Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
    • H01L21/302Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting
    • H01L21/306Chemical or electrical treatment, e.g. electrolytic etching
    • H01L21/30604Chemical etching
    • H01L21/30608Anisotropic liquid etching
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00Details of semiconductor or other solid state devices
    • H01L23/28Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection
    • H01L23/29Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection characterised by the material, e.g. carbon
    • H01L23/293Organic, e.g. plastic
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/0001Technical content checked by a classifier
    • H01L2924/0002Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10STECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S148/00Metal treatment
    • Y10S148/051Etching
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10STECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S148/00Metal treatment
    • Y10S148/106Masks, special

Landscapes

  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Physics & Mathematics (AREA)
  • Power Engineering (AREA)
  • Manufacturing & Machinery (AREA)
  • Chemical & Material Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • General Chemical & Material Sciences (AREA)
  • Weting (AREA)
  • Drying Of Semiconductors (AREA)
HK356/76*UA 1971-05-28 1976-06-10 Processing semiconductor layers HK35676A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US14808171A 1971-05-28 1971-05-28

Publications (1)

Publication Number Publication Date
HK35676A true HK35676A (en) 1976-06-18

Family

ID=22524177

Family Applications (1)

Application Number Title Priority Date Filing Date
HK356/76*UA HK35676A (en) 1971-05-28 1976-06-10 Processing semiconductor layers

Country Status (12)

Country Link
US (1) US3718514A (xx)
JP (1) JPS51427B1 (xx)
BE (1) BE783938A (xx)
CA (1) CA921374A (xx)
CH (1) CH541230A (xx)
DE (1) DE2225366C3 (xx)
FR (1) FR2139975B1 (xx)
GB (1) GB1389941A (xx)
HK (1) HK35676A (xx)
IT (1) IT958953B (xx)
NL (1) NL7207145A (xx)
SE (1) SE379213B (xx)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2431647C3 (de) * 1974-07-02 1982-04-22 Robert Bosch Gmbh, 7000 Stuttgart Verfahren zum Entfernen von Vorsprüngen an der Oberfläche einer epitaktischen Halbleiterschicht
US3990925A (en) * 1975-03-31 1976-11-09 Bell Telephone Laboratories, Incorporated Removal of projections on epitaxial layers
US4238275A (en) * 1978-12-29 1980-12-09 International Business Machines Corporation Pyrocatechol-amine-water solution for the determination of defects
JPS5612723A (en) * 1979-07-11 1981-02-07 Fujitsu Ltd Manufacture of semiconductor device
US4515652A (en) * 1984-03-20 1985-05-07 Harris Corporation Plasma sculpturing with a non-planar sacrificial layer
FR2578107A1 (fr) * 1985-02-26 1986-08-29 Socem Dispositif de connexion et de support, notamment pour le raccordement de lignes electriques
US4789646A (en) * 1987-07-20 1988-12-06 North American Philips Corporation, Signetics Division Company Method for selective surface treatment of semiconductor structures
US5387316A (en) * 1992-12-09 1995-02-07 Motorola, Inc. Wafer etch protection method

Also Published As

Publication number Publication date
FR2139975A1 (xx) 1973-01-12
DE2225366B2 (de) 1973-11-22
US3718514A (en) 1973-02-27
GB1389941A (en) 1975-04-09
CH541230A (de) 1973-08-31
DE2225366A1 (de) 1972-12-14
CA921374A (en) 1973-02-20
JPS51427B1 (xx) 1976-01-08
FR2139975B1 (xx) 1977-04-01
BE783938A (fr) 1972-09-18
SE379213B (xx) 1975-09-29
DE2225366C3 (de) 1974-06-27
NL7207145A (xx) 1972-11-30
IT958953B (it) 1973-10-30

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