HK1222911A1 - 用於分光光度數據的統計測量控制的系統和方法 - Google Patents

用於分光光度數據的統計測量控制的系統和方法

Info

Publication number
HK1222911A1
HK1222911A1 HK16111145.3A HK16111145A HK1222911A1 HK 1222911 A1 HK1222911 A1 HK 1222911A1 HK 16111145 A HK16111145 A HK 16111145A HK 1222911 A1 HK1222911 A1 HK 1222911A1
Authority
HK
Hong Kong
Prior art keywords
systems
methods
measurement control
statistical measurement
spectrophotometric data
Prior art date
Application number
HK16111145.3A
Other languages
English (en)
Inventor
．諾裡斯
Original Assignee
Ppg Ind Ohio Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ppg Ind Ohio Inc filed Critical Ppg Ind Ohio Inc
Publication of HK1222911A1 publication Critical patent/HK1222911A1/zh

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/55—Specular reflectivity
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/46—Measurement of colour; Colour measuring devices, e.g. colorimeters
    • G01J3/50—Measurement of colour; Colour measuring devices, e.g. colorimeters using electric radiation detectors
    • G01J3/504—Goniometric colour measurements, for example measurements of metallic or flake based paints
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/46—Measurement of colour; Colour measuring devices, e.g. colorimeters
    • G01J3/462—Computing operations in or between colour spaces; Colour management systems
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/255—Details, e.g. use of specially adapted sources, lighting or optical systems
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/8422—Investigating thin films, e.g. matrix isolation method
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G01N2021/8854—Grading and classifying of flaws
    • G01N2021/8877—Proximity analysis, local statistics
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/12—Circuits of general importance; Signal processing
    • G01N2201/124—Sensitivity
    • G01N2201/1245—Averaging several measurements
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/12—Circuits of general importance; Signal processing
    • G01N2201/124—Sensitivity
    • G01N2201/1248—Validating from signal shape, slope, peak

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Pathology (AREA)
  • Health & Medical Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Engineering & Computer Science (AREA)
  • Mathematical Physics (AREA)
  • Theoretical Computer Science (AREA)
  • Signal Processing (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Spectrometry And Color Measurement (AREA)
  • Data Mining & Analysis (AREA)
  • Databases & Information Systems (AREA)
  • Software Systems (AREA)
  • General Engineering & Computer Science (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
HK16111145.3A 2013-01-09 2016-09-22 用於分光光度數據的統計測量控制的系統和方法 HK1222911A1 (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US13/737,179 US9606055B2 (en) 2013-01-09 2013-01-09 Systems and methods for statistical measurement control of spectrophotometric data
PCT/US2014/010608 WO2014110087A1 (en) 2013-01-09 2014-01-08 Systems and methods for statistical measurement control of spectrophotometric data

Publications (1)

Publication Number Publication Date
HK1222911A1 true HK1222911A1 (zh) 2017-07-14

Family

ID=50064757

Family Applications (1)

Application Number Title Priority Date Filing Date
HK16111145.3A HK1222911A1 (zh) 2013-01-09 2016-09-22 用於分光光度數據的統計測量控制的系統和方法

Country Status (15)

Country Link
US (1) US9606055B2 (zh)
EP (1) EP2943779B1 (zh)
JP (1) JP6139702B2 (zh)
KR (1) KR101697036B1 (zh)
CN (1) CN105899940B (zh)
AR (1) AR094408A1 (zh)
AU (1) AU2014205550B2 (zh)
BR (1) BR112015016320A2 (zh)
CA (1) CA2897061C (zh)
HK (1) HK1222911A1 (zh)
MX (1) MX352821B (zh)
NZ (1) NZ631140A (zh)
SG (1) SG11201505208PA (zh)
TW (1) TWI555976B (zh)
WO (1) WO2014110087A1 (zh)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP3631418A4 (en) * 2017-05-24 2021-03-10 Swimc Llc COLOR THICKNESS MEASUREMENT OF A MULTI-ANGLE COATING COMPOSITION
CN109682780A (zh) * 2018-12-11 2019-04-26 中昊黑元化工研究设计院有限公司 一种利用平板研磨机和反射仪测定炭黑色浆黑度的方法
US20220329767A1 (en) * 2019-10-01 2022-10-13 University Of Washington System and method for analyzing surface features using a low-dimensional color space camera

Family Cites Families (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO1997006418A1 (en) * 1995-08-07 1997-02-20 Boehringer Mannheim Corporation Biological fluid analysis using distance outlier detection
US5606164A (en) 1996-01-16 1997-02-25 Boehringer Mannheim Corporation Method and apparatus for biological fluid analyte concentration measurement using generalized distance outlier detection
AU4345500A (en) 1999-04-15 2000-11-02 David L. Spooner Method and apparatus for determining the reflectance of translucent objects
DE10163596C1 (de) * 2001-12-21 2003-09-18 Rehau Ag & Co Verfahren zur mobilen On- und Offlinekontrolle farbiger und hochglänzender Automobilteiloberflächen
MXPA05011834A (es) * 2003-05-07 2006-01-26 Du Pont Metodo de produccion de composicion de revestimiento igualada y dispositivo usado para el mismo.
JP2006078285A (ja) * 2004-09-08 2006-03-23 Omron Corp 基板検査装置並びにそのパラメータ設定方法およびパラメータ設定装置
US8345252B2 (en) * 2005-04-25 2013-01-01 X-Rite, Inc. Method and system for enhanced formulation and visualization rendering
JP4846787B2 (ja) * 2005-04-25 2011-12-28 エックス−ライト、インコーポレイテッド 空間的にアンダーサンプリングされた双方向反射率分布関数を用いた表面の外観特性の測定
JP4856469B2 (ja) * 2006-05-18 2012-01-18 興和株式会社 眼科測定装置
WO2009065956A2 (de) 2007-11-23 2009-05-28 Volkswagen Ag Verfahren und vorrichtung zur qualitätskontrolle einer oberfläche
DE102008009302A1 (de) 2008-01-08 2009-07-16 Eastman Kodak Co. Verfahren zur Erkennung von Ausreissern in einer Reihe von Messwerten
US9069725B2 (en) * 2011-08-19 2015-06-30 Hartford Steam Boiler Inspection & Insurance Company Dynamic outlier bias reduction system and method
US8879066B2 (en) * 2012-10-26 2014-11-04 Ppg Industries Ohio, Inc. Texture analysis of a painted surface using specular angle data
US9816862B2 (en) * 2013-03-14 2017-11-14 Ppg Industries Ohio, Inc. Systems and methods for texture analysis of a coated surface using multi-dimensional geometries
US9830429B2 (en) * 2013-03-14 2017-11-28 Ppg Industries Ohio, Inc. Systems and methods for multi-flux color matching
NZ631047A (en) * 2013-11-08 2015-10-30 Ppg Ind Ohio Inc Texture analysis of a coated surface using kepler’s planetary motion laws
NZ631063A (en) * 2013-11-08 2015-10-30 Ppg Ind Ohio Inc Texture analysis of a coated surface using cross-normalization

Also Published As

Publication number Publication date
TW201439522A (zh) 2014-10-16
CN105899940B (zh) 2018-09-28
TWI555976B (zh) 2016-11-01
JP6139702B2 (ja) 2017-05-31
NZ631140A (en) 2016-05-27
SG11201505208PA (en) 2015-07-30
AU2014205550A1 (en) 2015-07-23
KR20150092308A (ko) 2015-08-12
MX2015008787A (es) 2015-11-13
KR101697036B1 (ko) 2017-01-16
US9606055B2 (en) 2017-03-28
WO2014110087A1 (en) 2014-07-17
AR094408A1 (es) 2015-07-29
JP2016503896A (ja) 2016-02-08
CA2897061C (en) 2017-08-29
CN105899940A (zh) 2016-08-24
EP2943779A1 (en) 2015-11-18
EP2943779B1 (en) 2023-01-04
BR112015016320A2 (pt) 2017-07-11
AU2014205550B2 (en) 2016-08-11
MX352821B (es) 2017-12-01
US20140195189A1 (en) 2014-07-10
CA2897061A1 (en) 2014-07-17

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