AR094408A1 - Sistemas y métodos para control estadístico de medición de datos espectofotométricos - Google Patents

Sistemas y métodos para control estadístico de medición de datos espectofotométricos

Info

Publication number
AR094408A1
AR094408A1 ARP140100087A ARP140100087A AR094408A1 AR 094408 A1 AR094408 A1 AR 094408A1 AR P140100087 A ARP140100087 A AR P140100087A AR P140100087 A ARP140100087 A AR P140100087A AR 094408 A1 AR094408 A1 AR 094408A1
Authority
AR
Argentina
Prior art keywords
specto
systems
methods
data measurement
processor
Prior art date
Application number
ARP140100087A
Other languages
English (en)
Inventor
M Norris Alison
Original Assignee
Ppg Ind Ohio Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ppg Ind Ohio Inc filed Critical Ppg Ind Ohio Inc
Publication of AR094408A1 publication Critical patent/AR094408A1/es

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/46—Measurement of colour; Colour measuring devices, e.g. colorimeters
    • G01J3/50—Measurement of colour; Colour measuring devices, e.g. colorimeters using electric radiation detectors
    • G01J3/504—Goniometric colour measurements, for example measurements of metallic or flake based paints
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/55—Specular reflectivity
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/46—Measurement of colour; Colour measuring devices, e.g. colorimeters
    • G01J3/462—Computing operations in or between colour spaces; Colour management systems
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/255—Details, e.g. use of specially adapted sources, lighting or optical systems
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/8422—Investigating thin films, e.g. matrix isolation method
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G01N2021/8854—Grading and classifying of flaws
    • G01N2021/8877—Proximity analysis, local statistics
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/12—Circuits of general importance; Signal processing
    • G01N2201/124—Sensitivity
    • G01N2201/1245—Averaging several measurements
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/12—Circuits of general importance; Signal processing
    • G01N2201/124—Sensitivity
    • G01N2201/1248—Validating from signal shape, slope, peak

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Analytical Chemistry (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Pathology (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Engineering & Computer Science (AREA)
  • Mathematical Physics (AREA)
  • Theoretical Computer Science (AREA)
  • Signal Processing (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Spectrometry And Color Measurement (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Data Mining & Analysis (AREA)
  • Databases & Information Systems (AREA)
  • Software Systems (AREA)
  • General Engineering & Computer Science (AREA)

Abstract

Un método implementado por computadora, que incluye obtener, usando un procesador, datos de reflectancia espectral desde una superficie recubierta que tiene sobre ella un recubrimiento a ser estudiado; y determinar, usando el procesador, silos datos incluyen puntos de datos anómalos. El método también incluye remover, usando el procesador, al menos uno de los puntos de datos anómalos para producir datos finales de reflectancia espectral; y calcular, usando el procesador, una característica del recubrimiento a ser estudiado basado al menos en parte, en los datos finales de reflectancia espectral.
ARP140100087A 2013-01-09 2014-01-09 Sistemas y métodos para control estadístico de medición de datos espectofotométricos AR094408A1 (es)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US13/737,179 US9606055B2 (en) 2013-01-09 2013-01-09 Systems and methods for statistical measurement control of spectrophotometric data

Publications (1)

Publication Number Publication Date
AR094408A1 true AR094408A1 (es) 2015-07-29

Family

ID=50064757

Family Applications (1)

Application Number Title Priority Date Filing Date
ARP140100087A AR094408A1 (es) 2013-01-09 2014-01-09 Sistemas y métodos para control estadístico de medición de datos espectofotométricos

Country Status (15)

Country Link
US (1) US9606055B2 (es)
EP (1) EP2943779B1 (es)
JP (1) JP6139702B2 (es)
KR (1) KR101697036B1 (es)
CN (1) CN105899940B (es)
AR (1) AR094408A1 (es)
AU (1) AU2014205550B2 (es)
BR (1) BR112015016320A2 (es)
CA (1) CA2897061C (es)
HK (1) HK1222911A1 (es)
MX (1) MX352821B (es)
NZ (1) NZ631140A (es)
SG (1) SG11201505208PA (es)
TW (1) TWI555976B (es)
WO (1) WO2014110087A1 (es)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2018217867A1 (en) * 2017-05-24 2018-11-29 Swimc Llc Multi-angle coating composition color strength measurement
CN109682780A (zh) * 2018-12-11 2019-04-26 中昊黑元化工研究设计院有限公司 一种利用平板研磨机和反射仪测定炭黑色浆黑度的方法
US20220329767A1 (en) * 2019-10-01 2022-10-13 University Of Washington System and method for analyzing surface features using a low-dimensional color space camera

Family Cites Families (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
AU711324B2 (en) * 1995-08-07 1999-10-14 Roche Diagnostics Operations Inc. Biological fluid analysis using distance outlier detection
US5606164A (en) 1996-01-16 1997-02-25 Boehringer Mannheim Corporation Method and apparatus for biological fluid analyte concentration measurement using generalized distance outlier detection
AU4345500A (en) 1999-04-15 2000-11-02 David L. Spooner Method and apparatus for determining the reflectance of translucent objects
DE10163596C1 (de) 2001-12-21 2003-09-18 Rehau Ag & Co Verfahren zur mobilen On- und Offlinekontrolle farbiger und hochglänzender Automobilteiloberflächen
AU2004239287C1 (en) * 2003-05-07 2009-12-17 Coatings Foreign Ip Co. Llc Method of producing matched coating composition and device used therefor
JP2006078285A (ja) * 2004-09-08 2006-03-23 Omron Corp 基板検査装置並びにそのパラメータ設定方法およびパラメータ設定装置
JP4846787B2 (ja) * 2005-04-25 2011-12-28 エックス−ライト、インコーポレイテッド 空間的にアンダーサンプリングされた双方向反射率分布関数を用いた表面の外観特性の測定
US8345252B2 (en) * 2005-04-25 2013-01-01 X-Rite, Inc. Method and system for enhanced formulation and visualization rendering
JP4856469B2 (ja) 2006-05-18 2012-01-18 興和株式会社 眼科測定装置
WO2009065956A2 (de) 2007-11-23 2009-05-28 Volkswagen Ag Verfahren und vorrichtung zur qualitätskontrolle einer oberfläche
DE102008009302A1 (de) 2008-01-08 2009-07-16 Eastman Kodak Co. Verfahren zur Erkennung von Ausreissern in einer Reihe von Messwerten
US9069725B2 (en) * 2011-08-19 2015-06-30 Hartford Steam Boiler Inspection & Insurance Company Dynamic outlier bias reduction system and method
US8879066B2 (en) * 2012-10-26 2014-11-04 Ppg Industries Ohio, Inc. Texture analysis of a painted surface using specular angle data
US9816862B2 (en) * 2013-03-14 2017-11-14 Ppg Industries Ohio, Inc. Systems and methods for texture analysis of a coated surface using multi-dimensional geometries
US9830429B2 (en) * 2013-03-14 2017-11-28 Ppg Industries Ohio, Inc. Systems and methods for multi-flux color matching
NZ631063A (en) * 2013-11-08 2015-10-30 Ppg Ind Ohio Inc Texture analysis of a coated surface using cross-normalization
NZ631047A (en) * 2013-11-08 2015-10-30 Ppg Ind Ohio Inc Texture analysis of a coated surface using kepler’s planetary motion laws

Also Published As

Publication number Publication date
JP6139702B2 (ja) 2017-05-31
WO2014110087A1 (en) 2014-07-17
US9606055B2 (en) 2017-03-28
TW201439522A (zh) 2014-10-16
KR20150092308A (ko) 2015-08-12
BR112015016320A2 (pt) 2017-07-11
EP2943779B1 (en) 2023-01-04
JP2016503896A (ja) 2016-02-08
KR101697036B1 (ko) 2017-01-16
SG11201505208PA (en) 2015-07-30
HK1222911A1 (zh) 2017-07-14
MX2015008787A (es) 2015-11-13
AU2014205550B2 (en) 2016-08-11
CN105899940A (zh) 2016-08-24
AU2014205550A1 (en) 2015-07-23
CN105899940B (zh) 2018-09-28
CA2897061C (en) 2017-08-29
MX352821B (es) 2017-12-01
NZ631140A (en) 2016-05-27
TWI555976B (zh) 2016-11-01
EP2943779A1 (en) 2015-11-18
US20140195189A1 (en) 2014-07-10
CA2897061A1 (en) 2014-07-17

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