HK1204678A1 - 使用量子點檢測氣體阻擋膜中的缺陷的方法 - Google Patents

使用量子點檢測氣體阻擋膜中的缺陷的方法

Info

Publication number
HK1204678A1
HK1204678A1 HK15105132.1A HK15105132A HK1204678A1 HK 1204678 A1 HK1204678 A1 HK 1204678A1 HK 15105132 A HK15105132 A HK 15105132A HK 1204678 A1 HK1204678 A1 HK 1204678A1
Authority
HK
Hong Kong
Prior art keywords
defects
detection
gas
quantum dots
barrier films
Prior art date
Application number
HK15105132.1A
Other languages
English (en)
Inventor
Nigel Pickett
Nathalie Gresty
Original Assignee
Nanoco Technologies Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nanoco Technologies Ltd filed Critical Nanoco Technologies Ltd
Publication of HK1204678A1 publication Critical patent/HK1204678A1/zh

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/64—Fluorescence; Phosphorescence
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/59—Transmissivity
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/64—Fluorescence; Phosphorescence
    • G01N21/6489—Photoluminescence of semiconductors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/91—Investigating the presence of flaws or contamination using penetration of dyes, e.g. fluorescent ink
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
    • G01N15/08—Investigating permeability, pore-volume, or surface area of porous materials
    • G01N2015/0813—Measuring intrusion, e.g. of mercury
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/8422—Investigating thin films, e.g. matrix isolation method
    • G01N2021/8427—Coatings

Landscapes

  • Health & Medical Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
  • Luminescent Compositions (AREA)
  • Laminated Bodies (AREA)
HK15105132.1A 2012-05-04 2015-05-29 使用量子點檢測氣體阻擋膜中的缺陷的方法 HK1204678A1 (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US201261642934P 2012-05-04 2012-05-04
PCT/IB2013/001251 WO2013164697A1 (en) 2012-05-04 2013-05-03 Method for he detection of defects in gas-barrier films using quantum dots

Publications (1)

Publication Number Publication Date
HK1204678A1 true HK1204678A1 (zh) 2015-11-27

Family

ID=48790494

Family Applications (1)

Application Number Title Priority Date Filing Date
HK15105132.1A HK1204678A1 (zh) 2012-05-04 2015-05-29 使用量子點檢測氣體阻擋膜中的缺陷的方法

Country Status (7)

Country Link
US (1) US8908164B2 (zh)
EP (1) EP2844985B1 (zh)
JP (1) JP5805349B2 (zh)
KR (1) KR101497631B1 (zh)
CN (1) CN104272092B (zh)
HK (1) HK1204678A1 (zh)
WO (1) WO2013164697A1 (zh)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9574135B2 (en) * 2013-08-22 2017-02-21 Nanoco Technologies Ltd. Gas phase enhancement of emission color quality in solid state LEDs
FR3046844B1 (fr) * 2016-01-18 2019-07-26 Safran Procede de controle de la porosite de surface de pieces
CN105954291B (zh) * 2016-04-29 2019-04-23 重庆大学 一种基于量子点的膨胀式裂纹测试装置
WO2018042947A1 (ja) * 2016-08-31 2018-03-08 国立大学法人名古屋大学 ホスホール化合物
WO2019051048A1 (en) * 2017-09-06 2019-03-14 Vanderbilt University SYSTEM AND METHOD FOR DETECTING DEFECTS IN THREE-DIMENSIONAL PRINTED PARTS
KR102050363B1 (ko) * 2018-01-02 2019-12-02 홍익대학교 산학협력단 구조물 균열 검사 방법
CN109211930A (zh) * 2018-08-31 2019-01-15 胜科纳米（苏州）有限公司 电子显示屏封装材料的缺陷检测方法
CN109211929A (zh) * 2018-08-31 2019-01-15 胜科纳米（苏州）有限公司 电子电器封装缺陷的检测方法
CN115452837A (zh) * 2022-09-16 2022-12-09 湘南学院 一种基于钙钛矿量子点的热障涂层无损检测方法

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH1048156A (ja) * 1996-08-02 1998-02-20 Sony Corp クラックの検出方法
US6794265B2 (en) * 2001-08-02 2004-09-21 Ultradots, Inc. Methods of forming quantum dots of Group IV semiconductor materials
US7925452B2 (en) 2007-06-15 2011-04-12 The Boeing Company Method and apparatus for nondestructive corrosion detection using quantum dots
EP2554975A1 (en) * 2007-12-17 2013-02-06 Life Technologies Corporation Method and substrate for detecting defects in inorganic-coated polymer surfaces
GB0813490D0 (en) * 2008-07-23 2008-08-27 Element Six Ltd Solid state material
US7777176B2 (en) * 2008-08-14 2010-08-17 Energy Materials Corporation Composition and method to characterize membranes' defects
KR101038750B1 (ko) * 2009-05-20 2011-06-03 한국에너지기술연구원 탄소나노튜브의 내부 채널에 금속촉매 나노입자가 담지된 탄소나노튜브 촉매 및 이의 제조방법
US8834846B2 (en) * 2010-05-06 2014-09-16 Bruker Biospin Corporation Fluorescent NIRF activatable probes for disease detection
US9412905B2 (en) * 2011-04-01 2016-08-09 Najing Technology Corporation Limited White light emitting device
US8482104B2 (en) * 2012-01-09 2013-07-09 Soraa, Inc. Method for growth of indium-containing nitride films

Also Published As

Publication number Publication date
US8908164B2 (en) 2014-12-09
EP2844985B1 (en) 2016-03-23
US20130314698A1 (en) 2013-11-28
JP5805349B2 (ja) 2015-11-04
CN104272092A (zh) 2015-01-07
JP2015516068A (ja) 2015-06-04
EP2844985A1 (en) 2015-03-11
CN104272092B (zh) 2016-06-29
WO2013164697A1 (en) 2013-11-07
KR101497631B1 (ko) 2015-03-03
KR20140139141A (ko) 2014-12-04

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Legal Events

Date Code Title Description
PC Patent ceased (i.e. patent has lapsed due to the failure to pay the renewal fee)

Effective date: 20210430