HK1204138A1 - Ray filtering device and dual-energy -ray inspection system - Google Patents

Ray filtering device and dual-energy -ray inspection system

Info

Publication number
HK1204138A1
HK1204138A1 HK15104612.3A HK15104612A HK1204138A1 HK 1204138 A1 HK1204138 A1 HK 1204138A1 HK 15104612 A HK15104612 A HK 15104612A HK 1204138 A1 HK1204138 A1 HK 1204138A1
Authority
HK
Hong Kong
Prior art keywords
ray
dual
energy
filtering device
inspection system
Prior art date
Application number
HK15104612.3A
Other languages
English (en)
Chinese (zh)
Inventor
康克軍陳玉梅劉耀紅閻忻水印煒管偉强
Original Assignee
Nuctech Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nuctech Co Ltd filed Critical Nuctech Co Ltd
Publication of HK1204138A1 publication Critical patent/HK1204138A1/xx

Links

Classifications

    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K1/00—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating
    • G21K1/10—Scattering devices; Absorbing devices; Ionising radiation filters
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material

Landscapes

  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Apparatus For Radiation Diagnosis (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
HK15104612.3A 2014-12-30 2015-05-15 Ray filtering device and dual-energy -ray inspection system HK1204138A1 (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201410838393.3A CN104464871B (zh) 2014-12-30 2014-12-30 射线过滤装置和双能x射线检查系统

Publications (1)

Publication Number Publication Date
HK1204138A1 true HK1204138A1 (en) 2015-11-06

Family

ID=52910797

Family Applications (1)

Application Number Title Priority Date Filing Date
HK15104612.3A HK1204138A1 (en) 2014-12-30 2015-05-15 Ray filtering device and dual-energy -ray inspection system

Country Status (3)

Country Link
EP (1) EP3041002B1 (de)
CN (1) CN104464871B (de)
HK (1) HK1204138A1 (de)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN104934092B (zh) * 2015-07-03 2017-08-01 中国计量科学研究院 滤波装置
CN105181723B (zh) 2015-09-28 2019-02-12 同方威视技术股份有限公司 双能射线扫描系统、扫描方法以及检查系统
CN105403580B (zh) 2015-12-28 2018-10-09 清华大学 准直器和检查系统
US10682103B2 (en) 2017-04-27 2020-06-16 Medtronic Navigation, Inc. Filter system and method for imaging a subject

Family Cites Families (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4277685A (en) * 1978-06-12 1981-07-07 Ohio-Nuclear, Inc. Adjustable collimator
US4592083A (en) * 1984-03-27 1986-05-27 Tokyo Shibaura Denki Kabushiki Kaisha High speed x-ray shutter
FR2621764A1 (fr) * 1987-10-13 1989-04-14 Philips Massiot Mat Medic Appareil de radiologie muni d'un ecran a fentes deplacable en synchronisation video
US5319547A (en) * 1990-08-10 1994-06-07 Vivid Technologies, Inc. Device and method for inspection of baggage and other objects
FR2788599B1 (fr) * 1999-01-20 2001-12-21 Heimann Systems Systeme de discrimination de matieres organiques et inorganiques
US6459761B1 (en) * 2000-02-10 2002-10-01 American Science And Engineering, Inc. Spectrally shaped x-ray inspection system
CN1274563C (zh) * 2003-08-23 2006-09-13 上海世鹏实验室科技发展有限公司 一种集装箱扫描探测装置
CN2901301Y (zh) * 2005-07-15 2007-05-16 北京中盾安民分析技术有限公司 便携式双能量x射线检查装置
US7330535B2 (en) * 2005-11-10 2008-02-12 General Electric Company X-ray flux management device
US8059787B2 (en) * 2007-01-26 2011-11-15 Koninklijke Philips Electronics N.V. Spectrum-preserving heel effect compensation filter made from the same material as anode plate
CN101403711B (zh) 2007-10-05 2013-06-19 清华大学 液态物品检查方法和设备
CN101435783B (zh) 2007-11-15 2011-01-26 同方威视技术股份有限公司 物质识别方法和设备
CN102455305B (zh) * 2010-11-01 2014-06-18 北京中盾安民分析技术有限公司 双能量x射线人体藏物检查设备中所使用的图像处理方法
JP5081314B1 (ja) * 2011-05-23 2012-11-28 日立アロカメディカル株式会社 Ｘ線発生装置
DE102012207626A1 (de) * 2012-05-08 2013-11-14 Siemens Aktiengesellschaft Röntgengerät und Verfahren zum Betrieb eines Röntgengerätes
CN203204174U (zh) * 2013-04-27 2013-09-18 北京曼德克环境科技有限公司 一种x射线双能量透射式绿色通道车辆检测仪
CN203705662U (zh) * 2013-12-26 2014-07-09 同方威视技术股份有限公司 一种用于集装箱的检查系统
CN204315245U (zh) * 2014-12-30 2015-05-06 同方威视技术股份有限公司 射线过滤装置和双能x射线检查系统

Also Published As

Publication number Publication date
CN104464871B (zh) 2017-11-21
EP3041002B1 (de) 2023-03-01
EP3041002A1 (de) 2016-07-06
CN104464871A (zh) 2015-03-25

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