HK1187410A1 - Integrated circuit with programmable logic analyzer, enhanced analyzing and debugging capabilities and method - Google Patents

Integrated circuit with programmable logic analyzer, enhanced analyzing and debugging capabilities and method

Info

Publication number
HK1187410A1
HK1187410A1 HK14100362.4A HK14100362A HK1187410A1 HK 1187410 A1 HK1187410 A1 HK 1187410A1 HK 14100362 A HK14100362 A HK 14100362A HK 1187410 A1 HK1187410 A1 HK 1187410A1
Authority
HK
Hong Kong
Prior art keywords
integrated circuit
programmable logic
logic analyzer
debugging capabilities
enhanced analyzing
Prior art date
Application number
HK14100362.4A
Other languages
English (en)
Chinese (zh)
Inventor
James Ray Bailey
Christopher Wilson Case
James Patrick Sharpe
Original Assignee
Lexmark Int Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Lexmark Int Inc filed Critical Lexmark Int Inc
Publication of HK1187410A1 publication Critical patent/HK1187410A1/xx

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/25—Testing of logic operation, e.g. by logic analysers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3177—Testing of logic operation, e.g. by logic analysers
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/2294—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing by remote test

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Quality & Reliability (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
  • Logic Circuits (AREA)
  • Semiconductor Integrated Circuits (AREA)
  • Debugging And Monitoring (AREA)
HK14100362.4A 2010-09-08 2014-01-13 Integrated circuit with programmable logic analyzer, enhanced analyzing and debugging capabilities and method HK1187410A1 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US12/877,846 US8516304B2 (en) 2009-08-18 2010-09-08 Integrated circuit including a programmable logic analyzer with enhanced analyzing and debugging capabilities and a method therefor
PCT/US2011/050761 WO2012033876A1 (en) 2010-09-08 2011-09-08 Integrated circuit with programmable logic analyzer, enhanced analyzing and debugging capabilities and method

Publications (1)

Publication Number Publication Date
HK1187410A1 true HK1187410A1 (en) 2014-04-04

Family

ID=45810964

Family Applications (1)

Application Number Title Priority Date Filing Date
HK14100362.4A HK1187410A1 (en) 2010-09-08 2014-01-13 Integrated circuit with programmable logic analyzer, enhanced analyzing and debugging capabilities and method

Country Status (11)

Country Link
US (1) US8516304B2 (xx)
EP (1) EP2614380B1 (xx)
KR (1) KR101759215B1 (xx)
CN (1) CN103069289B (xx)
AU (1) AU2011299176B2 (xx)
BR (1) BR112013004234B1 (xx)
CA (1) CA2807323C (xx)
HK (1) HK1187410A1 (xx)
RU (1) RU2579814C2 (xx)
SG (1) SG187854A1 (xx)
WO (1) WO2012033876A1 (xx)

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US8914681B2 (en) * 2009-08-18 2014-12-16 Lexmark International, Inc. Integrated circuit including a programmable logic analyzer with enhanced analyzing and debugging capabilities and a method therefor
US8745447B2 (en) * 2009-08-18 2014-06-03 Lexmark International, Inc. System and method for analyzing an electronics device including a logic analyzer
CN103294602B (zh) * 2012-02-28 2016-04-13 孕龙科技股份有限公司 逻辑分析仪的数据读取及写入其存储器的方法
US10235339B2 (en) 2013-02-19 2019-03-19 Keysight Technologies, Inc. Digital measurement instrument triggered by signal pattern
US20140269345A1 (en) * 2013-03-16 2014-09-18 Connectem Inc. Method and system for network troubleshooting and improving kpi of mobile data network
US9716996B2 (en) 2013-05-21 2017-07-25 Brocade Communications Systems, Inc. Method and system for selective and secure interaction of BYOD (bring your own device) with enterprise network through mobile wireless networks
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US9405651B1 (en) 2013-10-03 2016-08-02 Initial State Technologies, Inc. Apparatus and method for processing log file data
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US9405610B1 (en) 2013-10-03 2016-08-02 Initial State Technologies, Inc. Apparatus and method for processing log file data
US9203408B1 (en) * 2014-04-04 2015-12-01 Altera Corporation Reconfigurable logic analyzer circuitry
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KR102391385B1 (ko) * 2015-08-13 2022-04-27 삼성전자주식회사 내장형 로직 분석기 및 이를 포함하는 집적 회로
US10037259B2 (en) * 2016-04-26 2018-07-31 International Business Machines Corporation Adaptive debug tracing for microprocessors
RU2633908C1 (ru) * 2016-06-21 2017-10-19 Федеральное государственное бюджетное учреждение науки Институт проблем управления им. В.А. Трапезникова Российской академии наук Устройство анализа результатов тестирования для локализации двукратных неисправностей
US10482205B2 (en) * 2017-07-24 2019-11-19 Xilinx, Inc. Logic analyzer for integrated circuits
BR112021015327A2 (pt) 2019-02-06 2021-10-05 Hewlett-Packard Development Company, L.P. Componente de impressão com circuito de memória
NZ779667A (en) 2019-02-06 2023-06-30 Hewlett Packard Development Co Communicating print component
US11511539B2 (en) 2019-02-06 2022-11-29 Hewlett-Packard Development Company, L.P. Memories of fluidic dies
US11787173B2 (en) 2019-02-06 2023-10-17 Hewlett-Packard Development Company, L.P. Print component with memory circuit
KR102621224B1 (ko) 2019-02-06 2024-01-04 휴렛-팩커드 디벨롭먼트 컴퍼니, 엘.피. 인터페이스에 결합된 다중 회로
TWI726405B (zh) 2019-09-04 2021-05-01 神雲科技股份有限公司 開機程序除錯系統及其主機與方法
CN112579178B (zh) * 2019-09-29 2022-04-05 佛山市顺德区顺达电脑厂有限公司 开机程序除错系统及其主机与方法
US11919310B2 (en) 2020-12-08 2024-03-05 Canon Solutions America, Inc. Devices, systems, and methods for printhead cleaning and diagnostics
CN116662212A (zh) * 2023-07-31 2023-08-29 上海芯炽科技集团有限公司 一种使用于asic的内置逻辑分析仪的方法

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US8914681B2 (en) 2009-08-18 2014-12-16 Lexmark International, Inc. Integrated circuit including a programmable logic analyzer with enhanced analyzing and debugging capabilities and a method therefor
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Also Published As

Publication number Publication date
US20110047427A1 (en) 2011-02-24
US8516304B2 (en) 2013-08-20
EP2614380B1 (en) 2015-08-19
CA2807323C (en) 2018-09-25
BR112013004234B1 (pt) 2020-05-26
BR112013004234A2 (pt) 2016-07-05
AU2011299176B2 (en) 2015-09-17
RU2579814C2 (ru) 2016-04-10
SG187854A1 (en) 2013-03-28
EP2614380A4 (en) 2014-02-26
CN103069289B (zh) 2016-01-20
KR101759215B1 (ko) 2017-07-31
CN103069289A (zh) 2013-04-24
WO2012033876A1 (en) 2012-03-15
KR20130100111A (ko) 2013-09-09
RU2013105340A (ru) 2014-10-20
EP2614380A1 (en) 2013-07-17
CA2807323A1 (en) 2012-03-15
AU2011299176A1 (en) 2013-02-21

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