HK1037405A1 - Photosensitive matrix electronic sensor. - Google Patents

Photosensitive matrix electronic sensor.

Info

Publication number
HK1037405A1
HK1037405A1 HK01107248A HK01107248A HK1037405A1 HK 1037405 A1 HK1037405 A1 HK 1037405A1 HK 01107248 A HK01107248 A HK 01107248A HK 01107248 A HK01107248 A HK 01107248A HK 1037405 A1 HK1037405 A1 HK 1037405A1
Authority
HK
Hong Kong
Prior art keywords
electronic sensor
matrix electronic
photosensitive matrix
photosensitive
sensor
Prior art date
Application number
HK01107248A
Other languages
English (en)
Inventor
Roger Laugier
Original Assignee
Thomson Csf
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Thomson Csf filed Critical Thomson Csf
Publication of HK1037405A1 publication Critical patent/HK1037405A1/xx

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/20—Measuring radiation intensity with scintillation detectors

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Molecular Biology (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Measurement Of Radiation (AREA)
  • Image-Pickup Tubes, Image-Amplification Tubes, And Storage Tubes (AREA)
HK01107248A 1998-01-27 2001-10-17 Photosensitive matrix electronic sensor. HK1037405A1 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
FR9800850A FR2774175B1 (fr) 1998-01-27 1998-01-27 Capteur electronique matriciel photosensible
PCT/FR1999/000149 WO1999038031A1 (fr) 1998-01-27 1999-01-26 Capteur electronique matriciel photosensible

Publications (1)

Publication Number Publication Date
HK1037405A1 true HK1037405A1 (en) 2002-02-08

Family

ID=9522209

Family Applications (1)

Application Number Title Priority Date Filing Date
HK01107248A HK1037405A1 (en) 1998-01-27 2001-10-17 Photosensitive matrix electronic sensor.

Country Status (8)

Country Link
US (1) US6429437B1 (ja)
EP (1) EP1051642B1 (ja)
JP (1) JP4353635B2 (ja)
CN (1) CN1155836C (ja)
DE (1) DE69927481T2 (ja)
FR (1) FR2774175B1 (ja)
HK (1) HK1037405A1 (ja)
WO (1) WO1999038031A1 (ja)

Families Citing this family (21)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CA2310017C (en) * 1998-06-18 2005-10-25 Hamamatsu Photonics K.K. Scintillator panel and radiation image sensor
US7034306B2 (en) 1998-06-18 2006-04-25 Hamamatsu Photonics K.K. Scintillator panel and radiation image sensor
EP1118880B1 (en) * 1998-06-18 2003-11-26 Hamamatsu Photonics K.K. Method of organic film deposition
AU4168499A (en) 1998-06-18 2000-01-05 Hamamatsu Photonics K.K. Scintillator panel, radiation image sensor, and method for manufacturing the same
AU4168199A (en) 1998-06-18 2000-01-05 Hamamatsu Photonics K.K. Scintillator panel, radiation image sensor, and method for producing the same
JP3789646B2 (ja) 1998-06-19 2006-06-28 浜松ホトニクス株式会社 放射線イメージセンサ
CN1161625C (zh) 1999-04-09 2004-08-11 浜松光子学株式会社 闪烁体面板和射线图象传感器
AU2001275802A1 (en) * 2000-07-31 2002-02-13 Hamamatsu Photonics K.K. Radiation sensor
JP4283427B2 (ja) 2000-08-03 2009-06-24 浜松ホトニクス株式会社 放射線検出器およびシンチレータパネル
US6847041B2 (en) * 2001-02-09 2005-01-25 Canon Kabushiki Kaisha Scintillator panel, radiation detector and manufacture methods thereof
JP4593806B2 (ja) * 2001-02-09 2010-12-08 キヤノン株式会社 放射線検出装置の製造方法、蛍光板の製造方法及び放射線検出装置の製造装置
DE102004060932B4 (de) * 2004-12-17 2009-06-10 Siemens Ag Verfahren zur Herstellung eines Strahlungsdetektors
US7696482B1 (en) * 2006-06-02 2010-04-13 Radiation Monitoring Devices, Inc. High spatial resolution radiation detector
US7608837B2 (en) * 2006-11-24 2009-10-27 Tower Semiconductor Ltd. High resolution integrated X-ray CMOS image sensor
CN101903801B (zh) * 2007-12-21 2014-01-29 皇家飞利浦电子股份有限公司 具有复合树脂中的闪烁体的辐射敏感探测器
JP2012098175A (ja) * 2010-11-02 2012-05-24 Sony Corp 放射線検出素子およびその製造方法、放射線検出モジュール並びに放射線画像診断装置
JP5720404B2 (ja) * 2011-05-10 2015-05-20 コニカミノルタ株式会社 放射線検出パネルおよび放射線画像検出器
JP5901169B2 (ja) * 2011-07-26 2016-04-06 キヤノン株式会社 シンチレータ構造体および放射線検出器
JP5911274B2 (ja) * 2011-11-28 2016-04-27 キヤノン株式会社 放射線検出装置及び放射線撮像システム
US10948612B1 (en) * 2019-12-12 2021-03-16 Chia Gee Wang Auger plate for x-ray phase contrast imaging and detectors comprising the Auger plates
CN114479180A (zh) * 2021-12-28 2022-05-13 中国原子能科学研究院 一种含铯-137的放射性光敏树脂及其制备方法

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2505991A1 (de) * 1975-02-13 1976-08-26 Siemens Ag Mit energiereichen strahlen anregbarer leuchtschirm
JPH0799419B2 (ja) * 1985-10-18 1995-10-25 キヤノン株式会社 液晶素子
EP0403802B1 (en) * 1989-06-20 1997-04-16 Kabushiki Kaisha Toshiba X-ray image intensifier and method of manufacturing input screen
US5427817A (en) * 1993-11-02 1995-06-27 University Of California Process for manufacturing an auto-collimating scintillator and product produced thereby
DE4342219C2 (de) * 1993-12-10 1996-02-22 Siemens Ag Röntgenbildverstärker
US6031234A (en) * 1997-12-08 2000-02-29 General Electric Company High resolution radiation imager

Also Published As

Publication number Publication date
DE69927481D1 (de) 2006-02-09
FR2774175A1 (fr) 1999-07-30
FR2774175B1 (fr) 2000-04-07
JP2002501207A (ja) 2002-01-15
EP1051642B1 (fr) 2005-09-28
CN1155836C (zh) 2004-06-30
DE69927481T2 (de) 2006-06-08
EP1051642A1 (fr) 2000-11-15
US6429437B1 (en) 2002-08-06
CN1292096A (zh) 2001-04-18
WO1999038031A1 (fr) 1999-07-29
JP4353635B2 (ja) 2009-10-28

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Legal Events

Date Code Title Description
PC Patent ceased (i.e. patent has lapsed due to the failure to pay the renewal fee)

Effective date: 20130126