HK1021230A1 - Optical density measuring device - Google Patents

Optical density measuring device

Info

Publication number
HK1021230A1
HK1021230A1 HK00100122A HK00100122A HK1021230A1 HK 1021230 A1 HK1021230 A1 HK 1021230A1 HK 00100122 A HK00100122 A HK 00100122A HK 00100122 A HK00100122 A HK 00100122A HK 1021230 A1 HK1021230 A1 HK 1021230A1
Authority
HK
Hong Kong
Prior art keywords
measuring device
optical density
density measuring
optical
measuring
Prior art date
Application number
HK00100122A
Other languages
English (en)
Inventor
Noboru Higashi
Original Assignee
Kurashiki Boseki Kk
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Kurashiki Boseki Kk filed Critical Kurashiki Boseki Kk
Publication of HK1021230A1 publication Critical patent/HK1021230A1/xx

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/27—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands using photo-electric detection ; circuits for computing concentration
    • G01N21/274—Calibration, base line adjustment, drift correction
    • G01N21/276—Calibration, base line adjustment, drift correction with alternation of sample and standard in optical path
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
HK00100122A 1997-10-29 2000-01-07 Optical density measuring device HK1021230A1 (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP29690397A JP3792374B2 (ja) 1997-10-29 1997-10-29 光学的濃度測定装置

Publications (1)

Publication Number Publication Date
HK1021230A1 true HK1021230A1 (en) 2000-06-02

Family

ID=17839657

Family Applications (1)

Application Number Title Priority Date Filing Date
HK00100122A HK1021230A1 (en) 1997-10-29 2000-01-07 Optical density measuring device

Country Status (11)

Country Link
US (1) US5991031A (de)
EP (1) EP0930497B1 (de)
JP (1) JP3792374B2 (de)
KR (1) KR100284184B1 (de)
CN (1) CN1104641C (de)
CA (1) CA2252019C (de)
DE (1) DE69828765T2 (de)
HK (1) HK1021230A1 (de)
MY (1) MY114968A (de)
SG (1) SG72882A1 (de)
TW (1) TW408218B (de)

Families Citing this family (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6348965B1 (en) * 1999-09-24 2002-02-19 Henry Palladino Solid state fluorescence and absorption spectroscopy
AT408488B (de) * 1999-12-22 2001-12-27 Scan Messtechnik Gmbh Miniaturisiertes spektrometer
JP5537141B2 (ja) * 2009-12-14 2014-07-02 株式会社東芝 自動分析装置
EP2428791B1 (de) * 2010-09-08 2013-03-27 Sick Ag Optisches Analysegerät
JP5947709B2 (ja) * 2012-12-27 2016-07-06 株式会社堀場製作所 分光分析方法及び分光分析装置
KR101456273B1 (ko) * 2013-04-25 2014-11-03 전자부품연구원 가스 측정 광학계
US9547231B2 (en) * 2013-06-12 2017-01-17 Avago Technologies General Ip (Singapore) Pte. Ltd. Device and method for making photomask assembly and photodetector device having light-collecting optical microstructure
CN105527224B (zh) * 2014-09-29 2019-02-22 安东帕有限公司 一种用于分析样品的设备和方法
CN105021571A (zh) * 2015-07-22 2015-11-04 哈尔滨工业大学 一种折光浓度计的光学系统
TWI606232B (zh) * 2016-01-25 2017-11-21 盟基生醫股份有限公司 微量核酸定量裝置
CN106251750A (zh) * 2016-10-08 2016-12-21 铜仁学院 一种开放式光电效应实验仪及其操作方法
CN110073185B (zh) * 2016-10-21 2022-02-18 瑞柏丽恩光子股份有限公司 移动气体和化学物成像相机
CN106525736A (zh) * 2016-12-27 2017-03-22 中国计量大学 一种测量氢气浓度的光纤型传感器
CN107860718A (zh) * 2017-12-08 2018-03-30 杭州驱歌科技有限公司 一种水质分析装置
CN111624182A (zh) * 2019-12-28 2020-09-04 黄辉 一种毛细管光度仪

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2858727A (en) * 1954-06-30 1958-11-04 American Cyanamid Co Device for the measurement of absolute turbidity
JPS59107241A (ja) * 1982-12-10 1984-06-21 Mitsubishi Electric Corp 水質計器
JPH03223654A (ja) * 1989-07-26 1991-10-02 Yokogawa Electric Corp 吸光光度計
JPH0359445A (ja) * 1989-07-28 1991-03-14 Shimadzu Corp 単光束測光装置
US4999010A (en) * 1989-07-31 1991-03-12 Mattson Instruments, Inc. Dual beam optical nulling interferometric spectrometer
JPH0726910B2 (ja) * 1990-04-18 1995-03-29 倉敷紡績株式会社 シリンダ型可変長セル
FR2671868B1 (fr) * 1991-01-22 1993-04-30 Aerospatiale Dispositif interferometrique notamment stellaire, comportant une ligne a retard.
IT1249939B (it) * 1991-06-28 1995-03-30 Cselt Centro Studi Lab Telecom Sistema di spettroscopia ad alta risoluzione.
JPH05332933A (ja) * 1992-05-28 1993-12-17 Anima Kk 携帯用ｃｏ２濃度検出装置
US5260574A (en) * 1992-06-26 1993-11-09 The United States Of America As Represented By The Secretary Of The Air Force Infrared densitometer
JP3462573B2 (ja) * 1994-05-11 2003-11-05 アークレイ株式会社 液体試料の成分濃度等を測定する方法及び装置

Also Published As

Publication number Publication date
DE69828765T2 (de) 2006-01-12
CA2252019C (en) 2002-07-02
CA2252019A1 (en) 1999-04-29
JP3792374B2 (ja) 2006-07-05
DE69828765D1 (de) 2005-03-03
MY114968A (en) 2003-02-28
JPH11132951A (ja) 1999-05-21
TW408218B (en) 2000-10-11
US5991031A (en) 1999-11-23
EP0930497A2 (de) 1999-07-21
EP0930497A3 (de) 1999-09-08
CN1221876A (zh) 1999-07-07
EP0930497B1 (de) 2005-01-26
SG72882A1 (en) 2000-05-23
KR19990037431A (ko) 1999-05-25
CN1104641C (zh) 2003-04-02
KR100284184B1 (ko) 2001-03-02

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Legal Events

Date Code Title Description
PF Patent in force
PC Patent ceased (i.e. patent has lapsed due to the failure to pay the renewal fee)

Effective date: 20101029