HK1010576A1 - Optical disc inspection equalization system and method. - Google Patents
Optical disc inspection equalization system and method.Info
- Publication number
- HK1010576A1 HK1010576A1 HK98111485A HK98111485A HK1010576A1 HK 1010576 A1 HK1010576 A1 HK 1010576A1 HK 98111485 A HK98111485 A HK 98111485A HK 98111485 A HK98111485 A HK 98111485A HK 1010576 A1 HK1010576 A1 HK 1010576A1
- Authority
- HK
- Hong Kong
- Prior art keywords
- optical media
- inspection
- optical disc
- equalization system
- air pressure
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
- G01N21/9506—Optical discs
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
- G11B7/00—Recording or reproducing by optical means, e.g. recording using a thermal beam of optical radiation by modifying optical properties or the physical structure, reproducing using an optical beam at lower power by sensing optical properties; Record carriers therefor
- G11B7/002—Recording, reproducing or erasing systems characterised by the shape or form of the carrier
- G11B7/0037—Recording, reproducing or erasing systems characterised by the shape or form of the carrier with discs
- G11B7/00375—Recording, reproducing or erasing systems characterised by the shape or form of the carrier with discs arrangements for detection of physical defects, e.g. of recording layer
Landscapes
- General Health & Medical Sciences (AREA)
- Physics & Mathematics (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
- Manufacturing Optical Record Carriers (AREA)
- Testing Of Optical Devices Or Fibers (AREA)
- Optical Recording Or Reproduction (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US2886196P | 1996-10-16 | 1996-10-16 | |
US08/920,299 US5940174A (en) | 1996-10-16 | 1997-08-28 | Optical disc inspection equalization system and method |
Publications (1)
Publication Number | Publication Date |
---|---|
HK1010576A1 true HK1010576A1 (en) | 1999-06-25 |
Family
ID=26704178
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
HK98111485A HK1010576A1 (en) | 1996-10-16 | 1998-10-22 | Optical disc inspection equalization system and method. |
Country Status (8)
Country | Link |
---|---|
US (2) | US5940174A (ja) |
EP (2) | EP1744150A3 (ja) |
JP (1) | JP4024909B2 (ja) |
AT (1) | ATE336719T1 (ja) |
AU (1) | AU744140B2 (ja) |
DE (1) | DE69732331T2 (ja) |
HK (1) | HK1010576A1 (ja) |
SG (1) | SG71726A1 (ja) |
Families Citing this family (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
SE9504228L (sv) * | 1995-11-27 | 1997-01-13 | M2 Engineering Ab | Förfaringssätt för automatisk avsyning av cirkulära informationsbärare |
JP2000011470A (ja) * | 1998-06-23 | 2000-01-14 | Tdk Corp | 樹脂ディスクの機械特性測定方法および光ディスクの機械特性測定方法 |
KR100334393B1 (ko) | 1999-06-30 | 2002-05-03 | 박종섭 | 반도체소자의 제조방법 |
JP2002048716A (ja) * | 2000-07-03 | 2002-02-15 | Internatl Business Mach Corp <Ibm> | 小型部品の外観検査治具およびその治具を用いた検査方法 |
KR100397255B1 (ko) * | 2000-09-29 | 2003-09-13 | 대한민국(전남대학교총장) | 티슈형 알루미늄 포일 생산공정에서의 공기압을 이용한홀딩장치 |
DE10313202B3 (de) * | 2003-03-21 | 2004-10-28 | HSEB Heinze & Süllau Entwicklungsbüro Dresden GmbH | Vorrichtung und Verfahren zur Kanteninspektion an Halbleiterwafern |
US7586595B2 (en) * | 2003-11-17 | 2009-09-08 | Tdk Corporation | Method of scanning and scanning apparatus |
US20050254381A1 (en) * | 2004-04-28 | 2005-11-17 | Desormeaux Joseph Jr | System and method for detecting faulty media in a media player |
Family Cites Families (12)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4069484A (en) * | 1976-05-28 | 1978-01-17 | Rca Corporation | Defect plotting system |
US4197011A (en) * | 1977-09-22 | 1980-04-08 | Rca Corporation | Defect detection and plotting system |
JPS57161640A (en) * | 1981-03-31 | 1982-10-05 | Olympus Optical Co Ltd | Inspecting device for surface |
JPS60147945A (ja) * | 1984-01-10 | 1985-08-05 | Victor Co Of Japan Ltd | 光デイスク検査装置 |
JPH0135354Y2 (ja) * | 1984-11-20 | 1989-10-27 | ||
US4794265A (en) * | 1987-05-08 | 1988-12-27 | Qc Optics, Inc. | Surface pit detection system and method |
US4794264A (en) * | 1987-05-08 | 1988-12-27 | Qc Optics, Inc. | Surface defect detection and confirmation system and method |
JPH01297542A (ja) * | 1988-05-25 | 1989-11-30 | Csk Corp | 欠陥検査装置 |
JPH01310485A (ja) * | 1988-06-08 | 1989-12-14 | Dainippon Printing Co Ltd | 欠陥情報検出装置 |
JPH0786470B2 (ja) * | 1988-06-13 | 1995-09-20 | 富士写真フイルム株式会社 | ディスク表面検査方法及び装置 |
JP2796316B2 (ja) * | 1988-10-24 | 1998-09-10 | 株式会社日立製作所 | 欠陥または異物の検査方法およびその装置 |
JPH0776757B2 (ja) * | 1990-12-14 | 1995-08-16 | インターナショナル・ビジネス・マシーンズ・コーポレイション | 光学的検査装置 |
-
1997
- 1997-08-28 US US08/920,299 patent/US5940174A/en not_active Expired - Lifetime
- 1997-10-07 DE DE69732331T patent/DE69732331T2/de not_active Expired - Fee Related
- 1997-10-07 EP EP06076562.5A patent/EP1744150A3/en not_active Withdrawn
- 1997-10-07 EP EP97307911A patent/EP0837321B1/en not_active Expired - Lifetime
- 1997-10-07 AT AT97307911T patent/ATE336719T1/de not_active IP Right Cessation
- 1997-10-08 SG SG1997003695A patent/SG71726A1/en unknown
- 1997-10-15 AU AU41022/97A patent/AU744140B2/en not_active Ceased
- 1997-10-16 JP JP28357797A patent/JP4024909B2/ja not_active Expired - Fee Related
-
1998
- 1998-10-22 HK HK98111485A patent/HK1010576A1/xx not_active IP Right Cessation
-
1999
- 1999-05-21 US US09/316,632 patent/US6154275A/en not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
DE69732331T2 (de) | 2007-03-08 |
EP0837321A3 (en) | 1998-12-16 |
SG71726A1 (en) | 2000-05-23 |
US6154275A (en) | 2000-11-28 |
AU744140B2 (en) | 2002-02-14 |
EP1744150A3 (en) | 2016-11-30 |
JP4024909B2 (ja) | 2007-12-19 |
EP1744150A2 (en) | 2007-01-17 |
EP0837321B1 (en) | 2006-08-16 |
ATE336719T1 (de) | 2006-09-15 |
EP0837321A2 (en) | 1998-04-22 |
AU4102297A (en) | 1998-04-23 |
DE69732331D1 (de) | 2005-03-03 |
JPH10206279A (ja) | 1998-08-07 |
US5940174A (en) | 1999-08-17 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
EP1030172A3 (de) | Verfahren und Vorrichtung zum Detektieren, Kennzeichnen und Wiederauffinden von Fehlern eines Materialbandes | |
WO2006069006A3 (en) | Method and system for identifying and repairing defective cells in a plugged honeycomb structure | |
AU6942998A (en) | Optical inspection module and method for detecting particles and defects on substrates in integrated process tools | |
EP0810428A3 (de) | Automatisierte Vorrichtung und Verfahren zum Messen und Bestimmen von Molekülen oder Teilen davon | |
SG71726A1 (en) | Optical disc inspection equalization system and method | |
ATE252731T1 (de) | System zum detektieren von oberflächenanomalien und/oder -merkmalen | |
TW200734630A (en) | Defect inspection apparatus and defect inspection method | |
AU6233498A (en) | Method and device for measuring and quantifying surface defects on a test surface | |
ATE115523T1 (de) | Vorrichtung zum brechen von einseitig geritzten glastafeln. | |
AU7888998A (en) | Apparatus and method for detecting leakage through filtration membrane | |
EP1398619A3 (fr) | Appareil et procédé de mesure de propriétés optiques par rétroaction | |
CA2273833A1 (en) | Method and apparatus for inspection of rubber product | |
EP1061371A3 (de) | Verfahren und Vorrichtung zur Kontrolle der Flüssigkeitsaufnahme einer Testschicht eines Analyseelementes | |
EP0678911A3 (de) | Verfahren und Vorrichtung zur Kontrolle von Halbleiterscheiben. | |
EP0354834A3 (en) | Surface defect inspection apparatus | |
DE59509011D1 (de) | Vorrichtung und Verfahren zum automatischen Bestücken eines Prüfapparates mit Stapelfaserproben | |
AU6363290A (en) | Nuclear oxygen activation method and apparatus for detecting and quantifying water flow | |
DK0596980T3 (da) | Apparat til håndtering af elektroforetiske overføringsmembraner og til chemiluminisent påvisning af derpå beliggende blots, samt fremgangsmåde ved anvendelsen af apparatet. | |
KR970702761A (ko) | 표면상의 결함 검출용 분말 조성물, 이를 사용하는 방법 및 이를 위한 도포기(surface defect detection powder composition, methods of using same and applicator therefor) | |
EP1099948A3 (de) | Vorrichtung und Verfahren zur optischen Inspektion | |
AU2103788A (en) | Method and apparatus for inspecting pipeline | |
IL106207A0 (en) | Method and apparatus for detecting defects in lenses | |
GB9500957D0 (en) | Optical method and apparatus for the detection of grain defects in lumber | |
DK0808693T3 (da) | Fremgangsmåde og apparat til bearbejdning af en ringformet CBN- eller diamantbelægning på slibeskiver | |
TW328628B (en) | Template mask for assisting inspection of semiconductor substrate defects |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
PC | Patent ceased (i.e. patent has lapsed due to the failure to pay the renewal fee) |
Effective date: 20081007 |