GR64070B - System for functional testing of electronic devices - Google Patents
System for functional testing of electronic devicesInfo
- Publication number
- GR64070B GR64070B GR55815A GR780155815A GR64070B GR 64070 B GR64070 B GR 64070B GR 55815 A GR55815 A GR 55815A GR 780155815 A GR780155815 A GR 780155815A GR 64070 B GR64070 B GR 64070B
- Authority
- GR
- Greece
- Prior art keywords
- electronic devices
- functional testing
- testing
- functional
- electronic
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
- G01R31/2834—Automated test systems [ATE]; using microprocessors or computers
Landscapes
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Tests Of Electronic Circuits (AREA)
- Techniques For Improving Reliability Of Storages (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
SU772472761A SU802970A1 (ru) | 1977-04-08 | 1977-04-08 | Устройство дл функционального конт-РОл бОльшиХ иНТЕгРАльНыХ CXEM |
Publications (1)
Publication Number | Publication Date |
---|---|
GR64070B true GR64070B (en) | 1980-01-21 |
Family
ID=20703602
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
GR55815A GR64070B (en) | 1977-04-08 | 1978-03-28 | System for functional testing of electronic devices |
Country Status (8)
Country | Link |
---|---|
BG (1) | BG41621A1 (el) |
DD (1) | DD136771A1 (el) |
FR (1) | FR2400209A1 (el) |
GR (1) | GR64070B (el) |
HU (1) | HU177211B (el) |
IT (1) | IT7841558A0 (el) |
PL (1) | PL121435B1 (el) |
SU (1) | SU802970A1 (el) |
Family Cites Families (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
FR2036316A7 (el) * | 1969-03-10 | 1970-12-24 | Gaillard Edmond | |
US3790885A (en) * | 1972-03-27 | 1974-02-05 | Ibm | Serial test patterns for mosfet testing |
FR2330014A1 (fr) * | 1973-05-11 | 1977-05-27 | Ibm France | Procede de test de bloc de circuits logiques integres et blocs en faisant application |
US4000460A (en) * | 1974-07-01 | 1976-12-28 | Xerox Corporation | Digital circuit module test system |
US3976940A (en) * | 1975-02-25 | 1976-08-24 | Fairchild Camera And Instrument Corporation | Testing circuit |
-
1977
- 1977-04-08 SU SU772472761A patent/SU802970A1/ru active
-
1978
- 1978-02-01 BG BG7838552A patent/BG41621A1/xx unknown
- 1978-03-28 GR GR55815A patent/GR64070B/el unknown
- 1978-03-29 FR FR7809154A patent/FR2400209A1/fr active Granted
- 1978-04-04 PL PL1978205799A patent/PL121435B1/pl unknown
- 1978-04-06 IT IT7841558A patent/IT7841558A0/it unknown
- 1978-04-06 HU HU78GA1250A patent/HU177211B/hu not_active IP Right Cessation
- 1978-04-06 DD DD78204633A patent/DD136771A1/xx not_active IP Right Cessation
Also Published As
Publication number | Publication date |
---|---|
PL121435B1 (en) | 1982-05-31 |
SU802970A1 (ru) | 1981-02-07 |
IT7841558A0 (it) | 1978-04-06 |
PL205799A1 (pl) | 1979-01-15 |
HU177211B (en) | 1981-08-28 |
FR2400209A1 (fr) | 1979-03-09 |
DD136771A1 (de) | 1979-07-25 |
BG41621A1 (en) | 1987-07-15 |
FR2400209B1 (el) | 1982-10-15 |
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