GR20060100515A - Ενισχυτικη διαταξη τηλεσκοπιου - Google Patents

Ενισχυτικη διαταξη τηλεσκοπιου

Info

Publication number
GR20060100515A
GR20060100515A GR20060100515A GR20060100515A GR20060100515A GR 20060100515 A GR20060100515 A GR 20060100515A GR 20060100515 A GR20060100515 A GR 20060100515A GR 20060100515 A GR20060100515 A GR 20060100515A GR 20060100515 A GR20060100515 A GR 20060100515A
Authority
GR
Greece
Prior art keywords
telescope
bundle
coloured
electronic
optical fibers
Prior art date
Application number
GR20060100515A
Other languages
English (en)
Inventor
Χριστος Δουκας
Original Assignee
Χριστος Δουκας
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Χριστος Δουκας filed Critical Χριστος Δουκας
Priority to GR20060100515A priority Critical patent/GR20060100515A/el
Publication of GR20060100515A publication Critical patent/GR20060100515A/el

Links

Classifications

    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B23/00—Telescopes, e.g. binoculars; Periscopes; Instruments for viewing the inside of hollow bodies; Viewfinders; Optical aiming or sighting devices
    • G02B23/12—Telescopes, e.g. binoculars; Periscopes; Instruments for viewing the inside of hollow bodies; Viewfinders; Optical aiming or sighting devices with means for image conversion or intensification
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/66—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light electrically excited, e.g. electroluminescence
    • G01N21/68—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light electrically excited, e.g. electroluminescence using high frequency electric fields
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B6/00—Light guides; Structural details of arrangements comprising light guides and other optical elements, e.g. couplings
    • G02B6/04—Light guides; Structural details of arrangements comprising light guides and other optical elements, e.g. couplings formed by bundles of fibres
    • G02B6/06—Light guides; Structural details of arrangements comprising light guides and other optical elements, e.g. couplings formed by bundles of fibres the relative position of the fibres being the same at both ends, e.g. for transporting images

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Astronomy & Astrophysics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Facsimile Scanning Arrangements (AREA)

Abstract

Ενισχυτική διάταξη τηλεσκοπίου, αποτελούμενη από όργανα και συσκευές, ηλεκτρονικές και μη, που σκοπό έχουν να αυξήσουν σημαντικά τις διακριτικές του ικανότητες. Θα προσαρμόζεται στο προσοφθάλμιο φακό1 του τηλεσκοπίου, κάθετα στο σχηματιζόμενο είδωλο και θα αποτελείται από φίλτρο Φ (τριχρωματικό ή πολυχρωματικό) που θα επιτρέπει τη διαδοχική διέλευση ακτινών από τρεις ή περισσότερες περιοχές τουφάσματος. Εν συνεχεία το φως θα εισέρχεται σε μία δέσμη πολύ λεπτών οπτικών ινών, ικανών αριθμού π.χ.100 που αρχικά θα είναι ενωμένες 2 και στη συνέχεια θα διαχωρίζονται 2α, κατευθυνόμενες, πλήρως όμωςταξινομημένες και συνδεδεμένες με ίσο αριθμό φωτοπολλαπλασιαστών 5 τοποθετημένων μέσα σε μία ψυκτική μονάδα 6 που θα λειτουργεί στους -70 βαθμούς Κελσίου. Το είδωλο στο προσοφθάλμιο φακό θα «σαρώνεται» σε όλη την έκτασή του από τη δέσμη των οπτικών ινών με τη βοήθεια απλού μηχανισμού, που θα συνδέεται με αυτή με σύρμα ή λαβίδα 4 παρόμοια με τη γραφίδα ενός εκτυπωτή.
GR20060100515A 2006-09-14 2006-09-14 Ενισχυτικη διαταξη τηλεσκοπιου GR20060100515A (el)

Priority Applications (1)

Application Number Priority Date Filing Date Title
GR20060100515A GR20060100515A (el) 2006-09-14 2006-09-14 Ενισχυτικη διαταξη τηλεσκοπιου

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
GR20060100515A GR20060100515A (el) 2006-09-14 2006-09-14 Ενισχυτικη διαταξη τηλεσκοπιου

Publications (1)

Publication Number Publication Date
GR20060100515A true GR20060100515A (el) 2008-04-15

Family

ID=39205005

Family Applications (1)

Application Number Title Priority Date Filing Date
GR20060100515A GR20060100515A (el) 2006-09-14 2006-09-14 Ενισχυτικη διαταξη τηλεσκοπιου

Country Status (1)

Country Link
GR (1) GR20060100515A (el)

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4191940A (en) * 1978-01-09 1980-03-04 Environmental Research Institute Of Michigan Method and apparatus for analyzing microscopic specimens and the like
US20020139925A1 (en) * 2001-03-30 2002-10-03 Tokyo Electron Limited Optical system and method for plasma optical emission analysis
KR20050008124A (ko) * 2003-07-14 2005-01-21 광주과학기술원 대류권 오존과 비구형성의 분진을 동시에 관측하기 위한레이저 광송신장치,광수신장치 및 라이다 시스템

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4191940A (en) * 1978-01-09 1980-03-04 Environmental Research Institute Of Michigan Method and apparatus for analyzing microscopic specimens and the like
US20020139925A1 (en) * 2001-03-30 2002-10-03 Tokyo Electron Limited Optical system and method for plasma optical emission analysis
KR20050008124A (ko) * 2003-07-14 2005-01-21 광주과학기술원 대류권 오존과 비구형성의 분진을 동시에 관측하기 위한레이저 광송신장치,광수신장치 및 라이다 시스템

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ML Lapse due to non-payment of fees

Effective date: 20110404