GB998196A - Improvements relating to x-radiation analysis - Google Patents
Improvements relating to x-radiation analysisInfo
- Publication number
- GB998196A GB998196A GB2567362A GB2567362A GB998196A GB 998196 A GB998196 A GB 998196A GB 2567362 A GB2567362 A GB 2567362A GB 2567362 A GB2567362 A GB 2567362A GB 998196 A GB998196 A GB 998196A
- Authority
- GB
- United Kingdom
- Prior art keywords
- radiation
- specimen
- cell
- specimen material
- analysed
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
- G01N23/225—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material using electron or ion
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
- G01N23/223—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/07—Investigating materials by wave or particle radiation secondary emission
- G01N2223/076—X-ray fluorescence
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Abstract
998,196. X-ray analysis. ASSOCIATED ELECTRICAL INDUSTRIES Ltd., and E. COHEN. July 8, 1963 [July 4, 1962], No. 25673/62. Heading G1A. [Also in Division H1] A liquid suspension of a specimen material required to be analysed is introduced into a hollow cell 5 arranged to constitute with the suspension a composite X-ray tube target such that on energization of the X-ray tube the specimen material in the cell 5 is excited to emit characteristic X-radiation, said radiation being analysed to obtain an analysis of the specimen material. In the arrangement shown the specimen fluid flows into and out of the cell 5 through pipes 6 and 7 respectively and is irradiated by an electron beam 4 from a tube 1 having a filament 2 and a cathode 3. The resulting characteristic X- radiation from the specimen material is analysed by a spectrometer consisting of a collimator 10, a rotatable analysing crystal 11, and a detector 12 which may be rotated about the crystal 11 so that it may be moved to angular positions at which radiation reflection takes place. Alternatively, the detector may consist of a scintillation or proportional counter used in conjunction with a pulse height analyser. In a preferred form the window 8 of the cell 5 may have a layer of a heavier target material such as gold which will produce primary X-rays to excit the specimen material. The layer is so chosen that its own characteristic radiation would not mask that of the specimen. The layer on the window may be discontinuous e.g. in the form of a grid having parallel strip formation (Fig. 4a not shown)
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
GB2567362A GB998196A (en) | 1962-07-04 | 1962-07-04 | Improvements relating to x-radiation analysis |
DE19631498522 DE1498522A1 (en) | 1962-07-04 | 1963-07-03 | Method and device for X-ray analysis |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
GB2567362A GB998196A (en) | 1962-07-04 | 1962-07-04 | Improvements relating to x-radiation analysis |
Publications (1)
Publication Number | Publication Date |
---|---|
GB998196A true GB998196A (en) | 1965-07-14 |
Family
ID=10231485
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
GB2567362A Expired GB998196A (en) | 1962-07-04 | 1962-07-04 | Improvements relating to x-radiation analysis |
Country Status (2)
Country | Link |
---|---|
DE (1) | DE1498522A1 (en) |
GB (1) | GB998196A (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4388530A (en) | 1979-04-20 | 1983-06-14 | Kernforschungszentrum Karlsruhe Gesellschaft Mit Beschrankter Haftung | Process and apparatus for the continuous measurement of element contents |
GB2125541A (en) * | 1982-08-13 | 1984-03-07 | Inst Tzvetna Metalurgia | Method and device for determination of dust content in dust gas flows |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4528657A (en) * | 1983-02-07 | 1985-07-09 | E. I. Du Pont De Nemours And Company | Fluid sample cell for X-ray analysis |
-
1962
- 1962-07-04 GB GB2567362A patent/GB998196A/en not_active Expired
-
1963
- 1963-07-03 DE DE19631498522 patent/DE1498522A1/en active Pending
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4388530A (en) | 1979-04-20 | 1983-06-14 | Kernforschungszentrum Karlsruhe Gesellschaft Mit Beschrankter Haftung | Process and apparatus for the continuous measurement of element contents |
GB2125541A (en) * | 1982-08-13 | 1984-03-07 | Inst Tzvetna Metalurgia | Method and device for determination of dust content in dust gas flows |
Also Published As
Publication number | Publication date |
---|---|
DE1498522A1 (en) | 1969-03-06 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
Friedman et al. | A Geiger Counter Spectrometer for X‐Ray Fluorescence Analysis | |
US2635192A (en) | Fluorescent spectral analysis | |
Stephenson | X-Ray fluorescence yields | |
Cocke et al. | Decay of the 2 S 1 3 State in Heliumlike Chlorine | |
GB1184947A (en) | Improvements in or relating to a Method of Producing an X-Ray Picture of an Object | |
GB998196A (en) | Improvements relating to x-radiation analysis | |
Rogers | Production of Monochromatic X‐Radiation for Microradiography by Excitation of Fluorescent Characteristic Radiation | |
Meyerott et al. | Plastic scintillator response to 1–10 keV photons | |
US3418467A (en) | Method of generating an x-ray beam composed of a plurality of wavelengths | |
Kato et al. | Coherent Bremsstrahlung from Si Single Crystal I. Experiment | |
Oostens et al. | Transition radiation from relativistic charged particles and its energy dependence | |
Walke et al. | K-electron capture, nuclear isomerism and the longperiod activities of titanium and scandium | |
GB1474955A (en) | Radioactive beam detection | |
Leland | On the Abundance of I 129, Te 118, and Pt 190 | |
DE2911596C3 (en) | Measurement arrangement for X-ray fluorescence analysis | |
US3207895A (en) | Method for measuring low density atmospheres | |
Johnston et al. | Response of an Anthracene Scintillation Counter to 10–120 kev Electrons | |
Burke et al. | Absorption analysis of x-ray spectra produced by beryllium window tubes operated at 20 to 50 kVp | |
Jakobson et al. | The Production of Charged Photomesons from Helium. Hydrogen-Helium Ratios. II | |
GB1198126A (en) | X-Ray Source | |
US3120610A (en) | Apparatus for producing a high intensity electron stream used to excite characteristic radiation of elements | |
Owen | The passage of homogeneous Röntgen rays through gases | |
GB1422330A (en) | ||
Sharma et al. | X-Ray Yields from K-Shell Ionization by α Particles | |
GB1065918A (en) | Improvements in or relating to apparatus for x-ray analysis |