GB993810A - Method and apparatus for determining coating thickness - Google Patents

Method and apparatus for determining coating thickness

Info

Publication number
GB993810A
GB993810A GB1890663A GB1890663A GB993810A GB 993810 A GB993810 A GB 993810A GB 1890663 A GB1890663 A GB 1890663A GB 1890663 A GB1890663 A GB 1890663A GB 993810 A GB993810 A GB 993810A
Authority
GB
United Kingdom
Prior art keywords
coating
radiation
thickness
aluminium
scaler
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
GB1890663A
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
United States Steel Corp
Original Assignee
United States Steel Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by United States Steel Corp filed Critical United States Steel Corp
Publication of GB993810A publication Critical patent/GB993810A/en
Expired legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/203Measuring back scattering
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/223Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00Investigating materials by wave or particle radiation
    • G01N2223/07Investigating materials by wave or particle radiation secondary emission
    • G01N2223/076X-ray fluorescence

Landscapes

  • Chemical & Material Sciences (AREA)
  • Biochemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Length-Measuring Devices Using Wave Or Particle Radiation (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)

Abstract

993,810. Measuring coating thickness using radiation. UNITED STATES STEEL CORPORATION. May 13, 1963 [June 6, 1962], No. 18906/63. Heading G1A. The thickness of a coating material on a base material having an atomic number at least three greater than the coating material is measured by directing a primary X-ray beam on to the coating at a potential sufficient to excite the coating but lower than the potential required to excite the base material and measuring the intensity of the resulting characteristic radiation emitted from the coating. In the arrangement shown X-rays from a tube 5 are received by an aluminium coating C on a ferrous base B and the resulting characteristic X-radiation from the coating is detected by a standard flow proportional counter 8 after passing through collimating tubes 10. The signal from the counter 8 is fed through a linear amplifier to a pulse height analyzer 16 which allows only the signals resulting from the characteristic radiation from aluminium to be counted by three high speed binary counters 18 and a six stage decode scaler and timer 20. The scaler and timer 20 are calibrated against known standards so that they provide an indication of the thickness of the aluminium coating. The apparatus is contained in a vacuum chamber 2 evacuated by a pump 4.
GB1890663A 1962-06-06 1963-05-13 Method and apparatus for determining coating thickness Expired GB993810A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US20054962A 1962-06-06 1962-06-06

Publications (1)

Publication Number Publication Date
GB993810A true GB993810A (en) 1965-06-02

Family

ID=22742178

Family Applications (1)

Application Number Title Priority Date Filing Date
GB1890663A Expired GB993810A (en) 1962-06-06 1963-05-13 Method and apparatus for determining coating thickness

Country Status (4)

Country Link
BE (1) BE633063A (en)
FR (1) FR1358240A (en)
GB (1) GB993810A (en)
NL (1) NL293722A (en)

Also Published As

Publication number Publication date
BE633063A (en) 1963-12-02
NL293722A (en) 1963-06-06
FR1358240A (en) 1964-04-10

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