GB9930868D0 - Method for testing application specific integrated circuit in exchange system for radio interface - Google Patents

Method for testing application specific integrated circuit in exchange system for radio interface

Info

Publication number
GB9930868D0
GB9930868D0 GBGB9930868.6A GB9930868A GB9930868D0 GB 9930868 D0 GB9930868 D0 GB 9930868D0 GB 9930868 A GB9930868 A GB 9930868A GB 9930868 D0 GB9930868 D0 GB 9930868D0
Authority
GB
United Kingdom
Prior art keywords
integrated circuit
specific integrated
application specific
exchange system
radio interface
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
GBGB9930868.6A
Other versions
GB2345346A (en
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Samsung Electronics Co Ltd
Original Assignee
Samsung Electronics Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Samsung Electronics Co Ltd filed Critical Samsung Electronics Co Ltd
Publication of GB9930868D0 publication Critical patent/GB9930868D0/en
Publication of GB2345346A publication Critical patent/GB2345346A/en
Withdrawn legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/31708—Analysis of signal quality
    • G01R31/3171—BER [Bit Error Rate] test
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04M—TELEPHONIC COMMUNICATION
    • H04M3/00—Automatic or semi-automatic exchanges
    • H04M3/22—Arrangements for supervision, monitoring or testing
    • H04M3/26—Arrangements for supervision, monitoring or testing with means for applying test signals or for measuring
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04B—TRANSMISSION
    • H04B17/00—Monitoring; Testing
    • H04B17/20—Monitoring; Testing of receivers
    • H04B17/29—Performance testing

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Signal Processing (AREA)
  • Electromagnetism (AREA)
  • Computer Networks & Wireless Communication (AREA)
  • Nonlinear Science (AREA)
  • General Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Mobile Radio Communication Systems (AREA)
  • Monitoring And Testing Of Transmission In General (AREA)
  • Transceivers (AREA)
GB9930868A 1998-12-30 1999-12-24 Method of testing a radio circuit involving the calculation of the bit error rate Withdrawn GB2345346A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR1019980060972A KR20000044473A (en) 1998-12-30 1998-12-30 Method for testing application specific integrated circuit of exchange system for wireless linkage

Publications (2)

Publication Number Publication Date
GB9930868D0 true GB9930868D0 (en) 2000-02-23
GB2345346A GB2345346A (en) 2000-07-05

Family

ID=19567728

Family Applications (1)

Application Number Title Priority Date Filing Date
GB9930868A Withdrawn GB2345346A (en) 1998-12-30 1999-12-24 Method of testing a radio circuit involving the calculation of the bit error rate

Country Status (2)

Country Link
KR (1) KR20000044473A (en)
GB (1) GB2345346A (en)

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH036156A (en) * 1989-06-01 1991-01-11 Mitsubishi Electric Corp Data transmission line fault detecting circuit
US5726991A (en) * 1993-06-07 1998-03-10 At&T Global Information Solutions Company Integral bit error rate test system for serial data communication links
JPH08307926A (en) * 1995-05-08 1996-11-22 Fujitsu Ltd Bit error rate measuring instrument in digital mobile communication system

Also Published As

Publication number Publication date
GB2345346A (en) 2000-07-05
KR20000044473A (en) 2000-07-15

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Legal Events

Date Code Title Description
732E Amendments to the register in respect of changes of name or changes affecting rights (sect. 32/1977)
WAP Application withdrawn, taken to be withdrawn or refused ** after publication under section 16(1)