GB9923232D0 - Current measuring method,current sensor,and IC tester using the same current sensor - Google Patents

Current measuring method,current sensor,and IC tester using the same current sensor

Info

Publication number
GB9923232D0
GB9923232D0 GBGB9923232.4A GB9923232A GB9923232D0 GB 9923232 D0 GB9923232 D0 GB 9923232D0 GB 9923232 A GB9923232 A GB 9923232A GB 9923232 D0 GB9923232 D0 GB 9923232D0
Authority
GB
United Kingdom
Prior art keywords
current sensor
current
tester
measuring method
same
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
GBGB9923232.4A
Other versions
GB2340233A (en
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Advantest Corp
Original Assignee
Advantest Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Advantest Corp filed Critical Advantest Corp
Publication of GB9923232D0 publication Critical patent/GB9923232D0/en
Publication of GB2340233A publication Critical patent/GB2340233A/en
Withdrawn legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R15/00—Details of measuring arrangements of the types provided for in groups G01R17/00 - G01R29/00, G01R33/00 - G01R33/26 or G01R35/00
    • G01R15/14—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks
    • G01R15/24—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks using light-modulating devices
    • G01R15/241—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks using light-modulating devices using electro-optical modulators, e.g. electro-absorption

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Environmental & Geological Engineering (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Health & Medical Sciences (AREA)
  • Toxicology (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
GB9923232A 1998-02-05 1998-02-05 Current measuring method,current sensor,and IC tester using the same current sensor Withdrawn GB2340233A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/JP1998/000479 WO1999040446A1 (en) 1998-02-05 1998-02-05 Current measuring method, current sensor, and ic tester using the same current sensor

Publications (2)

Publication Number Publication Date
GB9923232D0 true GB9923232D0 (en) 1999-12-08
GB2340233A GB2340233A (en) 2000-02-16

Family

ID=14207551

Family Applications (1)

Application Number Title Priority Date Filing Date
GB9923232A Withdrawn GB2340233A (en) 1998-02-05 1998-02-05 Current measuring method,current sensor,and IC tester using the same current sensor

Country Status (6)

Country Link
KR (1) KR20010006008A (en)
CN (1) CN1252130A (en)
DE (1) DE19882306T1 (en)
GB (1) GB2340233A (en)
TW (1) TW359753B (en)
WO (1) WO1999040446A1 (en)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101958263B (en) * 2009-07-14 2013-01-02 致茂电子(苏州)有限公司 Semiconductor grain point measurement machine test method and semiconductor grain point measurement machine
US9733133B2 (en) * 2013-10-07 2017-08-15 Xiaotian Steve Yao Faraday current and temperature sensors
EP3152746B1 (en) * 2014-06-04 2019-09-11 Telefonaktiebolaget LM Ericsson (publ) An optical electrical measurement system, a measurement probe and a method therefor
CN107091950B (en) 2016-02-16 2021-01-19 姚晓天 Reflective current and magnetic field sensor integrating temperature sensing based on optical sensing principle
CN107861045A (en) * 2017-10-13 2018-03-30 天津市英贝特航天科技有限公司 Short-circuit chip searching device and method based on direct current CT technology
CN109709384B (en) * 2018-12-13 2021-10-01 北京航天时代光电科技有限公司 Current sensor adopting integrated light path structure
KR102451032B1 (en) * 2020-09-29 2022-10-05 엘아이지넥스원 주식회사 APPARATUS AND METHOD FOR DETECTING A MALFUNTION OF FET(Field Effect Transistor)
CN115856396B (en) * 2022-12-09 2023-08-29 珠海多创科技有限公司 Sensing probe module, non-contact voltage measurement circuit, non-contact voltage measurement method and electronic equipment
KR102535830B1 (en) * 2023-04-11 2023-05-26 주식회사 수산이앤에스 A system for testing optical converter

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5224389B2 (en) * 1974-03-11 1977-06-30
JPS59155764A (en) * 1983-02-24 1984-09-04 Yokogawa Hokushin Electric Corp Photovoltometer
JPS59218915A (en) * 1983-05-27 1984-12-10 Yokogawa Hokushin Electric Corp Light guide type sensor
JPS6237940A (en) * 1985-08-12 1987-02-18 Nippon Denshi Zairyo Kk Probe card
JPS6246268A (en) * 1985-08-23 1987-02-28 Nippon Denshi Zairyo Kk Probe card
JPH07104365B2 (en) * 1987-09-19 1995-11-13 株式会社安川電機 Optical sensor device
JPH04172260A (en) * 1990-11-05 1992-06-19 Toyota Central Res & Dev Lab Inc Apparatus for measuring strength of electromagnetic field
JP2603380B2 (en) * 1991-09-13 1997-04-23 日本電信電話株式会社 Test apparatus and test method for integrated circuit
JPH0989961A (en) * 1995-09-26 1997-04-04 Tokin Corp Electric field detecting device

Also Published As

Publication number Publication date
WO1999040446A1 (en) 1999-08-12
WO1999040446A8 (en) 1999-12-16
CN1252130A (en) 2000-05-03
KR20010006008A (en) 2001-01-15
DE19882306T1 (en) 2000-04-27
GB2340233A (en) 2000-02-16
TW359753B (en) 1999-06-01

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Legal Events

Date Code Title Description
WAP Application withdrawn, taken to be withdrawn or refused ** after publication under section 16(1)