GB9720346D0 - Method and apparatus for inspecting inserting state of components in printed circuit board - Google Patents

Method and apparatus for inspecting inserting state of components in printed circuit board

Info

Publication number
GB9720346D0
GB9720346D0 GBGB9720346.7A GB9720346A GB9720346D0 GB 9720346 D0 GB9720346 D0 GB 9720346D0 GB 9720346 A GB9720346 A GB 9720346A GB 9720346 D0 GB9720346 D0 GB 9720346D0
Authority
GB
United Kingdom
Prior art keywords
inspecting
components
circuit board
printed circuit
inserting state
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
GBGB9720346.7A
Other versions
GB2317447A (en
GB2317447B (en
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
WiniaDaewoo Co Ltd
Original Assignee
Daewoo Electronics Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from KR1019960041986A external-priority patent/KR19980022712A/en
Priority claimed from KR1019960041984A external-priority patent/KR100198397B1/en
Priority claimed from KR1019960041987A external-priority patent/KR19980022713A/en
Application filed by Daewoo Electronics Co Ltd filed Critical Daewoo Electronics Co Ltd
Publication of GB9720346D0 publication Critical patent/GB9720346D0/en
Publication of GB2317447A publication Critical patent/GB2317447A/en
Application granted granted Critical
Publication of GB2317447B publication Critical patent/GB2317447B/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/302—Contactless testing
    • G01R31/308—Contactless testing using non-ionising electromagnetic radiation, e.g. optical radiation
    • G01R31/309—Contactless testing using non-ionising electromagnetic radiation, e.g. optical radiation of printed or hybrid circuits or circuit substrates
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K13/00—Apparatus or processes specially adapted for manufacturing or adjusting assemblages of electric components
    • H05K13/08—Monitoring manufacture of assemblages
    • H05K13/081—Integration of optical monitoring devices in assembly lines; Processes using optical monitoring devices specially adapted for controlling devices or machines in assembly lines
    • H05K13/0815—Controlling of component placement on the substrate during or after manufacturing
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G01R31/281—Specific types of tests or tests for a specific type of fault, e.g. thermal mapping, shorts testing
    • G01R31/2813—Checking the presence, location, orientation or value, e.g. resistance, of components or conductors

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Manufacturing & Machinery (AREA)
  • Health & Medical Sciences (AREA)
  • Operations Research (AREA)
  • Electromagnetism (AREA)
  • Toxicology (AREA)
  • General Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Supply And Installment Of Electrical Components (AREA)
GB9720346A 1996-09-24 1997-09-24 Method and apparatus for inspecting inserting state of components in printed circuit board Expired - Fee Related GB2317447B (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
KR1019960041986A KR19980022712A (en) 1996-09-24 1996-09-24 Uninserted inspection device of printed circuit board
KR1019960041984A KR100198397B1 (en) 1996-09-24 1996-09-24 Apparatus and its method for checking if part is inserted on pcb
KR1019960041987A KR19980022713A (en) 1996-09-24 1996-09-24 Uninserted inspection device of printed circuit board

Publications (3)

Publication Number Publication Date
GB9720346D0 true GB9720346D0 (en) 1997-11-26
GB2317447A GB2317447A (en) 1998-03-25
GB2317447B GB2317447B (en) 2000-04-12

Family

ID=27349398

Family Applications (1)

Application Number Title Priority Date Filing Date
GB9720346A Expired - Fee Related GB2317447B (en) 1996-09-24 1997-09-24 Method and apparatus for inspecting inserting state of components in printed circuit board

Country Status (2)

Country Link
JP (1) JPH10107500A (en)
GB (1) GB2317447B (en)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20060116865A1 (en) 1999-09-17 2006-06-01 Www.Uniscape.Com E-services translation utilizing machine translation and translation memory
US7983896B2 (en) 2004-03-05 2011-07-19 SDL Language Technology In-context exact (ICE) matching
US9262403B2 (en) 2009-03-02 2016-02-16 Sdl Plc Dynamic generation of auto-suggest dictionary for natural language translation
GB2468278A (en) 2009-03-02 2010-09-08 Sdl Plc Computer assisted natural language translation outputs selectable target text associated in bilingual corpus with input target text from partial translation
US9128929B2 (en) 2011-01-14 2015-09-08 Sdl Language Technologies Systems and methods for automatically estimating a translation time including preparation time in addition to the translation itself

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2143944B (en) * 1983-07-25 1986-12-03 Lloyd Doyle Ltd Inspection of printed wiring boards
US4978224A (en) * 1987-07-14 1990-12-18 Sharp Kabushiki Kaisha Method of and apparatus for inspecting mounting of chip components
JPH0469777A (en) * 1990-07-10 1992-03-04 Dainippon Screen Mfg Co Ltd Pattern inspecting device for printed board
EP0471196A3 (en) * 1990-08-13 1994-09-07 Siemens Ag Image analysis method
US5489985A (en) * 1993-01-21 1996-02-06 Matsushita Electric Industrial Co., Ltd. Apparatus for inspection of packaged printed circuit boards

Also Published As

Publication number Publication date
GB2317447A (en) 1998-03-25
JPH10107500A (en) 1998-04-24
GB2317447B (en) 2000-04-12

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Legal Events

Date Code Title Description
PCNP Patent ceased through non-payment of renewal fee

Effective date: 20020924