GB927226A - Improvements in and relating to the contacting and testing of thin fragile structures such as semiconductor devices and the like - Google Patents

Improvements in and relating to the contacting and testing of thin fragile structures such as semiconductor devices and the like

Info

Publication number
GB927226A
GB927226A GB32373/59A GB3237359A GB927226A GB 927226 A GB927226 A GB 927226A GB 32373/59 A GB32373/59 A GB 32373/59A GB 3237359 A GB3237359 A GB 3237359A GB 927226 A GB927226 A GB 927226A
Authority
GB
United Kingdom
Prior art keywords
testing
semi
needles
levers
adjustable
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
GB32373/59A
Other languages
English (en)
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Lanteris Space LLC
Original Assignee
Philco Ford Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Philco Ford Corp filed Critical Philco Ford Corp
Publication of GB927226A publication Critical patent/GB927226A/en
Expired legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P95/00Generic processes or apparatus for manufacture or treatments not covered by the other groups of this subclass
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02General constructional details
    • G01R1/06Measuring leads; Measuring probes
    • G01R1/067Measuring probes
    • G01R1/06711Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
    • G01R1/06733Geometry aspects
    • G01R1/0675Needle-like
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P14/00Formation of materials, e.g. in the shape of layers or pillars
    • H10P14/40Formation of materials, e.g. in the shape of layers or pillars of conductive or resistive materials
    • H10P14/46Formation of materials, e.g. in the shape of layers or pillars of conductive or resistive materials using a liquid

Landscapes

  • Physics & Mathematics (AREA)
  • Geometry (AREA)
  • General Physics & Mathematics (AREA)
  • Measuring Leads Or Probes (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
GB32373/59A 1958-09-23 1959-09-23 Improvements in and relating to the contacting and testing of thin fragile structures such as semiconductor devices and the like Expired GB927226A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US762853A US2958042A (en) 1958-09-23 1958-09-23 Fabrication of semiconductors and the like

Publications (1)

Publication Number Publication Date
GB927226A true GB927226A (en) 1963-05-29

Family

ID=25066197

Family Applications (1)

Application Number Title Priority Date Filing Date
GB32373/59A Expired GB927226A (en) 1958-09-23 1959-09-23 Improvements in and relating to the contacting and testing of thin fragile structures such as semiconductor devices and the like

Country Status (5)

Country Link
US (1) US2958042A (https=)
BR (1) BR5912278D0 (https=)
DE (1) DE1120026B (https=)
FR (1) FR1232203A (https=)
GB (1) GB927226A (https=)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE19733861A1 (de) * 1997-08-05 1999-02-25 Siemens Ag Vorrichtung und Verfahren zur Kontaktierung einer Meß-Sonde

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US1507287A (en) * 1923-06-06 1924-09-02 Hincher Mfg Company Garment hanger
US2872645A (en) * 1957-08-23 1959-02-03 Philco Corp Mechanical apparatus

Also Published As

Publication number Publication date
FR1232203A (fr) 1960-10-06
BR5912278D0 (https=) 1973-04-17
US2958042A (en) 1960-10-25
DE1120026B (de) 1961-12-21

Similar Documents

Publication Publication Date Title
GB945739A (en) Methods relating to miniature semiconductor devices
US3056317A (en) Article manipulating and processing apparatus
GB1165609A (en) Lead Frame Package for Semiconductor Devices and Method for Making Same.
NL109587C (https=)
GB771039A (en) Improvements in semi-conductor devices
GB927226A (en) Improvements in and relating to the contacting and testing of thin fragile structures such as semiconductor devices and the like
GB1047872A (en) Improvements in and relating to apparatus for the production of semiconductor and other articles
GB791440A (en) Wiring systems for electrical apparatus
GB1110635A (en) Pressure electrical contact assembly for a semiconductor device
US2762956A (en) Semi-conductor devices and methods
FR1257419A (fr) Dispositif électronique à semi-conducteur comprenant au moins un circuit électrique bistable
ES286895A1 (es) Dispositivo de contactos para aparatos eléctricos
GB1000023A (en) Semi-conductor devices
JPS62298781A (ja) デバイス特性測定用ハンドラ装置
GB857951A (en) Improvements in or relating to apparatus for mounting an electricity meter for test purposes
JPS5918681Y2 (ja) 半導体チツプ収容器
GB1157042A (en) Semiconductor Device Assembly
ES337420A1 (es) Un dispositivo de retencion de alambre para un cuadro elec-trico de contactos multiples.
GB750875A (en) Electric semi-conductor devices
US3381221A (en) Test socket for transistors and the like
GB958244A (en) Semiconductor device
US2820983A (en) Assembly fixture for point contact device
ES246911A1 (es) Un dispositivo para terminales eléctricos
GB725670A (en) Improvements in or relating to mounting means for electrical components
GB755974A (en) Improvements in or relating to mounting arrangements for electrical components