GB9223130D0 - On chip semiconductor memory arbitrary pattern,parallel test apparatus and method - Google Patents

On chip semiconductor memory arbitrary pattern,parallel test apparatus and method

Info

Publication number
GB9223130D0
GB9223130D0 GB929223130A GB9223130A GB9223130D0 GB 9223130 D0 GB9223130 D0 GB 9223130D0 GB 929223130 A GB929223130 A GB 929223130A GB 9223130 A GB9223130 A GB 9223130A GB 9223130 D0 GB9223130 D0 GB 9223130D0
Authority
GB
United Kingdom
Prior art keywords
semiconductor memory
test apparatus
chip semiconductor
parallel test
arbitrary pattern
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
GB929223130A
Other versions
GB2259594A (en
GB2259594B (en
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Electric Corp
Original Assignee
Mitsubishi Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from JP1137972A external-priority patent/JPH0748319B2/en
Priority claimed from GB8918830A external-priority patent/GB2222461B/en
Application filed by Mitsubishi Electric Corp filed Critical Mitsubishi Electric Corp
Publication of GB9223130D0 publication Critical patent/GB9223130D0/en
Publication of GB2259594A publication Critical patent/GB2259594A/en
Application granted granted Critical
Publication of GB2259594B publication Critical patent/GB2259594B/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/70—Masking faults in memories by using spares or by reconfiguring
    • G11C29/78—Masking faults in memories by using spares or by reconfiguring using programmable devices
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
    • G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
    • G11C29/18—Address generation devices; Devices for accessing memories, e.g. details of addressing circuits
    • G11C29/26—Accessing multiple arrays
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
    • G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
    • G11C29/38—Response verification devices
GB9223130A 1988-08-30 1992-11-04 Semiconductor memory device Expired - Lifetime GB2259594B (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP21710988 1988-08-30
JP1137972A JPH0748319B2 (en) 1988-08-30 1989-05-31 Semiconductor memory device
GB8918830A GB2222461B (en) 1988-08-30 1989-08-17 On chip testing of semiconductor memory devices

Publications (3)

Publication Number Publication Date
GB9223130D0 true GB9223130D0 (en) 1992-12-16
GB2259594A GB2259594A (en) 1993-03-17
GB2259594B GB2259594B (en) 1993-06-30

Family

ID=27264642

Family Applications (2)

Application Number Title Priority Date Filing Date
GB9213630A Expired - Lifetime GB2256279B (en) 1988-08-30 1992-06-26 Semiconductor memory device
GB9223130A Expired - Lifetime GB2259594B (en) 1988-08-30 1992-11-04 Semiconductor memory device

Family Applications Before (1)

Application Number Title Priority Date Filing Date
GB9213630A Expired - Lifetime GB2256279B (en) 1988-08-30 1992-06-26 Semiconductor memory device

Country Status (1)

Country Link
GB (2) GB2256279B (en)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR940006676B1 (en) * 1991-10-14 1994-07-25 삼성전자 주식회사 Semiconductor ic having test cirucit for memory
KR100212420B1 (en) * 1995-09-25 1999-08-02 김영환 Cash static ram having a test circuit
KR100197554B1 (en) * 1995-09-30 1999-06-15 윤종용 Speedy test method of semiconductor memory device
JPH09161476A (en) * 1995-10-04 1997-06-20 Toshiba Corp Semiconductor memory, its testing circuit and data transfer system
KR100494281B1 (en) * 1996-10-31 2005-08-05 텍사스 인스트루먼츠 인코포레이티드 Integrated circuit memory device having current-mode data compression test mode

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4872168A (en) * 1986-10-02 1989-10-03 American Telephone And Telegraph Company, At&T Bell Laboratories Integrated circuit with memory self-test

Also Published As

Publication number Publication date
GB2259594A (en) 1993-03-17
GB2256279B (en) 1993-05-12
GB2259594B (en) 1993-06-30
GB9213630D0 (en) 1992-08-12
GB2256279A (en) 1992-12-02

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Legal Events

Date Code Title Description
746 Register noted 'licences of right' (sect. 46/1977)

Effective date: 19950810

PE20 Patent expired after termination of 20 years

Expiry date: 20090816