GB2256279B - Semiconductor memory device - Google Patents

Semiconductor memory device

Info

Publication number
GB2256279B
GB2256279B GB9213630A GB9213630A GB2256279B GB 2256279 B GB2256279 B GB 2256279B GB 9213630 A GB9213630 A GB 9213630A GB 9213630 A GB9213630 A GB 9213630A GB 2256279 B GB2256279 B GB 2256279B
Authority
GB
United Kingdom
Prior art keywords
memory device
semiconductor memory
semiconductor
memory
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
GB9213630A
Other versions
GB9213630D0 (en
GB2256279A (en
Inventor
Kazutami Arimoto
Kazuyasu Fujishima
Yoshio Matsuda
Tsukasa Ooishi
Masaki Tsukude
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Electric Corp
Original Assignee
Mitsubishi Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from JP1137972A external-priority patent/JPH0748319B2/en
Priority claimed from GB8918830A external-priority patent/GB2222461B/en
Application filed by Mitsubishi Electric Corp filed Critical Mitsubishi Electric Corp
Publication of GB9213630D0 publication Critical patent/GB9213630D0/en
Publication of GB2256279A publication Critical patent/GB2256279A/en
Application granted granted Critical
Publication of GB2256279B publication Critical patent/GB2256279B/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/70—Masking faults in memories by using spares or by reconfiguring
    • G11C29/78—Masking faults in memories by using spares or by reconfiguring using programmable devices
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
    • G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
    • G11C29/18—Address generation devices; Devices for accessing memories, e.g. details of addressing circuits
    • G11C29/26—Accessing multiple arrays
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
    • G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
    • G11C29/38—Response verification devices
GB9213630A 1988-08-30 1992-06-26 Semiconductor memory device Expired - Lifetime GB2256279B (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP21710988 1988-08-30
JP1137972A JPH0748319B2 (en) 1988-08-30 1989-05-31 Semiconductor memory device
GB8918830A GB2222461B (en) 1988-08-30 1989-08-17 On chip testing of semiconductor memory devices

Publications (3)

Publication Number Publication Date
GB9213630D0 GB9213630D0 (en) 1992-08-12
GB2256279A GB2256279A (en) 1992-12-02
GB2256279B true GB2256279B (en) 1993-05-12

Family

ID=27264642

Family Applications (2)

Application Number Title Priority Date Filing Date
GB9213630A Expired - Lifetime GB2256279B (en) 1988-08-30 1992-06-26 Semiconductor memory device
GB9223130A Expired - Lifetime GB2259594B (en) 1988-08-30 1992-11-04 Semiconductor memory device

Family Applications After (1)

Application Number Title Priority Date Filing Date
GB9223130A Expired - Lifetime GB2259594B (en) 1988-08-30 1992-11-04 Semiconductor memory device

Country Status (1)

Country Link
GB (2) GB2256279B (en)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR940006676B1 (en) * 1991-10-14 1994-07-25 삼성전자 주식회사 Semiconductor ic having test cirucit for memory
KR100212420B1 (en) * 1995-09-25 1999-08-02 김영환 Cash static ram having a test circuit
KR100197554B1 (en) * 1995-09-30 1999-06-15 윤종용 Speedy test method of semiconductor memory device
JPH09161476A (en) * 1995-10-04 1997-06-20 Toshiba Corp Semiconductor memory, its testing circuit and data transfer system
KR100494281B1 (en) * 1996-10-31 2005-08-05 텍사스 인스트루먼츠 인코포레이티드 Integrated circuit memory device having current-mode data compression test mode

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0262867A2 (en) * 1986-10-02 1988-04-06 AT&T Corp. Integrated circuit with memory self-test

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0262867A2 (en) * 1986-10-02 1988-04-06 AT&T Corp. Integrated circuit with memory self-test

Also Published As

Publication number Publication date
GB9213630D0 (en) 1992-08-12
GB2259594B (en) 1993-06-30
GB2256279A (en) 1992-12-02
GB9223130D0 (en) 1992-12-16
GB2259594A (en) 1993-03-17

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Legal Events

Date Code Title Description
746 Register noted 'licences of right' (sect. 46/1977)

Effective date: 19950809

PE20 Patent expired after termination of 20 years

Expiry date: 20090816