GB9112136D0 - Semiconductor memory device and the fabrication method therefor - Google Patents

Semiconductor memory device and the fabrication method therefor

Info

Publication number
GB9112136D0
GB9112136D0 GB919112136A GB9112136A GB9112136D0 GB 9112136 D0 GB9112136 D0 GB 9112136D0 GB 919112136 A GB919112136 A GB 919112136A GB 9112136 A GB9112136 A GB 9112136A GB 9112136 D0 GB9112136 D0 GB 9112136D0
Authority
GB
United Kingdom
Prior art keywords
memory device
semiconductor memory
method therefor
fabrication method
fabrication
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
GB919112136A
Other versions
GB2253937A (en
GB2253937B (en
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Samsung Electronics Co Ltd
Original Assignee
Samsung Electronics Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Samsung Electronics Co Ltd filed Critical Samsung Electronics Co Ltd
Publication of GB9112136D0 publication Critical patent/GB9112136D0/en
Publication of GB2253937A publication Critical patent/GB2253937A/en
Application granted granted Critical
Publication of GB2253937B publication Critical patent/GB2253937B/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10B—ELECTRONIC MEMORY DEVICES
    • H10B12/00—Dynamic random access memory [DRAM] devices
    • H10B12/30—DRAM devices comprising one-transistor - one-capacitor [1T-1C] memory cells
    • H10B12/31—DRAM devices comprising one-transistor - one-capacitor [1T-1C] memory cells having a storage electrode stacked over the transistor
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/02—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers
    • H01L27/04—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body
    • H01L27/10—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body including a plurality of individual components in a repetitive configuration
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10B—ELECTRONIC MEMORY DEVICES
    • H10B12/00—Dynamic random access memory [DRAM] devices
    • H10B12/30—DRAM devices comprising one-transistor - one-capacitor [1T-1C] memory cells

Landscapes

  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Semiconductor Memories (AREA)
  • Metal-Oxide And Bipolar Metal-Oxide Semiconductor Integrated Circuits (AREA)
GB9112136A 1991-03-20 1991-06-05 Semiconductor memory device and the fabrication method therefor Expired - Lifetime GB2253937B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR1019910004394A KR940000510B1 (en) 1991-03-20 1991-03-20 Semiconductor memory device and fabricating method thereof

Publications (3)

Publication Number Publication Date
GB9112136D0 true GB9112136D0 (en) 1991-07-24
GB2253937A GB2253937A (en) 1992-09-23
GB2253937B GB2253937B (en) 1995-10-25

Family

ID=19312269

Family Applications (1)

Application Number Title Priority Date Filing Date
GB9112136A Expired - Lifetime GB2253937B (en) 1991-03-20 1991-06-05 Semiconductor memory device and the fabrication method therefor

Country Status (7)

Country Link
JP (1) JP2564712B2 (en)
KR (1) KR940000510B1 (en)
DE (1) DE4117703C2 (en)
FR (1) FR2674373B1 (en)
GB (1) GB2253937B (en)
IT (1) IT1247968B (en)
TW (1) TW199236B (en)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6258671B1 (en) 1997-05-13 2001-07-10 Micron Technology, Inc. Methods of providing spacers over conductive line sidewalls, methods of forming sidewall spacers over etched line sidewalls, and methods of forming conductive lines
DE10121011B4 (en) * 2001-04-28 2004-11-04 Infineon Technologies Ag Process for maskless contact hole doping in DRAMs / eDRAMs and memory chip produced accordingly

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4364075A (en) * 1980-09-02 1982-12-14 Intel Corporation CMOS Dynamic RAM cell and method of fabrication
JPS60164570A (en) * 1984-02-06 1985-08-27 株式会社東芝 Door lock apparatus
JPS61156962A (en) * 1984-12-27 1986-07-16 Nec Corp Electronic private branch exchange system
JPS61156862A (en) * 1984-12-28 1986-07-16 Toshiba Corp Semiconductor memory device
JPS61218165A (en) * 1985-03-25 1986-09-27 Hitachi Ltd Semiconductor memory and manufacture thereof
JPH0821682B2 (en) * 1987-04-24 1996-03-04 株式会社日立製作所 Method for manufacturing semiconductor device
JP2810042B2 (en) * 1987-09-16 1998-10-15 株式会社日立製作所 Semiconductor integrated circuit device
JPH01231364A (en) * 1988-03-11 1989-09-14 Hitachi Ltd Semiconductor integrated circuit device
JPH0821687B2 (en) * 1989-05-31 1996-03-04 富士通株式会社 Semiconductor device and manufacturing method thereof
JP2673385B2 (en) * 1989-10-26 1997-11-05 三菱電機株式会社 Semiconductor device
DE4034169C2 (en) * 1989-10-26 1994-05-19 Mitsubishi Electric Corp DRAM with a memory cell array and manufacturing method therefor

Also Published As

Publication number Publication date
JPH04320059A (en) 1992-11-10
ITMI911513A0 (en) 1991-06-04
GB2253937A (en) 1992-09-23
FR2674373A1 (en) 1992-09-25
DE4117703A1 (en) 1992-09-24
JP2564712B2 (en) 1996-12-18
TW199236B (en) 1993-02-01
DE4117703C2 (en) 1994-12-22
GB2253937B (en) 1995-10-25
KR920018890A (en) 1992-10-22
KR940000510B1 (en) 1994-01-21
ITMI911513A1 (en) 1992-12-04
FR2674373B1 (en) 2001-07-06
IT1247968B (en) 1995-01-05

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Legal Events

Date Code Title Description
PE20 Patent expired after termination of 20 years

Expiry date: 20110604