GB902868A - Improvements in or relating to the testing of electric lamp circuits - Google Patents

Improvements in or relating to the testing of electric lamp circuits

Info

Publication number
GB902868A
GB902868A GB5059/60A GB505960A GB902868A GB 902868 A GB902868 A GB 902868A GB 5059/60 A GB5059/60 A GB 5059/60A GB 505960 A GB505960 A GB 505960A GB 902868 A GB902868 A GB 902868A
Authority
GB
United Kingdom
Prior art keywords
testing
relating
electric lamp
lamp circuits
lamps
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
GB5059/60A
Inventor
William Norman Allwood
John Arthur Morffew
Lawrence Reginald Corke
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
General Electric Co PLC
Original Assignee
General Electric Co PLC
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by General Electric Co PLC filed Critical General Electric Co PLC
Priority to GB5059/60A priority Critical patent/GB902868A/en
Publication of GB902868A publication Critical patent/GB902868A/en
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/44—Testing lamps
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices
    • G01R31/2607—Circuits therefor
    • G01R31/2632—Circuits therefor for testing diodes
    • G01R31/2635—Testing light-emitting diodes, laser diodes or photodiodes
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05B—ELECTRIC HEATING; ELECTRIC LIGHT SOURCES NOT OTHERWISE PROVIDED FOR; CIRCUIT ARRANGEMENTS FOR ELECTRIC LIGHT SOURCES, IN GENERAL
    • H05B39/00—Circuit arrangements or apparatus for operating incandescent light sources
    • H05B39/10—Circuits providing for substitution of the light source in case of its failure
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05B—ELECTRIC HEATING; ELECTRIC LIGHT SOURCES NOT OTHERWISE PROVIDED FOR; CIRCUIT ARRANGEMENTS FOR ELECTRIC LIGHT SOURCES, IN GENERAL
    • H05B47/00—Circuit arrangements for operating light sources in general, i.e. where the type of light source is not relevant
    • H05B47/20—Responsive to malfunctions or to light source life; for protection
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05B—ELECTRIC HEATING; ELECTRIC LIGHT SOURCES NOT OTHERWISE PROVIDED FOR; CIRCUIT ARRANGEMENTS FOR ELECTRIC LIGHT SOURCES, IN GENERAL
    • H05B47/00—Circuit arrangements for operating light sources in general, i.e. where the type of light source is not relevant
    • H05B47/20—Responsive to malfunctions or to light source life; for protection
    • H05B47/23—Responsive to malfunctions or to light source life; for protection of two or more light sources connected in series

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)

Abstract

902,868. Testing for continuity. GENERAL ELECTRIC CO. Ltd. Jan. 10, 1961 [Feb. 12, 1960], No. 5059/60. Class 37. A series of lamps L in holders H can be tested for a disconnection (including a faulty filament) by commoning the terminals 6 in a plug and socket arrangement 10 and connecting them to one side of a supply source 4, the other supply terminal of the source being connected to a thin resilient probe 12 which can be inserted between a lamp and its holder to make a contact. A resistor 8 approximately equal in value to the resistance of the lamps may be connected on either side of the test supply.
GB5059/60A 1960-02-12 1960-02-12 Improvements in or relating to the testing of electric lamp circuits Expired GB902868A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
GB5059/60A GB902868A (en) 1960-02-12 1960-02-12 Improvements in or relating to the testing of electric lamp circuits

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
GB5059/60A GB902868A (en) 1960-02-12 1960-02-12 Improvements in or relating to the testing of electric lamp circuits

Publications (1)

Publication Number Publication Date
GB902868A true GB902868A (en) 1962-08-09

Family

ID=9788993

Family Applications (1)

Application Number Title Priority Date Filing Date
GB5059/60A Expired GB902868A (en) 1960-02-12 1960-02-12 Improvements in or relating to the testing of electric lamp circuits

Country Status (1)

Country Link
GB (1) GB902868A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN115792557A (en) * 2023-02-03 2023-03-14 苏州联讯仪器股份有限公司 Probe installation structure for wafer-level reliability test and reliability test system

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN115792557A (en) * 2023-02-03 2023-03-14 苏州联讯仪器股份有限公司 Probe installation structure for wafer-level reliability test and reliability test system

Similar Documents

Publication Publication Date Title
GB1298350A (en) Automatic testing apparatus for a multiconductor electric cable
US4082995A (en) Circuit tester with reliable indication means
US3798540A (en) Electrical grounding and insulation resistance tester
US3768089A (en) Jack strip gage
GB807544A (en) Improvements in or relating to instruments for testing for earthing faults in electric circuits
US2705773A (en) Multipurpose circuit tester
US2548991A (en) Electrical circuit tester
US2155778A (en) Bulb and battery tester
GB902868A (en) Improvements in or relating to the testing of electric lamp circuits
US3922507A (en) Distributing terminal assembly test apparatus
GB695292A (en) Improvements in or relating to the testing of thermionic valves
GB1475810A (en) Testing an electrical supply installation
GB915706A (en) Electrical test probe receptacles
US4107602A (en) Probe means utilized with a pair of indicators for testing the wiring connections of a fuse receptacle
ES284184A1 (en) Improvements in connection plates with coupling for electrical measurement (Machine-translation by Google Translate, not legally binding)
US1912185A (en) Electrical testing apparatus
US2233646A (en) Interconnectible portable indicating instruments
US3323041A (en) Apparatus having a pair of lamp indicators and terminal means for insertion into a standard electrical outlet to test for line voltage, short circuits, polarity and the like
GB1304173A (en)
GB693253A (en) Improvements in or relating to electrical testing devices
GB1411599A (en) Device for making and testing electrical connections
JPS6454267A (en) Contact probe
GB1587043A (en) Multi-purpose test set for electrical appliances
GB492058A (en) Improvements in or relating to adaptors for use in connection with electrical couplings of the plug-and-socket-type
GB1176983A (en) Tell-Tale Apparatus for Use in Conjunction with Electrical Appliances