GB9012833D0 - Testing a memory device - Google Patents

Testing a memory device

Info

Publication number
GB9012833D0
GB9012833D0 GB909012833A GB9012833A GB9012833D0 GB 9012833 D0 GB9012833 D0 GB 9012833D0 GB 909012833 A GB909012833 A GB 909012833A GB 9012833 A GB9012833 A GB 9012833A GB 9012833 D0 GB9012833 D0 GB 9012833D0
Authority
GB
United Kingdom
Prior art keywords
testing
memory device
memory
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
GB909012833A
Other versions
GB2235074A (en
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Samsung Electronics Co Ltd
Original Assignee
Samsung Electronics Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Samsung Electronics Co Ltd filed Critical Samsung Electronics Co Ltd
Publication of GB9012833D0 publication Critical patent/GB9012833D0/en
Publication of GB2235074A publication Critical patent/GB2235074A/en
Withdrawn legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
    • G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
    • G11C29/18—Address generation devices; Devices for accessing memories, e.g. details of addressing circuits
    • G11C29/30—Accessing single arrays
    • G11C29/32—Serial access; Scan testing
GB9012833A 1989-06-10 1990-06-08 Testing a memory device Withdrawn GB2235074A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR1019890008001A KR920001079B1 (en) 1989-06-10 1989-06-10 Method which tests memory material

Publications (2)

Publication Number Publication Date
GB9012833D0 true GB9012833D0 (en) 1990-08-01
GB2235074A GB2235074A (en) 1991-02-20

Family

ID=19286969

Family Applications (1)

Application Number Title Priority Date Filing Date
GB9012833A Withdrawn GB2235074A (en) 1989-06-10 1990-06-08 Testing a memory device

Country Status (4)

Country Link
JP (1) JPH0312099A (en)
KR (1) KR920001079B1 (en)
DE (1) DE4018438C2 (en)
GB (1) GB2235074A (en)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5790559A (en) * 1996-03-29 1998-08-04 Advantest Corporation Semiconductor memory testing apparatus
DE19930169B4 (en) * 1999-06-30 2004-09-30 Infineon Technologies Ag Test device and method for testing a memory
DE10139724B4 (en) 2001-08-13 2004-04-08 Infineon Technologies Ag Integrated dynamic memory with memory cells in several memory banks and method for operating such a memory
DE102004040799A1 (en) * 2004-08-23 2006-03-09 Infineon Technologies Ag Computer memory chip testing method in which an external test unit is used and test data written to reference and test registers prior to a bit by bit comparison of the two
KR100825013B1 (en) * 2006-09-28 2008-04-24 주식회사 하이닉스반도체 Semiconductor device for command test of package level
CN110501554B (en) * 2019-08-15 2022-04-26 苏州浪潮智能科技有限公司 Detection method and device for installation of memory chip

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3961252A (en) * 1974-12-20 1976-06-01 International Business Machines Corporation Testing embedded arrays
EP0096030B1 (en) * 1981-12-17 1988-09-21 International Business Machines Corporation Apparatus for high speed fault mapping of large memories
JPS59121687A (en) * 1982-12-27 1984-07-13 Fujitsu Ltd Method for testing bubble memory element
NO843375L (en) * 1983-10-06 1985-04-09 Honeywell Inf Systems DATA PROCESSING SYSTEM AND PROCEDURE FOR MAINTENANCE AND REQUEST
EP0350538B1 (en) * 1988-07-13 1993-12-01 Koninklijke Philips Electronics N.V. Memory device containing a static RAM memory that is adapted for executing a self-test, and integrated circuit containing such a device as an embedded static RAM memory

Also Published As

Publication number Publication date
DE4018438A1 (en) 1991-01-24
DE4018438C2 (en) 1995-10-19
GB2235074A (en) 1991-02-20
JPH0312099A (en) 1991-01-21
KR910001778A (en) 1991-01-31
KR920001079B1 (en) 1992-02-01

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Legal Events

Date Code Title Description
WAP Application withdrawn, taken to be withdrawn or refused ** after publication under section 16(1)