GB874349A - Improvements in or relating to semiconductor devices - Google Patents
Improvements in or relating to semiconductor devicesInfo
- Publication number
- GB874349A GB874349A GB18357/59A GB1835759A GB874349A GB 874349 A GB874349 A GB 874349A GB 18357/59 A GB18357/59 A GB 18357/59A GB 1835759 A GB1835759 A GB 1835759A GB 874349 A GB874349 A GB 874349A
- Authority
- GB
- United Kingdom
- Prior art keywords
- oxide
- wax
- wafer
- junction
- acid
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 239000004065 semiconductor Substances 0.000 title abstract 3
- 239000001993 wax Substances 0.000 abstract 5
- KRHYYFGTRYWZRS-UHFFFAOYSA-N Fluorane Chemical compound F KRHYYFGTRYWZRS-UHFFFAOYSA-N 0.000 abstract 4
- 239000011248 coating agent Substances 0.000 abstract 4
- 238000000576 coating method Methods 0.000 abstract 4
- QTBSBXVTEAMEQO-UHFFFAOYSA-N Acetic acid Chemical compound CC(O)=O QTBSBXVTEAMEQO-UHFFFAOYSA-N 0.000 abstract 3
- 239000002253 acid Substances 0.000 abstract 2
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 abstract 2
- 238000010438 heat treatment Methods 0.000 abstract 2
- 238000000034 method Methods 0.000 abstract 2
- 229910052760 oxygen Inorganic materials 0.000 abstract 2
- 239000001301 oxygen Substances 0.000 abstract 2
- 229910011255 B2O3 Inorganic materials 0.000 abstract 1
- ZOXJGFHDIHLPTG-UHFFFAOYSA-N Boron Chemical compound [B] ZOXJGFHDIHLPTG-UHFFFAOYSA-N 0.000 abstract 1
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 abstract 1
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 abstract 1
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 abstract 1
- KGBXLFKZBHKPEV-UHFFFAOYSA-N boric acid Chemical compound OB(O)O KGBXLFKZBHKPEV-UHFFFAOYSA-N 0.000 abstract 1
- 239000004327 boric acid Substances 0.000 abstract 1
- 229910052796 boron Inorganic materials 0.000 abstract 1
- 229910052802 copper Inorganic materials 0.000 abstract 1
- 239000010949 copper Substances 0.000 abstract 1
- 238000000151 deposition Methods 0.000 abstract 1
- JKWMSGQKBLHBQQ-UHFFFAOYSA-N diboron trioxide Chemical compound O=BOB=O JKWMSGQKBLHBQQ-UHFFFAOYSA-N 0.000 abstract 1
- 238000000866 electrolytic etching Methods 0.000 abstract 1
- 238000005530 etching Methods 0.000 abstract 1
- 230000008020 evaporation Effects 0.000 abstract 1
- 238000001704 evaporation Methods 0.000 abstract 1
- 238000007654 immersion Methods 0.000 abstract 1
- WABPQHHGFIMREM-UHFFFAOYSA-N lead(0) Chemical compound [Pb] WABPQHHGFIMREM-UHFFFAOYSA-N 0.000 abstract 1
- 230000003287 optical effect Effects 0.000 abstract 1
- 239000012188 paraffin wax Substances 0.000 abstract 1
- 230000000149 penetrating effect Effects 0.000 abstract 1
- 238000009958 sewing Methods 0.000 abstract 1
- 229910052710 silicon Inorganic materials 0.000 abstract 1
- 239000010703 silicon Substances 0.000 abstract 1
- 229910052814 silicon oxide Inorganic materials 0.000 abstract 1
- 238000005507 spraying Methods 0.000 abstract 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/28—Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection
- H01L23/29—Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection characterised by the material, e.g. carbon
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02107—Forming insulating materials on a substrate
- H01L21/02225—Forming insulating materials on a substrate characterised by the process for the formation of the insulating layer
- H01L21/02227—Forming insulating materials on a substrate characterised by the process for the formation of the insulating layer formation by a process other than a deposition process
- H01L21/0223—Forming insulating materials on a substrate characterised by the process for the formation of the insulating layer formation by a process other than a deposition process formation by oxidation, e.g. oxidation of the substrate
- H01L21/02233—Forming insulating materials on a substrate characterised by the process for the formation of the insulating layer formation by a process other than a deposition process formation by oxidation, e.g. oxidation of the substrate of the semiconductor substrate or a semiconductor layer
- H01L21/02236—Forming insulating materials on a substrate characterised by the process for the formation of the insulating layer formation by a process other than a deposition process formation by oxidation, e.g. oxidation of the substrate of the semiconductor substrate or a semiconductor layer group IV semiconductor
- H01L21/02238—Forming insulating materials on a substrate characterised by the process for the formation of the insulating layer formation by a process other than a deposition process formation by oxidation, e.g. oxidation of the substrate of the semiconductor substrate or a semiconductor layer group IV semiconductor silicon in uncombined form, i.e. pure silicon
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02107—Forming insulating materials on a substrate
- H01L21/02225—Forming insulating materials on a substrate characterised by the process for the formation of the insulating layer
- H01L21/02227—Forming insulating materials on a substrate characterised by the process for the formation of the insulating layer formation by a process other than a deposition process
- H01L21/02255—Forming insulating materials on a substrate characterised by the process for the formation of the insulating layer formation by a process other than a deposition process formation by thermal treatment
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/185—Joining of semiconductor bodies for junction formation
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
- H01L21/31—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to form insulating layers thereon, e.g. for masking or by using photolithographic techniques; After treatment of these layers; Selection of materials for these layers
- H01L21/3105—After-treatment
- H01L21/311—Etching the insulating layers by chemical or physical means
- H01L21/31144—Etching the insulating layers by chemical or physical means using masks
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/28—Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection
- H01L23/29—Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection characterised by the material, e.g. carbon
- H01L23/293—Organic, e.g. plastic
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/0001—Technical content checked by a classifier
- H01L2924/0002—Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00
Landscapes
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Computer Hardware Design (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Ceramic Engineering (AREA)
- Weting (AREA)
- Mechanical Treatment Of Semiconductor (AREA)
Abstract
874,349. Semiconductor devices. STANDARD TELEPHONES & CABLES Ltd. May 27, 1960 [May 29, 1959], No. 18357/59. Class 37. A very small PN junction is made in a semiconductor wafer 1 by providing the wafer with both an oxide and a wax coating, positioning the wax to expose a small area of oxide, removing the exposed oxide and forming the PN junction in the exposed area. Fig. 1 (a) shows a silicon wafer which has been polished mechanically and on which is formed an oxide layer by heating the wafer in an atmosphere containing oxygen. The coating thickness is about 5000 Š and is determined by optical interference methods. The slice is coated with paraffin wax 3 (Fig. 1 (c)). A sewing needle of .018 inches diameter then punctures the wax 3 (Fig. 1 (d)) under spring control so that the wafer is not damaged. The oxide coating below the puncture is then removed by a hydrofluoric acid etch (Fig. 1 (e).), the size of the junction being determined not by the needle area but by the etching period. The remainder of the wax film is removed (Fig. 1 (f)) and the junction is formed by depositing a layer of boric acid 4 (Fig. 1 (g)) on the oxide and heating it for 1¢ hours at 1220‹ C. in an atmosphere of wet oxygen. Boron diffuses into the wafer to form the junction (Fig. 1 (h)) and electrical contact is made by evaporation of copper to which a lead wire may be soldered. The rest of the boric oxide and silicon oxide are removed by a hydrofluoric acid wash (Fig. 1 (i)). The oxide coating may be produced by an electrolytic etching process using acetic acid and can be removed by an acid vapour, spraying or floating in acid instead of total immersion. The Specification states that a ring-shaped electrode might be made by penetrating the wax with a thin-walled tube.
Priority Applications (7)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
BE570279D BE570279A (en) | 1957-08-12 | ||
GB25388/57A GB815699A (en) | 1959-05-29 | 1957-08-12 | Improvements in or relating to semi-conductor devices and methods of manufacture thereof |
CH6203858A CH365804A (en) | 1957-08-12 | 1958-07-22 | Semiconductor device with at least one junction between zones of different conductivity types |
FR1212132D FR1212132A (en) | 1957-08-12 | 1958-08-11 | Improvements in Junction Semiconductor Devices and Method of Making Them |
GB18357/59A GB874349A (en) | 1957-08-12 | 1959-05-29 | Improvements in or relating to semiconductor devices |
FR824364A FR77527E (en) | 1957-08-12 | 1960-04-14 | Improvements in Junction Semiconductor Devices and Method of Making Them |
FR828393A FR77789E (en) | 1957-08-12 | 1960-05-27 | Improvements in Junction Semiconductor Devices and Method of Making Them |
Applications Claiming Priority (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
GB25388/57A GB815699A (en) | 1959-05-29 | 1957-08-12 | Improvements in or relating to semi-conductor devices and methods of manufacture thereof |
GB12744/59A GB870599A (en) | 1959-04-15 | 1959-04-15 | Improvements in or relating to semi-conductor crystal rectifiers and methods of manufacture thereof |
GB18357/59A GB874349A (en) | 1957-08-12 | 1959-05-29 | Improvements in or relating to semiconductor devices |
FR824364A FR77527E (en) | 1957-08-12 | 1960-04-14 | Improvements in Junction Semiconductor Devices and Method of Making Them |
Publications (1)
Publication Number | Publication Date |
---|---|
GB874349A true GB874349A (en) | 1961-08-02 |
Family
ID=62527908
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
GB18357/59A Expired GB874349A (en) | 1957-08-12 | 1959-05-29 | Improvements in or relating to semiconductor devices |
Country Status (4)
Country | Link |
---|---|
BE (1) | BE570279A (en) |
CH (1) | CH365804A (en) |
FR (2) | FR1212132A (en) |
GB (1) | GB874349A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE1225304B (en) * | 1961-11-16 | 1966-09-22 | Telefunken Patent | Diffusion process for manufacturing a semiconductor component |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
NL295980A (en) * | 1962-07-31 | |||
US3475660A (en) * | 1967-12-01 | 1969-10-28 | Int Rectifier Corp | Hollow cylindrical semiconductor device |
-
0
- BE BE570279D patent/BE570279A/xx unknown
-
1958
- 1958-07-22 CH CH6203858A patent/CH365804A/en unknown
- 1958-08-11 FR FR1212132D patent/FR1212132A/en not_active Expired
-
1959
- 1959-05-29 GB GB18357/59A patent/GB874349A/en not_active Expired
-
1960
- 1960-04-14 FR FR824364A patent/FR77527E/en not_active Expired
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE1225304B (en) * | 1961-11-16 | 1966-09-22 | Telefunken Patent | Diffusion process for manufacturing a semiconductor component |
Also Published As
Publication number | Publication date |
---|---|
BE570279A (en) | 1900-01-01 |
CH365804A (en) | 1962-11-30 |
FR1212132A (en) | 1960-03-22 |
FR77527E (en) | 1962-03-16 |
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