GB8628900D0 - Specimen chamber - Google Patents
Specimen chamberInfo
- Publication number
- GB8628900D0 GB8628900D0 GB868628900A GB8628900A GB8628900D0 GB 8628900 D0 GB8628900 D0 GB 8628900D0 GB 868628900 A GB868628900 A GB 868628900A GB 8628900 A GB8628900 A GB 8628900A GB 8628900 D0 GB8628900 D0 GB 8628900D0
- Authority
- GB
- United Kingdom
- Prior art keywords
- specimen chamber
- specimen
- chamber
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/02—Details
- H01J37/20—Means for supporting or positioning the objects or the material; Means for adjusting diaphragms or lenses associated with the support
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/26—Electron or ion microscopes; Electron or ion diffraction tubes
- H01J37/28—Electron or ion microscopes; Electron or ion diffraction tubes with scanning beams
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
- H01J2237/20—Positioning, supporting, modifying or maintaining the physical state of objects being observed or treated
- H01J2237/2002—Controlling environment of sample
- H01J2237/2003—Environmental cells
Landscapes
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
EP19870901437 EP0263839A1 (en) | 1986-02-18 | 1987-02-16 | Specimen chamber for scanning electron beam instruments |
PCT/EP1987/000077 WO1987005150A1 (en) | 1986-02-18 | 1987-02-16 | Specimen chamber for scanning electron beam instruments |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
GB868604004A GB8604004D0 (en) | 1986-02-18 | 1986-02-18 | Specimen chamber |
Publications (3)
Publication Number | Publication Date |
---|---|
GB8628900D0 true GB8628900D0 (en) | 1987-01-07 |
GB2186737A GB2186737A (en) | 1987-08-19 |
GB2186737B GB2186737B (en) | 1990-07-04 |
Family
ID=10593271
Family Applications (2)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
GB868604004A Pending GB8604004D0 (en) | 1986-02-18 | 1986-02-18 | Specimen chamber |
GB8628900A Expired - Fee Related GB2186737B (en) | 1986-02-18 | 1986-12-03 | Improvements relating to specimen chambers for scanning electron beam instruments |
Family Applications Before (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
GB868604004A Pending GB8604004D0 (en) | 1986-02-18 | 1986-02-18 | Specimen chamber |
Country Status (1)
Country | Link |
---|---|
GB (2) | GB8604004D0 (en) |
Families Citing this family (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0324213A1 (en) * | 1988-01-12 | 1989-07-19 | Electro-Scan Corporation | Scanning electron microscope for visualization of wet samples |
US4880976A (en) * | 1987-05-21 | 1989-11-14 | Electroscan Corporation | Secondary electron detector for use in a gaseous atmosphere |
US5250808A (en) * | 1987-05-21 | 1993-10-05 | Electroscan Corporation | Integrated electron optical/differential pumping/imaging signal system for an environmental scanning electron microscope |
US4897545A (en) * | 1987-05-21 | 1990-01-30 | Electroscan Corporation | Electron detector for use in a gaseous environment |
US5362964A (en) * | 1993-07-30 | 1994-11-08 | Electroscan Corporation | Environmental scanning electron microscope |
US5412211A (en) * | 1993-07-30 | 1995-05-02 | Electroscan Corporation | Environmental scanning electron microscope |
GB9916804D0 (en) * | 1999-07-16 | 1999-09-22 | Shah Jitendra S | Scanning beam instruments |
US6674076B1 (en) * | 2002-12-12 | 2004-01-06 | Ballard Power Systems Inc. | Humidified imaging with an environmental scanning electron microscope |
US8921811B2 (en) * | 2007-02-06 | 2014-12-30 | Fei Company | High pressure charged particle beam system |
US9679741B2 (en) | 2010-11-09 | 2017-06-13 | Fei Company | Environmental cell for charged particle beam system |
EP2838108A1 (en) * | 2013-08-12 | 2015-02-18 | Fei Company | Method of using an environmental transmission electron microscope |
Family Cites Families (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE2005682C3 (en) * | 1970-02-07 | 1974-05-09 | Siemens Ag, 1000 Berlin Und 8000 Muenchen | Device for extracting the secondary electrons in a scanning electron microscope or an electron beam microanalyser |
-
1986
- 1986-02-18 GB GB868604004A patent/GB8604004D0/en active Pending
- 1986-12-03 GB GB8628900A patent/GB2186737B/en not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
GB2186737A (en) | 1987-08-19 |
GB8604004D0 (en) | 1986-03-26 |
GB2186737B (en) | 1990-07-04 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
732 | Registration of transactions, instruments or events in the register (sect. 32/1977) | ||
PCNP | Patent ceased through non-payment of renewal fee |
Effective date: 20051203 |