GB9916804D0 - Scanning beam instruments - Google Patents
Scanning beam instrumentsInfo
- Publication number
- GB9916804D0 GB9916804D0 GBGB9916804.9A GB9916804A GB9916804D0 GB 9916804 D0 GB9916804 D0 GB 9916804D0 GB 9916804 A GB9916804 A GB 9916804A GB 9916804 D0 GB9916804 D0 GB 9916804D0
- Authority
- GB
- United Kingdom
- Prior art keywords
- scanning beam
- beam instruments
- instruments
- scanning
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Ceased
Links
Priority Applications (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
GBGB9916804.9A GB9916804D0 (en) | 1999-07-16 | 1999-07-16 | Scanning beam instruments |
AU61675/00A AU6167500A (en) | 1999-07-16 | 2000-07-12 | Scanning beam instruments |
PCT/GB2000/002676 WO2001006536A2 (en) | 1999-07-16 | 2000-07-12 | Scanning beam instruments |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
GBGB9916804.9A GB9916804D0 (en) | 1999-07-16 | 1999-07-16 | Scanning beam instruments |
Publications (1)
Publication Number | Publication Date |
---|---|
GB9916804D0 true GB9916804D0 (en) | 1999-09-22 |
Family
ID=10857436
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
GBGB9916804.9A Ceased GB9916804D0 (en) | 1999-07-16 | 1999-07-16 | Scanning beam instruments |
Country Status (3)
Country | Link |
---|---|
AU (1) | AU6167500A (en) |
GB (1) | GB9916804D0 (en) |
WO (1) | WO2001006536A2 (en) |
Family Cites Families (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS59127353A (en) * | 1983-01-10 | 1984-07-23 | Jeol Ltd | Secondary electron detecting system in ion beam apparatus |
GB8604004D0 (en) * | 1986-02-18 | 1986-03-26 | Cambridge Instr Ltd | Specimen chamber |
US4983833A (en) * | 1988-11-21 | 1991-01-08 | Siemens Aktiengesellschaft | Device for the detecting of charged secondary particles |
JP2794471B2 (en) * | 1989-11-24 | 1998-09-03 | 日本電子テクニクス株式会社 | electronic microscope |
JP3081393B2 (en) * | 1992-10-15 | 2000-08-28 | 株式会社日立製作所 | Scanning electron microscope |
JPH08279346A (en) * | 1995-04-05 | 1996-10-22 | Jeol Ltd | Scanning type electron microscope |
JPH09293479A (en) * | 1996-04-26 | 1997-11-11 | Shimadzu Corp | Electron beam analyzing device |
US6005247A (en) * | 1997-10-01 | 1999-12-21 | Intevac, Inc. | Electron beam microscope using electron beam patterns |
JP4176159B2 (en) * | 1997-12-08 | 2008-11-05 | エフ イー アイ カンパニ | Environmentally controlled SEM using magnetic field for improved secondary electron detection |
-
1999
- 1999-07-16 GB GBGB9916804.9A patent/GB9916804D0/en not_active Ceased
-
2000
- 2000-07-12 AU AU61675/00A patent/AU6167500A/en not_active Abandoned
- 2000-07-12 WO PCT/GB2000/002676 patent/WO2001006536A2/en active Application Filing
Also Published As
Publication number | Publication date |
---|---|
AU6167500A (en) | 2001-02-05 |
WO2001006536A2 (en) | 2001-01-25 |
WO2001006536A3 (en) | 2002-01-31 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
AT | Applications terminated before publication under section 16(1) |