GB836805A - Improved circuit arrangement for detecting faults in three-phase systems - Google Patents

Improved circuit arrangement for detecting faults in three-phase systems

Info

Publication number
GB836805A
GB836805A GB19904/56A GB1990456A GB836805A GB 836805 A GB836805 A GB 836805A GB 19904/56 A GB19904/56 A GB 19904/56A GB 1990456 A GB1990456 A GB 1990456A GB 836805 A GB836805 A GB 836805A
Authority
GB
United Kingdom
Prior art keywords
windings
impulse
star
winding
oscillograph
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
GB19904/56A
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
General Electric Co
Original Assignee
General Electric Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by General Electric Co filed Critical General Electric Co
Publication of GB836805A publication Critical patent/GB836805A/en
Expired legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/50Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
    • G01R31/62Testing of transformers

Landscapes

  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)

Abstract

836,805. Faults testing. GENERAL ELECTRTC CO. June 27, 1956 [June 27, 1955,] No. 19904/56. Class 37. Three-phase star or delta inductively coupled windings are tested for faults by applying impulse waves of opposed (or similar) polarities simultaneously and respectively to a pair of distinct star (or delta) connected windings, and connecting a voltage indicator responsive to the time variation of an impulse to the star point or the free end of the third winding of a star connected system; or alternatively to the corresponding secondary windings inductively coupled to the impulsed primary windings; so as to respond to the algebraic sum of the impulses developed in the windings supplied therewith. In Fig. 5, a pair of impulse generators producing equal and oppositely poled impulses rising from zero to peak in 1.5 microsec. and falling to peak/2 in 40 microsec. are simultaneously triggered from a synchronizing network to energize primary windings 2, 3 of a 3-phase transformer, whose primary winding 4 is isolated from ground while the star point is grounded over a capacitance 12 shunted by resistance 10 across a cathode-ray oscillograph displaying the profile of the output impulse. In absence of winding faults, the latter as shown at 22 in Fig. 6, lies substantially on the zero axis due to the balance between input impulses and the excited windings, while a single shorted turn in either impulsed winding produces an output pulse as shown at 23. When the star point is inaccessible, the shunted oscillograph is connected between the free end of winding 4 and ground (Fig. 7, not shown), displaying no fault and single shorted turn output impulses as before (Fig. 8, not shown). The shunting impedances enable display sensitivity to be adjusted and may be removed if necessary, and the remaining winding 4 may be tested similarly by impulsing it together with widing 2 or 3. In testing delta connected transformers (Fig. 11), a negative impulse is applied to the common end of windings 31, 33 and the junctions of windings 31, 32 and 32, 33 are grounded over equal impedances 47, while the junction of the delta secondary windings 311, 331 is grounded and the junctions of windings 31<SP>1</SP>, 321 and 321, 331 are connected to the oscillograph, which displays a zero trace 50 of the output impulse for no fault and a trace 51 for a one-turn short circuit in windings 31, 33 (Fig. 12). When the secondary is star connected (Fig. 13), equal impedances 52 are connected across the ends of windings 31<SP>1</SP>, 331, whose star point is grounded, and the oscillograph is connected between the junction of the impedances and ground; zero output impulse voltage 55 appearing across the oscillograph for no fault, and impulse voltage 56 appearing for a one-turn short circuit in windings 31<SP>1</SP>, 33<SP>1</SP> or 31, 33 (Fig. 14). Specification 627,999 is referred to.
GB19904/56A 1955-06-27 1956-06-27 Improved circuit arrangement for detecting faults in three-phase systems Expired GB836805A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US836805XA 1955-06-27 1955-06-27

Publications (1)

Publication Number Publication Date
GB836805A true GB836805A (en) 1960-06-09

Family

ID=22179988

Family Applications (1)

Application Number Title Priority Date Filing Date
GB19904/56A Expired GB836805A (en) 1955-06-27 1956-06-27 Improved circuit arrangement for detecting faults in three-phase systems

Country Status (1)

Country Link
GB (1) GB836805A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP2664933A1 (en) * 2012-05-15 2013-11-20 Omicron electronics GmbH Test device, test system and method for testing an energy test piece

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP2664933A1 (en) * 2012-05-15 2013-11-20 Omicron electronics GmbH Test device, test system and method for testing an energy test piece
KR101438670B1 (en) * 2012-05-15 2014-09-05 오미크론 일렉트로닉스 게엠바하 Test device, test system and method for testing a power engineering test object
US9366711B2 (en) 2012-05-15 2016-06-14 Omicron Electronics Gmbh Test device, test system and method for testing a power engineering test object

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