GB8334030D0 - Component verifier - Google Patents

Component verifier

Info

Publication number
GB8334030D0
GB8334030D0 GB838334030A GB8334030A GB8334030D0 GB 8334030 D0 GB8334030 D0 GB 8334030D0 GB 838334030 A GB838334030 A GB 838334030A GB 8334030 A GB8334030 A GB 8334030A GB 8334030 D0 GB8334030 D0 GB 8334030D0
Authority
GB
United Kingdom
Prior art keywords
component verifier
verifier
component
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
GB838334030A
Other versions
GB2132777A (en
GB2132777B (en
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
USM Corp
Original Assignee
USM Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by USM Corp filed Critical USM Corp
Publication of GB8334030D0 publication Critical patent/GB8334030D0/en
Publication of GB2132777A publication Critical patent/GB2132777A/en
Application granted granted Critical
Publication of GB2132777B publication Critical patent/GB2132777B/en
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06705—Apparatus for holding or moving single probes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Supply And Installment Of Electrical Components (AREA)
  • Testing Relating To Insulation (AREA)
GB08334030A 1982-12-27 1983-12-21 Testing electric components Expired GB2132777B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US45191782A 1982-12-27 1982-12-27

Publications (3)

Publication Number Publication Date
GB8334030D0 true GB8334030D0 (en) 1984-02-01
GB2132777A GB2132777A (en) 1984-07-11
GB2132777B GB2132777B (en) 1986-09-17

Family

ID=23794246

Family Applications (1)

Application Number Title Priority Date Filing Date
GB08334030A Expired GB2132777B (en) 1982-12-27 1983-12-21 Testing electric components

Country Status (5)

Country Link
JP (1) JPS59133470A (en)
CA (1) CA1215790A (en)
DE (1) DE3346859A1 (en)
FR (1) FR2538559B1 (en)
GB (1) GB2132777B (en)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102013218716A1 (en) 2013-09-18 2015-03-19 Robert Bosch Gmbh Testing device for electrical components
CN111203391A (en) * 2020-01-09 2020-05-29 日照职业技术学院 Stable-transmission automatic testing mechanism for microswitch of assembly line type electromechanical equipment

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB604531A (en) * 1945-11-26 1948-07-06 Percy Archibald Sporing Improvements in or relating to the testing of electrical components in bulk
US3032191A (en) * 1959-04-20 1962-05-01 Sylvania Electric Prod Testing and sorting apparatus
US3017025A (en) * 1960-04-26 1962-01-16 Western Electric Co Apparatus for distributing an article to one of several receiving locations
FR1564588A (en) * 1968-01-29 1969-04-25
US3655041A (en) * 1970-04-23 1972-04-11 Integrated Mechanical Systems Electronic component handler and tester
US3716786A (en) * 1970-10-02 1973-02-13 Cogar Corp Module tester and sorter for use in a module test system
GB1319187A (en) * 1971-07-01 1973-06-06 Itt Electrical component measuring apparatus
US3727757A (en) * 1972-06-12 1973-04-17 C Boissicat Dip handling apparatus
CA1105998A (en) * 1977-11-07 1981-07-28 Stanley R. Vancelette Component testing station
FR2505504A1 (en) * 1981-05-11 1982-11-12 Telecommunications Sa Automatic electronic semiconductor component testing appts. - has rotary part with slot to stop and remove components, and diverter to verify result

Also Published As

Publication number Publication date
FR2538559B1 (en) 1986-09-26
DE3346859A1 (en) 1984-06-28
JPH0417392B2 (en) 1992-03-25
FR2538559A1 (en) 1984-06-29
GB2132777A (en) 1984-07-11
GB2132777B (en) 1986-09-17
JPS59133470A (en) 1984-07-31
CA1215790A (en) 1986-12-23

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Legal Events

Date Code Title Description
732 Registration of transactions, instruments or events in the register (sect. 32/1977)
732 Registration of transactions, instruments or events in the register (sect. 32/1977)
732 Registration of transactions, instruments or events in the register (sect. 32/1977)
PCNP Patent ceased through non-payment of renewal fee