GB2516406B - Spectrometer with built-in ATR and accessory compartment - Google Patents

Spectrometer with built-in ATR and accessory compartment Download PDF

Info

Publication number
GB2516406B
GB2516406B GB1420983.7A GB201420983A GB2516406B GB 2516406 B GB2516406 B GB 2516406B GB 201420983 A GB201420983 A GB 201420983A GB 2516406 B GB2516406 B GB 2516406B
Authority
GB
United Kingdom
Prior art keywords
atr
spectrometer
built
accessory compartment
accessory
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
GB1420983.7A
Other languages
English (en)
Other versions
GB201420983D0 (en
GB2516406A (en
Inventor
s bradley Michael
Izzia Federico
Magie Coffin John
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Thermo Electron Scientific Instruments LLC
Original Assignee
Thermo Electron Scientific Instruments LLC
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Thermo Electron Scientific Instruments LLC filed Critical Thermo Electron Scientific Instruments LLC
Publication of GB201420983D0 publication Critical patent/GB201420983D0/en
Publication of GB2516406A publication Critical patent/GB2516406A/en
Application granted granted Critical
Publication of GB2516406B publication Critical patent/GB2516406B/en
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/55—Specular reflectivity
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02—Details
    • G01J3/0291—Housings; Spectrometer accessories; Spatial arrangement of elements, e.g. folded path arrangements
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02—Details
    • G01J3/0202—Mechanical elements; Supports for optical elements
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02—Details
    • G01J3/0205—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02—Details
    • G01J3/0205—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows
    • G01J3/021—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows using plane or convex mirrors, parallel phase plates, or particular reflectors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02—Details
    • G01J3/0205—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows
    • G01J3/0213—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows using attenuators
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/55—Specular reflectivity
    • G01N21/552—Attenuated total reflection
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
    • G01N2021/3595—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light using FTIR

Landscapes

  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
GB1420983.7A 2012-04-27 2013-04-25 Spectrometer with built-in ATR and accessory compartment Active GB2516406B (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US13/458,000 US8547555B1 (en) 2012-04-27 2012-04-27 Spectrometer with built-in ATR and accessory compartment
PCT/US2013/038204 WO2013163420A1 (en) 2012-04-27 2013-04-25 Spectrometer with built-in atr and accessory compartment

Publications (3)

Publication Number Publication Date
GB201420983D0 GB201420983D0 (en) 2015-01-07
GB2516406A GB2516406A (en) 2015-01-21
GB2516406B true GB2516406B (en) 2020-02-12

Family

ID=49229884

Family Applications (1)

Application Number Title Priority Date Filing Date
GB1420983.7A Active GB2516406B (en) 2012-04-27 2013-04-25 Spectrometer with built-in ATR and accessory compartment

Country Status (5)

Country Link
US (1) US8547555B1 (enExample)
JP (1) JP6259816B2 (enExample)
DE (1) DE112013002224B4 (enExample)
GB (1) GB2516406B (enExample)
WO (1) WO2013163420A1 (enExample)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2016094434A1 (en) * 2014-12-08 2016-06-16 University Of Virginia Patent Foundation Systems and methods for multispectral photoacoustic microscopy
DE102016008885B4 (de) * 2016-07-20 2020-09-17 Spectrolytic GmbH Schmuckstück mit ATR-Spektrometer und Kit mit dem Schmuckstück
JP6849405B2 (ja) * 2016-11-14 2021-03-24 浜松ホトニクス株式会社 分光計測装置及び分光計測システム
EP3598105A1 (en) * 2018-07-20 2020-01-22 Omya International AG Method for detecting phosphate and/or sulphate salts on the surface of a substrate or within a substrate, use of a lwir detecting device and a lwir imaging system
EP3910323A1 (en) * 2020-05-12 2021-11-17 CIC nanoGUNE - Asociación Centro de Investigación Cooperativa en Nanociencias Combined spectroscopy system including raman and atr-ftir
CN114184570A (zh) * 2021-12-21 2022-03-15 蓝莫德(天津)科学仪器股份有限公司 一种atr红外光谱人体结石分析仪
DE102022121038A1 (de) * 2022-08-19 2024-02-22 WiredSense GmbH FTIR-Spektrometer
US12416571B2 (en) 2022-12-23 2025-09-16 Thermo Electron Scientific Instruments Llc Spectrometer with absolute transmission accessory
WO2024175879A1 (en) * 2023-02-23 2024-08-29 Edinburgh Instruments Limited Fourier transform infrared spectroscopy instrument

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7075645B2 (en) * 2002-05-09 2006-07-11 Euro-Celtique S.A. Spectroscopic analyzer for blender
US7652765B1 (en) * 2004-03-06 2010-01-26 Plain Sight Systems, Inc. Hyper-spectral imaging methods and devices
US20110228279A1 (en) * 2009-12-02 2011-09-22 University Of Hawaii Fabry-perot fourier transform spectrometer

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5338935A (en) 1992-09-25 1994-08-16 Truett William L Positioning device for infrared accessories in FTIR spectrometers
US5859434A (en) 1993-02-18 1999-01-12 Cic Photonics, Inc. Infrared spectroscopic sampling accessory having a remotely mounted crystal plate
US6038022A (en) 1997-05-29 2000-03-14 Spectra-Tech, Inc. Coupling device for integrating and interfacing accessory modules with spectrometers for spectroscopic analysis
EP0982584B1 (en) 1998-08-28 2006-02-08 Perkin-Elmer Limited Spectrometer accessory for carrying out attenuated total reflectance measurements
DE29918295U1 (de) 1999-10-16 2000-08-03 Bruker Optik GmbH, 76275 Ettlingen ATR-Meßzelle für die FTIR-Spektroskopie
US6667808B2 (en) * 2000-03-08 2003-12-23 Thermo Electron Scientific Instruments Corporation Multifunctional fourier transform infrared spectrometer system
JP4773168B2 (ja) * 2005-09-13 2011-09-14 国立大学法人北海道大学 電気化学赤外分光装置
US7582869B2 (en) 2006-07-20 2009-09-01 Sas Photonics, Llc System and method for optical analysis
DE102006037524A1 (de) 2006-08-10 2008-02-21 Bruker Optik Gmbh Spektrometersystem mit IR-Mikroskop und elektronisch umschaltbaren Detektoren
US20090116021A1 (en) * 2007-10-05 2009-05-07 Jeffry Mark Bulson Method and apparatus for determining composition and concentration of contaminants on a film encapsulated in a plasma display panel
JP5181689B2 (ja) * 2008-01-18 2013-04-10 横河電機株式会社 近赤外光及び赤外光の分光分析装置
DE102010031189B4 (de) 2010-07-09 2014-04-03 Bruker Optik Gmbh ATR-Objektiv für ein IR-Mikroskop und Verfahren zu dessen Betrieb

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7075645B2 (en) * 2002-05-09 2006-07-11 Euro-Celtique S.A. Spectroscopic analyzer for blender
US7652765B1 (en) * 2004-03-06 2010-01-26 Plain Sight Systems, Inc. Hyper-spectral imaging methods and devices
US20110228279A1 (en) * 2009-12-02 2011-09-22 University Of Hawaii Fabry-perot fourier transform spectrometer

Also Published As

Publication number Publication date
DE112013002224T5 (de) 2015-01-22
DE112013002224B4 (de) 2020-08-06
WO2013163420A1 (en) 2013-10-31
US8547555B1 (en) 2013-10-01
GB201420983D0 (en) 2015-01-07
JP6259816B2 (ja) 2018-01-10
GB2516406A (en) 2015-01-21
JP2015515011A (ja) 2015-05-21

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