DE112013002224B4 - Spektrometer mit eingebauter ATR und Zubehörfach - Google Patents

Spektrometer mit eingebauter ATR und Zubehörfach Download PDF

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Publication number
DE112013002224B4
DE112013002224B4 DE112013002224.9T DE112013002224T DE112013002224B4 DE 112013002224 B4 DE112013002224 B4 DE 112013002224B4 DE 112013002224 T DE112013002224 T DE 112013002224T DE 112013002224 B4 DE112013002224 B4 DE 112013002224B4
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Prior art keywords
light
optical element
spectrometer
base plate
receive
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DE112013002224.9T
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German (de)
English (en)
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DE112013002224T5 (de
Inventor
Michael S. Bradley
Federico Izzia
John Magie Coffin
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Thermo Electron Scientific Instruments LLC
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Thermo Electron Scientific Instruments LLC
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/55—Specular reflectivity
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02—Details
    • G01J3/0291—Housings; Spectrometer accessories; Spatial arrangement of elements, e.g. folded path arrangements
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/55—Specular reflectivity
    • G01N21/552—Attenuated total reflection
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02—Details
    • G01J3/0202—Mechanical elements; Supports for optical elements
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02—Details
    • G01J3/0205—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02—Details
    • G01J3/0205—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows
    • G01J3/021—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows using plane or convex mirrors, parallel phase plates, or particular reflectors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02—Details
    • G01J3/0205—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows
    • G01J3/0213—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows using attenuators
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
    • G01N2021/3595—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light using FTIR

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  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
DE112013002224.9T 2012-04-27 2013-04-25 Spektrometer mit eingebauter ATR und Zubehörfach Active DE112013002224B4 (de)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US13/458,000 US8547555B1 (en) 2012-04-27 2012-04-27 Spectrometer with built-in ATR and accessory compartment
US13/458,000 2012-04-27
PCT/US2013/038204 WO2013163420A1 (en) 2012-04-27 2013-04-25 Spectrometer with built-in atr and accessory compartment

Publications (2)

Publication Number Publication Date
DE112013002224T5 DE112013002224T5 (de) 2015-01-22
DE112013002224B4 true DE112013002224B4 (de) 2020-08-06

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Family Applications (1)

Application Number Title Priority Date Filing Date
DE112013002224.9T Active DE112013002224B4 (de) 2012-04-27 2013-04-25 Spektrometer mit eingebauter ATR und Zubehörfach

Country Status (5)

Country Link
US (1) US8547555B1 (enExample)
JP (1) JP6259816B2 (enExample)
DE (1) DE112013002224B4 (enExample)
GB (1) GB2516406B (enExample)
WO (1) WO2013163420A1 (enExample)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102022121038A1 (de) * 2022-08-19 2024-02-22 WiredSense GmbH FTIR-Spektrometer

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2016094434A1 (en) * 2014-12-08 2016-06-16 University Of Virginia Patent Foundation Systems and methods for multispectral photoacoustic microscopy
DE102016008885B4 (de) * 2016-07-20 2020-09-17 Spectrolytic GmbH Schmuckstück mit ATR-Spektrometer und Kit mit dem Schmuckstück
JP6849405B2 (ja) * 2016-11-14 2021-03-24 浜松ホトニクス株式会社 分光計測装置及び分光計測システム
EP3598105A1 (en) * 2018-07-20 2020-01-22 Omya International AG Method for detecting phosphate and/or sulphate salts on the surface of a substrate or within a substrate, use of a lwir detecting device and a lwir imaging system
EP3910323A1 (en) * 2020-05-12 2021-11-17 CIC nanoGUNE - Asociación Centro de Investigación Cooperativa en Nanociencias Combined spectroscopy system including raman and atr-ftir
CN114184570A (zh) * 2021-12-21 2022-03-15 蓝莫德(天津)科学仪器股份有限公司 一种atr红外光谱人体结石分析仪
US12416571B2 (en) 2022-12-23 2025-09-16 Thermo Electron Scientific Instruments Llc Spectrometer with absolute transmission accessory
WO2024175879A1 (en) * 2023-02-23 2024-08-29 Edinburgh Instruments Limited Fourier transform infrared spectroscopy instrument

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE29918295U1 (de) 1999-10-16 2000-08-03 Bruker Optik GmbH, 76275 Ettlingen ATR-Meßzelle für die FTIR-Spektroskopie
DE102006037524A1 (de) 2006-08-10 2008-02-21 Bruker Optik Gmbh Spektrometersystem mit IR-Mikroskop und elektronisch umschaltbaren Detektoren
DE102010031189B4 (de) 2010-07-09 2014-04-03 Bruker Optik Gmbh ATR-Objektiv für ein IR-Mikroskop und Verfahren zu dessen Betrieb

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5338935A (en) 1992-09-25 1994-08-16 Truett William L Positioning device for infrared accessories in FTIR spectrometers
US5859434A (en) 1993-02-18 1999-01-12 Cic Photonics, Inc. Infrared spectroscopic sampling accessory having a remotely mounted crystal plate
WO1998054077A1 (en) 1997-05-29 1998-12-03 Spectra-Tech, Inc. Coupling device for integrating and interfacing accessory modules
EP0982584B1 (en) 1998-08-28 2006-02-08 Perkin-Elmer Limited Spectrometer accessory for carrying out attenuated total reflectance measurements
US6667808B2 (en) * 2000-03-08 2003-12-23 Thermo Electron Scientific Instruments Corporation Multifunctional fourier transform infrared spectrometer system
WO2003094679A2 (en) * 2002-05-09 2003-11-20 Euro-Celtique, S.A. Spectroscopic analyzer for blender
US7652765B1 (en) * 2004-03-06 2010-01-26 Plain Sight Systems, Inc. Hyper-spectral imaging methods and devices
JP4773168B2 (ja) * 2005-09-13 2011-09-14 国立大学法人北海道大学 電気化学赤外分光装置
US7582869B2 (en) 2006-07-20 2009-09-01 Sas Photonics, Llc System and method for optical analysis
US20090116021A1 (en) * 2007-10-05 2009-05-07 Jeffry Mark Bulson Method and apparatus for determining composition and concentration of contaminants on a film encapsulated in a plasma display panel
JP5181689B2 (ja) * 2008-01-18 2013-04-10 横河電機株式会社 近赤外光及び赤外光の分光分析装置
US9664563B2 (en) * 2009-12-02 2017-05-30 University Of Hawaii Fabry-perot fourier transform spectrometer

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE29918295U1 (de) 1999-10-16 2000-08-03 Bruker Optik GmbH, 76275 Ettlingen ATR-Meßzelle für die FTIR-Spektroskopie
DE102006037524A1 (de) 2006-08-10 2008-02-21 Bruker Optik Gmbh Spektrometersystem mit IR-Mikroskop und elektronisch umschaltbaren Detektoren
DE102010031189B4 (de) 2010-07-09 2014-04-03 Bruker Optik Gmbh ATR-Objektiv für ein IR-Mikroskop und Verfahren zu dessen Betrieb

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
Bruker Optics Inc., "TENSOR series FTIR-spectrometer", 2002, URL: www.tajhizshimi.com/Tensor%2027.pdf, [abgerufen am 24.02.2016] *

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102022121038A1 (de) * 2022-08-19 2024-02-22 WiredSense GmbH FTIR-Spektrometer

Also Published As

Publication number Publication date
DE112013002224T5 (de) 2015-01-22
JP2015515011A (ja) 2015-05-21
GB2516406B (en) 2020-02-12
JP6259816B2 (ja) 2018-01-10
US8547555B1 (en) 2013-10-01
GB2516406A (en) 2015-01-21
GB201420983D0 (en) 2015-01-07
WO2013163420A1 (en) 2013-10-31

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