GB2512212B - Integrated circuit with plurality of trimming resistances - Google Patents
Integrated circuit with plurality of trimming resistancesInfo
- Publication number
- GB2512212B GB2512212B GB1405479.5A GB201405479A GB2512212B GB 2512212 B GB2512212 B GB 2512212B GB 201405479 A GB201405479 A GB 201405479A GB 2512212 B GB2512212 B GB 2512212B
- Authority
- GB
- United Kingdom
- Prior art keywords
- integrated circuit
- trimming resistances
- trimming
- resistances
- integrated
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
- 238000009966 trimming Methods 0.000 title 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
- H01L22/20—Sequence of activities consisting of a plurality of measurements, corrections, marking or sorting steps
- H01L22/22—Connection or disconnection of sub-entities or redundant parts of a device in response to a measurement
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01C—RESISTORS
- H01C17/00—Apparatus or processes specially adapted for manufacturing resistors
- H01C17/22—Apparatus or processes specially adapted for manufacturing resistors adapted for trimming
- H01C17/23—Apparatus or processes specially adapted for manufacturing resistors adapted for trimming by opening or closing resistor geometric tracks of predetermined resistive values, e.g. snapistors
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
- H01L22/10—Measuring as part of the manufacturing process
- H01L22/14—Measuring as part of the manufacturing process for electrical parameters, e.g. resistance, deep-levels, CV, diffusions by electrical means
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03H—IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
- H03H7/00—Multiple-port networks comprising only passive electrical elements as network components
- H03H7/24—Frequency- independent attenuators
- H03H7/25—Frequency- independent attenuators comprising an element controlled by an electric or magnetic variable
Landscapes
- Engineering & Computer Science (AREA)
- Manufacturing & Machinery (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Computer Hardware Design (AREA)
- Power Engineering (AREA)
- Semiconductor Integrated Circuits (AREA)
- Design And Manufacture Of Integrated Circuits (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
GBGB1117167.5A GB201117167D0 (en) | 2011-10-05 | 2011-10-05 | Integrated circuit |
PCT/GB2012/052458 WO2013050766A1 (en) | 2011-10-05 | 2012-10-04 | Integrated circuit |
Publications (3)
Publication Number | Publication Date |
---|---|
GB201405479D0 GB201405479D0 (en) | 2014-05-07 |
GB2512212A GB2512212A (en) | 2014-09-24 |
GB2512212B true GB2512212B (en) | 2015-08-05 |
Family
ID=45035181
Family Applications (2)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
GBGB1117167.5A Ceased GB201117167D0 (en) | 2011-10-05 | 2011-10-05 | Integrated circuit |
GB1405479.5A Expired - Fee Related GB2512212B (en) | 2011-10-05 | 2012-10-04 | Integrated circuit with plurality of trimming resistances |
Family Applications Before (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
GBGB1117167.5A Ceased GB201117167D0 (en) | 2011-10-05 | 2011-10-05 | Integrated circuit |
Country Status (2)
Country | Link |
---|---|
GB (2) | GB201117167D0 (en) |
WO (1) | WO2013050766A1 (en) |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB2171270A (en) * | 1985-02-20 | 1986-08-20 | Sgs Microelettronica Spa | Low noise high thermal stability attenuator of the integratable type |
US6803813B1 (en) * | 2003-04-22 | 2004-10-12 | National Semiconductor Corporation | Time constant-based calibration circuit for active filters |
US20080248601A1 (en) * | 2007-02-13 | 2008-10-09 | Akiko Tsukamoto | Method of fusing trimming for semiconductor device |
-
2011
- 2011-10-05 GB GBGB1117167.5A patent/GB201117167D0/en not_active Ceased
-
2012
- 2012-10-04 WO PCT/GB2012/052458 patent/WO2013050766A1/en active Application Filing
- 2012-10-04 GB GB1405479.5A patent/GB2512212B/en not_active Expired - Fee Related
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB2171270A (en) * | 1985-02-20 | 1986-08-20 | Sgs Microelettronica Spa | Low noise high thermal stability attenuator of the integratable type |
US6803813B1 (en) * | 2003-04-22 | 2004-10-12 | National Semiconductor Corporation | Time constant-based calibration circuit for active filters |
US20080248601A1 (en) * | 2007-02-13 | 2008-10-09 | Akiko Tsukamoto | Method of fusing trimming for semiconductor device |
Also Published As
Publication number | Publication date |
---|---|
GB201405479D0 (en) | 2014-05-07 |
GB201117167D0 (en) | 2011-11-16 |
GB2512212A (en) | 2014-09-24 |
WO2013050766A1 (en) | 2013-04-11 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
732E | Amendments to the register in respect of changes of name or changes affecting rights (sect. 32/1977) |
Free format text: REGISTERED BETWEEN 20231026 AND 20231101 |
|
PCNP | Patent ceased through non-payment of renewal fee |
Effective date: 20231004 |