GB2512212A - Integrated Circuit - Google Patents

Integrated Circuit Download PDF

Info

Publication number
GB2512212A
GB2512212A GB1405479.5A GB201405479A GB2512212A GB 2512212 A GB2512212 A GB 2512212A GB 201405479 A GB201405479 A GB 201405479A GB 2512212 A GB2512212 A GB 2512212A
Authority
GB
United Kingdom
Prior art keywords
integrated circuit
resistor
resistances
rtriml
rtrim2
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
GB1405479.5A
Other versions
GB201405479D0 (en
GB2512212B (en
Inventor
Paul Darlington
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Soundchip SA
Original Assignee
Soundchip SA
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Soundchip SA filed Critical Soundchip SA
Publication of GB201405479D0 publication Critical patent/GB201405479D0/en
Publication of GB2512212A publication Critical patent/GB2512212A/en
Application granted granted Critical
Publication of GB2512212B publication Critical patent/GB2512212B/en
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03H—IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
    • H03H7/00—Multiple-port networks comprising only passive electrical elements as network components
    • H03H7/24—Frequency- independent attenuators
    • H03H7/25—Frequency- independent attenuators comprising an element controlled by an electric or magnetic variable
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
    • H01L22/20—Sequence of activities consisting of a plurality of measurements, corrections, marking or sorting steps
    • H01L22/22—Connection or disconnection of sub-entities or redundant parts of a device in response to a measurement
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01C—RESISTORS
    • H01C17/00—Apparatus or processes specially adapted for manufacturing resistors
    • H01C17/22—Apparatus or processes specially adapted for manufacturing resistors adapted for trimming
    • H01C17/23—Apparatus or processes specially adapted for manufacturing resistors adapted for trimming by opening or closing resistor geometric tracks of predetermined resistive values, e.g. snapistors
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
    • H01L22/10—Measuring as part of the manufacturing process
    • H01L22/14—Measuring as part of the manufacturing process for electrical parameters, e.g. resistance, deep-levels, CV, diffusions by electrical means

Landscapes

  • Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Computer Hardware Design (AREA)
  • Power Engineering (AREA)
  • Semiconductor Integrated Circuits (AREA)
  • Design And Manufacture Of Integrated Circuits (AREA)

Abstract

An integrated circuit comprising: a plurality of resistors (R); associated with each resistor a plurality n of trimming resistances (Rtriml, Rtrim2); and a switch operative to connect a number p, where 0 < p < n, of the associated trimming resistances (Rtriml, Rtrim2) in series with each resistor (R), whereby the sum of the resistances of the resistor and the trimming resistances form a total resistance value.
GB1405479.5A 2011-10-05 2012-10-04 Integrated circuit with plurality of trimming resistances Expired - Fee Related GB2512212B (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
GBGB1117167.5A GB201117167D0 (en) 2011-10-05 2011-10-05 Integrated circuit
PCT/GB2012/052458 WO2013050766A1 (en) 2011-10-05 2012-10-04 Integrated circuit

Publications (3)

Publication Number Publication Date
GB201405479D0 GB201405479D0 (en) 2014-05-07
GB2512212A true GB2512212A (en) 2014-09-24
GB2512212B GB2512212B (en) 2015-08-05

Family

ID=45035181

Family Applications (2)

Application Number Title Priority Date Filing Date
GBGB1117167.5A Ceased GB201117167D0 (en) 2011-10-05 2011-10-05 Integrated circuit
GB1405479.5A Expired - Fee Related GB2512212B (en) 2011-10-05 2012-10-04 Integrated circuit with plurality of trimming resistances

Family Applications Before (1)

Application Number Title Priority Date Filing Date
GBGB1117167.5A Ceased GB201117167D0 (en) 2011-10-05 2011-10-05 Integrated circuit

Country Status (2)

Country Link
GB (2) GB201117167D0 (en)
WO (1) WO2013050766A1 (en)

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2171270A (en) * 1985-02-20 1986-08-20 Sgs Microelettronica Spa Low noise high thermal stability attenuator of the integratable type
US6803813B1 (en) * 2003-04-22 2004-10-12 National Semiconductor Corporation Time constant-based calibration circuit for active filters
US20080248601A1 (en) * 2007-02-13 2008-10-09 Akiko Tsukamoto Method of fusing trimming for semiconductor device

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2171270A (en) * 1985-02-20 1986-08-20 Sgs Microelettronica Spa Low noise high thermal stability attenuator of the integratable type
US6803813B1 (en) * 2003-04-22 2004-10-12 National Semiconductor Corporation Time constant-based calibration circuit for active filters
US20080248601A1 (en) * 2007-02-13 2008-10-09 Akiko Tsukamoto Method of fusing trimming for semiconductor device

Also Published As

Publication number Publication date
GB201405479D0 (en) 2014-05-07
GB201117167D0 (en) 2011-11-16
WO2013050766A1 (en) 2013-04-11
GB2512212B (en) 2015-08-05

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Legal Events

Date Code Title Description
732E Amendments to the register in respect of changes of name or changes affecting rights (sect. 32/1977)

Free format text: REGISTERED BETWEEN 20231026 AND 20231101

PCNP Patent ceased through non-payment of renewal fee

Effective date: 20231004