GB2505167B - An automatic test system for electrical products - Google Patents

An automatic test system for electrical products

Info

Publication number
GB2505167B
GB2505167B GB1213912.7A GB201213912A GB2505167B GB 2505167 B GB2505167 B GB 2505167B GB 201213912 A GB201213912 A GB 201213912A GB 2505167 B GB2505167 B GB 2505167B
Authority
GB
United Kingdom
Prior art keywords
test system
automatic test
electrical products
products
electrical
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
GB1213912.7A
Other versions
GB2505167A (en
GB201213912D0 (en
Inventor
Fangxiang Cheng
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Individual
Original Assignee
Individual
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Individual filed Critical Individual
Priority to GB1213912.7A priority Critical patent/GB2505167B/en
Publication of GB201213912D0 publication Critical patent/GB201213912D0/en
Publication of GB2505167A publication Critical patent/GB2505167A/en
Application granted granted Critical
Publication of GB2505167B publication Critical patent/GB2505167B/en
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/01—Subjecting similar articles in turn to test, e.g. "go/no-go" tests in mass production; Testing objects at points as they pass through a testing station
    • G01R31/013—Testing passive components
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/20—Modifications of basic electric elements for use in electric measuring instruments; Structural combinations of such elements with such instruments
    • G01R1/206—Switches for connection of measuring instruments or electric motors to measuring loads
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/12—Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing
    • G01R31/18—Subjecting similar articles in turn to test, e.g. go/no-go tests in mass production
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
    • G01R31/58—Testing of lines, cables or conductors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/025—General constructional details concerning dedicated user interfaces, e.g. GUI, or dedicated keyboards

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Human Computer Interaction (AREA)
  • General Factory Administration (AREA)
GB1213912.7A 2012-08-03 2012-08-03 An automatic test system for electrical products Expired - Fee Related GB2505167B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
GB1213912.7A GB2505167B (en) 2012-08-03 2012-08-03 An automatic test system for electrical products

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
GB1213912.7A GB2505167B (en) 2012-08-03 2012-08-03 An automatic test system for electrical products

Publications (3)

Publication Number Publication Date
GB201213912D0 GB201213912D0 (en) 2012-09-19
GB2505167A GB2505167A (en) 2014-02-26
GB2505167B true GB2505167B (en) 2014-08-13

Family

ID=46934883

Family Applications (1)

Application Number Title Priority Date Filing Date
GB1213912.7A Expired - Fee Related GB2505167B (en) 2012-08-03 2012-08-03 An automatic test system for electrical products

Country Status (1)

Country Link
GB (1) GB2505167B (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN110850337B (en) * 2019-10-24 2022-09-27 广州市槿泓电子有限公司 Multi-wire-bundle testing system, method, device and storage medium

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20060061377A1 (en) * 2004-01-29 2006-03-23 Howard Roberts Pin electronics implemented system and method for reduced index time
US20090076761A1 (en) * 2007-07-03 2009-03-19 Credence Systems Corporation Routed event test system and method

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20060061377A1 (en) * 2004-01-29 2006-03-23 Howard Roberts Pin electronics implemented system and method for reduced index time
US20090076761A1 (en) * 2007-07-03 2009-03-19 Credence Systems Corporation Routed event test system and method

Also Published As

Publication number Publication date
GB2505167A (en) 2014-02-26
GB201213912D0 (en) 2012-09-19

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Legal Events

Date Code Title Description
PCNP Patent ceased through non-payment of renewal fee

Effective date: 20170803