SG11201402256QA - Nest for testing electrical components - Google Patents

Nest for testing electrical components

Info

Publication number
SG11201402256QA
SG11201402256QA SG11201402256QA SG11201402256QA SG11201402256QA SG 11201402256Q A SG11201402256Q A SG 11201402256QA SG 11201402256Q A SG11201402256Q A SG 11201402256QA SG 11201402256Q A SG11201402256Q A SG 11201402256QA SG 11201402256Q A SG11201402256Q A SG 11201402256QA
Authority
SG
Singapore
Prior art keywords
nest
electrical components
testing electrical
testing
components
Prior art date
Application number
SG11201402256QA
Inventor
Sylvain Vienot
Philippe Viverge
Massimo Scarpella
Philippe Roy
Original Assignee
Ismeca Semiconductor Holding
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ismeca Semiconductor Holding filed Critical Ismeca Semiconductor Holding
Publication of SG11201402256QA publication Critical patent/SG11201402256QA/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/04—Housings; Supporting members; Arrangements of terminals
    • G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices
    • G01R31/2607—Circuits therefor
    • G01R31/2632—Circuits therefor for testing diodes
    • G01R31/2635—Testing light-emitting diodes, laser diodes or photodiodes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2893—Handling, conveying or loading, e.g. belts, boats, vacuum fingers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2855—Environmental, reliability or burn-in testing
    • G01R31/286—External aspects, e.g. related to chambers, contacting devices or handlers
    • G01R31/2865—Holding devices, e.g. chucks; Handlers or transport devices

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Optics & Photonics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Automatic Analysis And Handling Materials Therefor (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)
  • Investigating Strength Of Materials By Application Of Mechanical Stress (AREA)
  • Seats For Vehicles (AREA)
SG11201402256QA 2012-02-10 2012-12-05 Nest for testing electrical components SG11201402256QA (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
CH1862012 2012-02-10
PCT/EP2012/074397 WO2013117265A1 (en) 2012-02-10 2012-12-05 Nest for testing electrical components

Publications (1)

Publication Number Publication Date
SG11201402256QA true SG11201402256QA (en) 2014-06-27

Family

ID=47294902

Family Applications (1)

Application Number Title Priority Date Filing Date
SG11201402256QA SG11201402256QA (en) 2012-02-10 2012-12-05 Nest for testing electrical components

Country Status (9)

Country Link
US (1) US9523710B2 (en)
EP (1) EP2812713B1 (en)
KR (1) KR101885686B1 (en)
CN (1) CN104160288A (en)
MY (1) MY167965A (en)
PH (1) PH12014501249B1 (en)
SG (1) SG11201402256QA (en)
TW (1) TWI589894B (en)
WO (1) WO2013117265A1 (en)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI589894B (en) 2012-02-10 2017-07-01 伊斯美加半導體控股公司 A nest
SG11201707232TA (en) * 2015-07-31 2017-10-30 Ismeca Semiconductor Holding Sa An assembly and method for handling components
KR102654553B1 (en) * 2023-12-13 2024-04-04 주식회사 프로이천 Nest plate

Family Cites Families (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2976075B2 (en) * 1990-05-14 1999-11-10 日本テキサス・インスツルメンツ株式会社 socket
US5482471A (en) 1993-02-24 1996-01-09 Texas Instruments Incorporated Socket apparatus for IC package testing
US5469074A (en) * 1994-02-08 1995-11-21 The Whitaker Corporation Chip socket testing apparatus with adjustable contact force
US5578870A (en) * 1995-08-03 1996-11-26 Precision Connector Designs, Inc. Top loading test socket for ball grid arrays
JP2001212246A (en) 2000-02-07 2001-08-07 Shimadzu Corp Biodegradable stent
US6797936B1 (en) 2002-01-03 2004-09-28 Opto Electronic Systems, Inc. Automated laser diode testing
US6741089B2 (en) * 2002-01-14 2004-05-25 Micro Control Company Hinged heat sink burn-in socket
CH695871A5 (en) * 2002-11-07 2006-09-29 Ismeca Semiconductor Holding Apparatus and method for testing electronic components.
US6881088B2 (en) * 2003-07-29 2005-04-19 Hon Hai Precision Ind. Co., Ltd. Connector assembly with actuation system
CN201107385Y (en) * 2007-11-07 2008-08-27 深圳市同洲电子股份有限公司 Semiconductor high and low temperature experiment instrument
US8305104B2 (en) 2009-03-26 2012-11-06 Electro Scientific Industries, Inc. Testing and sorting system having a linear track and method of using the same
CN201976264U (en) * 2010-12-23 2011-09-14 大连艾科科技开发有限公司 Heating table applicable to welding and assembly of DIL (dual in-line) shell and butterfly shell internals
TWI589894B (en) 2012-02-10 2017-07-01 伊斯美加半導體控股公司 A nest
CN103424186A (en) * 2012-05-18 2013-12-04 全亿大科技（佛山）有限公司 Light emitting diode detection measuring tool

Also Published As

Publication number Publication date
EP2812713B1 (en) 2015-11-25
KR20140134263A (en) 2014-11-21
TW201333491A (en) 2013-08-16
PH12014501249A1 (en) 2014-09-08
EP2812713A1 (en) 2014-12-17
CN104160288A (en) 2014-11-19
US9523710B2 (en) 2016-12-20
TWI589894B (en) 2017-07-01
PH12014501249B1 (en) 2014-09-08
MY167965A (en) 2018-10-09
WO2013117265A1 (en) 2013-08-15
KR101885686B1 (en) 2018-09-11
US20140375323A1 (en) 2014-12-25

Similar Documents

Publication Publication Date Title
HK1210113A1 (en) Locking device for locking electrical plugs
PL2930491T3 (en) Test device
EP2973915A4 (en) Gfci test monitor circuit
GB201219916D0 (en) An electrical generation arrangement for an aircraft
PL2930707T3 (en) Test device
GB201219925D0 (en) An electrical system for an aircraft
EP2879256A4 (en) Electrical connection box
EP2879253A4 (en) Electrical connection box
GB2518081B (en) Providing an ID-verified blood test
HK1180931A1 (en) An electro-pulsograph
ZA201400809B (en) Electrical test switch
GB2507980B (en) Inspection arrangement
SG11201502853PA (en) An electrical machine
EP2938417A4 (en) Dual-filter dual-integrity test assembly
GB2498536B (en) Electrical assembly
EP2851913A4 (en) Electrical apparatus
EP2879255A4 (en) Electrical connection box
GB201220890D0 (en) An electrical system
GB2504754B (en) Aircraft engine electrical apparatus
EP2915217A4 (en) Modified electrical devices
GB2508046B (en) Measurement jig
EP2882113A4 (en) Electrical device
GB201208964D0 (en) An electrical system
GB201216739D0 (en) An inspection interface unit
SG11201402256QA (en) Nest for testing electrical components