GB2425592B - Method and instrument for measuring complex dielectric constant of sample by optical spectrum measurement - Google Patents

Method and instrument for measuring complex dielectric constant of sample by optical spectrum measurement

Info

Publication number
GB2425592B
GB2425592B GB0612243A GB0612243A GB2425592B GB 2425592 B GB2425592 B GB 2425592B GB 0612243 A GB0612243 A GB 0612243A GB 0612243 A GB0612243 A GB 0612243A GB 2425592 B GB2425592 B GB 2425592B
Authority
GB
United Kingdom
Prior art keywords
instrument
sample
dielectric constant
optical spectrum
spectrum measurement
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
GB0612243A
Other versions
GB0612243D0 (en
GB2425592A (en
Inventor
Etsuo Kawate
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
National Institute of Advanced Industrial Science and Technology AIST
Original Assignee
National Institute of Advanced Industrial Science and Technology AIST
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from JP2003391201A external-priority patent/JP4006525B2/en
Priority claimed from JP2004311458A external-priority patent/JP4235826B2/en
Application filed by National Institute of Advanced Industrial Science and Technology AIST filed Critical National Institute of Advanced Industrial Science and Technology AIST
Publication of GB0612243D0 publication Critical patent/GB0612243D0/en
Publication of GB2425592A publication Critical patent/GB2425592A/en
Application granted granted Critical
Publication of GB2425592B publication Critical patent/GB2425592B/en
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
    • G01N21/3563—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light for analysing solids; Preparation of samples therefor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/8422—Investigating thin films, e.g. matrix isolation method
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N22/00—Investigating or analysing materials by the use of microwaves or radio waves, i.e. electromagnetic waves with a wavelength of one millimetre or more

Landscapes

  • Physics & Mathematics (AREA)
  • Biochemistry (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Electromagnetism (AREA)
  • Mathematical Physics (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
GB0612243A 2003-11-20 2004-11-22 Method and instrument for measuring complex dielectric constant of sample by optical spectrum measurement Expired - Fee Related GB2425592B (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2003391201A JP4006525B2 (en) 2003-11-20 2003-11-20 Sample flatness and complex permittivity measurement device and measurement method by light transmission measurement
JP2004311458A JP4235826B2 (en) 2004-10-26 2004-10-26 Method for measuring complex permittivity of samples by reflection measurement of light
PCT/JP2004/017361 WO2005050177A1 (en) 2003-11-20 2004-11-22 Method and instrument for measuring complex dielectric constant of sample by optical spectrum measurement

Publications (3)

Publication Number Publication Date
GB0612243D0 GB0612243D0 (en) 2006-08-02
GB2425592A GB2425592A (en) 2006-11-01
GB2425592B true GB2425592B (en) 2007-09-05

Family

ID=34622187

Family Applications (1)

Application Number Title Priority Date Filing Date
GB0612243A Expired - Fee Related GB2425592B (en) 2003-11-20 2004-11-22 Method and instrument for measuring complex dielectric constant of sample by optical spectrum measurement

Country Status (2)

Country Link
GB (1) GB2425592B (en)
WO (1) WO2005050177A1 (en)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4528952B2 (en) * 2007-05-17 2010-08-25 独立行政法人産業技術総合研究所 Method and apparatus for measuring flatness
EP3745144A1 (en) * 2019-05-29 2020-12-02 ALCAN Systems GmbH A method of inspecting a radio frequency device and a radio frequency device

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002098634A (en) * 2000-03-27 2002-04-05 Tochigi Nikon Corp Electrical characteristic evaluation apparatus and method for semiconductor
WO2002095372A1 (en) * 2001-05-22 2002-11-28 Horiba, Ltd. Thin-film characteristic measuring method using spectroellipsometer
JP2003014620A (en) * 2001-06-27 2003-01-15 Matsushita Electric Ind Co Ltd Polarization analysis apparatus and method
US20040008346A1 (en) * 2002-07-09 2004-01-15 National Inst. Of Advanced Ind. Science And Tech. Optical system for measurement of optical constant
US20040169863A1 (en) * 2003-02-27 2004-09-02 Etsuo Kawate Optical system for measurement

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002098634A (en) * 2000-03-27 2002-04-05 Tochigi Nikon Corp Electrical characteristic evaluation apparatus and method for semiconductor
WO2002095372A1 (en) * 2001-05-22 2002-11-28 Horiba, Ltd. Thin-film characteristic measuring method using spectroellipsometer
EP1406080A1 (en) * 2001-05-22 2004-04-07 Horiba, Ltd. Thin-film characteristic measuring method using spectroellipsometer
JP2003014620A (en) * 2001-06-27 2003-01-15 Matsushita Electric Ind Co Ltd Polarization analysis apparatus and method
US20040008346A1 (en) * 2002-07-09 2004-01-15 National Inst. Of Advanced Ind. Science And Tech. Optical system for measurement of optical constant
US20040169863A1 (en) * 2003-02-27 2004-09-02 Etsuo Kawate Optical system for measurement

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
M. Li et al, "Time-domain dielectric constant measurement of thin film in GHz, THz frequency range near the Brewster angle", Applied Physics Letters, Vol.74, No.15, 12 April 1999, pages 2113-2115 *

Also Published As

Publication number Publication date
GB0612243D0 (en) 2006-08-02
WO2005050177A1 (en) 2005-06-02
GB2425592A (en) 2006-11-01

Similar Documents

Publication Publication Date Title
WO2005104806A3 (en) Noninvasive analyzer sample probe interface method and apparatus
GB2408797B (en) Method and apparatus for determination of atherosclerotic plaque type by measurement of tissue optical properties
AU2002249819A1 (en) Measurement testing of blood specimens
DE60235684D1 (en) Sample volume measuring apparatus
AU2002346484A1 (en) Method and apparatus for improving the accuracy of alternative site analyte concentration measurements
EP1617468A4 (en) Probe apparatus with optical length-measuring unit and probe testing method
AU4012101A (en) Optical probes an methods for spectral analysis
FI20030867A0 (en) Optical measuring method and laboratory measuring apparatus
AU2002364259A1 (en) Method and apparatus for enhanced evanescent field exposure in an optical fiber resonator for spectroscopic measurement of trace species
IL163538A0 (en) Compact apparatus for noninvasive measurement of glucose through nearinfrared spectroscopy
GB2407167B (en) Method and apparatus for determining speed and properties of flowing fluids using nmr measurements
AU2003292018A8 (en) Measuring device for the optical analysis of a test strip
GB0501826D0 (en) Apparatus for measurement of analyte concentration
FI20051329A0 (en) Apparatus and method for optical measurement of samples
EP1659405A4 (en) Biosensor and method of analyte measuring
SG140923A1 (en) Method and apparatus for measuring a characteristic of a sample feature
GB2404013B (en) Apparatus for and method of measuring fluorescence lifetime
AU2002330057A1 (en) Devices and methods for verifying measurement of analytes by raman spectroscopy and surface plasmon resonance
IL166292A0 (en) Method and apparatus for high-precision measurement of frequency
ATE447165T1 (en) DEVICE FOR OPTICAL SPECTRA ANALYSIS USING OPTICAL AMPLIFICATION THROUGH BRILLOUIN SCATTERING AND CORRESPONDING MEASURING METHOD
DE50214350D1 (en) Device for precise centering of an NMR sample tube
GB2425592B (en) Method and instrument for measuring complex dielectric constant of sample by optical spectrum measurement
EP1549944A4 (en) Apparatus for measuring biodegradability of sample using non-dispersive infrared spectrometry and method of measuring the same
DE50306180D1 (en) Apparatus and method for determining the chromatic dispersion of optical components
DE50000347D1 (en) Spectral bandwidth calibration of an optical spectrum analyzer

Legal Events

Date Code Title Description
789A Request for publication of translation (sect. 89(a)/1977)
PCNP Patent ceased through non-payment of renewal fee

Effective date: 20141122