GB0612243D0 - Method and instrument for measuring complex dielectric constant of sample by optical spectrum measurement - Google Patents

Method and instrument for measuring complex dielectric constant of sample by optical spectrum measurement

Info

Publication number
GB0612243D0
GB0612243D0 GBGB0612243.6A GB0612243A GB0612243D0 GB 0612243 D0 GB0612243 D0 GB 0612243D0 GB 0612243 A GB0612243 A GB 0612243A GB 0612243 D0 GB0612243 D0 GB 0612243D0
Authority
GB
United Kingdom
Prior art keywords
instrument
sample
dielectric constant
optical spectrum
spectrum measurement
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
GBGB0612243.6A
Other versions
GB2425592B (en
GB2425592A (en
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
National Institute of Advanced Industrial Science and Technology AIST
Original Assignee
National Institute of Advanced Industrial Science and Technology AIST
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from JP2003391201A external-priority patent/JP4006525B2/en
Priority claimed from JP2004311458A external-priority patent/JP4235826B2/en
Application filed by National Institute of Advanced Industrial Science and Technology AIST filed Critical National Institute of Advanced Industrial Science and Technology AIST
Publication of GB0612243D0 publication Critical patent/GB0612243D0/en
Publication of GB2425592A publication Critical patent/GB2425592A/en
Application granted granted Critical
Publication of GB2425592B publication Critical patent/GB2425592B/en
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/35Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/35Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
    • G01N21/3563Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light for analysing solids; Preparation of samples therefor
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/8422Investigating thin films, e.g. matrix isolation method
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N22/00Investigating or analysing materials by the use of microwaves or radio waves, i.e. electromagnetic waves with a wavelength of one millimetre or more

Landscapes

  • Physics & Mathematics (AREA)
  • Biochemistry (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Electromagnetism (AREA)
  • Mathematical Physics (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
GB0612243A 2003-11-20 2004-11-22 Method and instrument for measuring complex dielectric constant of sample by optical spectrum measurement Expired - Fee Related GB2425592B (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2003391201A JP4006525B2 (en) 2003-11-20 2003-11-20 Sample flatness and complex permittivity measurement device and measurement method by light transmission measurement
JP2004311458A JP4235826B2 (en) 2004-10-26 2004-10-26 Method for measuring complex permittivity of samples by reflection measurement of light
PCT/JP2004/017361 WO2005050177A1 (en) 2003-11-20 2004-11-22 Method and instrument for measuring complex dielectric constant of sample by optical spectrum measurement

Publications (3)

Publication Number Publication Date
GB0612243D0 true GB0612243D0 (en) 2006-08-02
GB2425592A GB2425592A (en) 2006-11-01
GB2425592B GB2425592B (en) 2007-09-05

Family

ID=34622187

Family Applications (1)

Application Number Title Priority Date Filing Date
GB0612243A Expired - Fee Related GB2425592B (en) 2003-11-20 2004-11-22 Method and instrument for measuring complex dielectric constant of sample by optical spectrum measurement

Country Status (2)

Country Link
GB (1) GB2425592B (en)
WO (1) WO2005050177A1 (en)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4528952B2 (en) * 2007-05-17 2010-08-25 独立行政法人産業技術総合研究所 Method and apparatus for measuring flatness
EP3745144A1 (en) * 2019-05-29 2020-12-02 ALCAN Systems GmbH A method of inspecting a radio frequency device and a radio frequency device

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4476462B2 (en) * 2000-03-27 2010-06-09 株式会社栃木ニコン Semiconductor electrical property evaluation system
US7271901B2 (en) * 2001-05-22 2007-09-18 Horiba, Ltd. Thin-film characteristic measuring method using spectroellipsometer
JP3550381B2 (en) * 2001-06-27 2004-08-04 松下電器産業株式会社 Polarization analyzer and polarization analysis method
US6914680B2 (en) * 2002-07-09 2005-07-05 National Institute Of Advanced Industrial Science And Technology Optical system for measurement of optical constant
JP3760234B2 (en) * 2003-02-27 2006-03-29 独立行政法人産業技術総合研究所 Symmetric X-type optical system using a bi-ellipsoidal cylindrical mirror

Also Published As

Publication number Publication date
GB2425592B (en) 2007-09-05
WO2005050177A1 (en) 2005-06-02
GB2425592A (en) 2006-11-01

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Legal Events

Date Code Title Description
789A Request for publication of translation (sect. 89(a)/1977)
PCNP Patent ceased through non-payment of renewal fee

Effective date: 20141122